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Pin description
Port NO
Port Name
I/O
1
GND
–
GND (0V).
2
VDD
–
Power supply (+5V).
3
RESET
I
System reset. L = reset.
4
OSCON
I
Oscillation control. H = oscillation. L = standby.
5
DATA
I
Test port of IC.
6
MCK
I
Test port of IC.
7
MLTB
I
Test port of IC.
8
IDST
O
Output port of IC test.
9
IDCK
O
Output port of IC test.
10
IDO
O
Output port of IC test.
11
TMO
I
Test port of IC.
12
ECCK
O
Output port of IC test.
13
DEN
O
Output port of IC test.
14
DEY
O
Output port of IC test.
15
MSYC
O
Output port of IC test.
16
TM1
I
Test port of IC.
17
A0
O
Address 0 output of extra RAM (LSB).
18~22
A1~5
O
Address 1~5 outputs of extra RAM.
23, 24
TM2, 3
I
Test port of IC.
25
XOUT
O
Output port of IC test.
26, 27
XIN / XEXT
I
Test port of IC.
28
GND
–
GND (0V).
29
VDD
–
Power supply (+5V).
30, 31
A6, 7
O
Address 1~5 outputs of extra RAM.
32
GND
–
GND (0V).
33
VDD
–
Power supply (+5V).
34
A12
O
Address 12 outputs of extra RAM.
35
A14
O
Address 14 outputs of extra RAM (MSB).
36
WEB
O
Write enable signal of extra RAM. L = active.
37~39
A13 / 8, 9
O
Address 13, 8, 9 outputs of extra RAM.
40
GND
–
GND (0V).
41
A11
O
Address 11 outputs of extra RAM.
42
OEB
O
Output enable signal of extra RAM. L = active.
43
A10
O
Address 10 outputs of extra RAM.
44~51
DB7~0
I/O
Data port of extra RAM. Data bus7~0.
52
VDD
–
Power supply (+5V).
53
GND
–
GND (0V).
54
TI1
I
Test port of IC.
55
VIN
I
VCXO input.
56
VOUT
O
VCXO output.
57, 58
TI2, 3
I
Test port of IC.
Descriptions
Port NO
Port Name
I/O
59
TLDB
I
Test port of IC.
60
TCK
I
Test port of IC.
61
TRP
O
Output port of IC test.
62
TDO
O
Output port of IC test.
63
PDO
O
Phase comparator (3 states)
64
TI4
I
Test port of IC.
65
PDDIS
I
Output control of PDO. L = output.
66
MUTO
O
Muting output. H = mute. Also H = MUTI is "H" or out of synchronous of AC-3.
67
TI5
I
Test port of IC.
68
VLDY
O
Output port of IC test.
69
DASYO
O
Output port of IC test.
70
DAOUT
O
Digital out (serial data stream output)
71
DAIN
I
Extra input of digital.DASEL = "H" : signal though DAOUT.
72
DASEL
I
Choice of digital output
73
TI8
I
Test port of IC.
74
C2F1
O
Display of C2 error correction. Output of condition on error correction.
75
C2F0
O
Display of C2 error correction. Output of error count on C2.
76
C1F1
O
Display of C1 error correction. Output of error or non-error on C1.
77
C1F0
O
Display of C1 error correction. Output of error count on C1.
78
MUT1
I
Muting input. H = mute.
79
VDD
–
Power supply (+5V).
80
GND
–
GND (0V).
81
AVDD
–
Analog Comparator power supply (+5V)
82
CPIN
I
Analog comparator input. Negative port (invert).
83
CMIN
I
Analog comparator input. Positive port (non-invert:QOSK input).
84
AGND
–
Analog comparator GND.
85
TM4
I
Test port of IC.
86
VDD
–
Power supply (+5V).
87
DIN
I
Test port of IC.
88
DOUT
O
Analog comparator output.
89
DOUTB
O
Inverted analog comparator output.
90
C9M
O
9.216MHz output. 1/2 divided output of VIN (55P).
91
GND
–
GND (0V).
92
WINGT
O
Output port of IC test.
93, 94
SYST0, 1
O
Output port of IC test.
95, 96
ADST0, 1
O
Output port of IC test.
97
TM5
I
Test port of IC.
98
BUNRI
I
Test port of IC.
99
AGND
–
GND of 46.08MHz.
100
AVDD
–
Power supply of 46.08MHz (+5V).
Descriptions
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