Checking For Component Damage; Y Ipm(Ic201, Ic202) Or Z Ipm(Ic7, Ic5) Damage; Fet Ass'y(Y B/D : Hs1, Hs2, Hs3) Damage - HP PL4260N Service Manual

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3. Checking for Component Damage

3-1. Y IPM(IC201, IC202) or Z IPM(IC7, IC5)
Damage
(1) When the internal Sustain FET or Z SUS IPM(IC7) of Y
SUS IPM(IC 202) is damaged, screen doesn't be shown or
Mis - discharge of partial screen is generated.
Test Point : GND~B1(Y B/D), GND~B10(Z B/D).
Wave format : B1(Y B/D) or B10(Z B/D) has no output
wave.
(2) When the internal ER_FET or Z ER IPM(IC5) of Y ER
IPM(IC 201) is damaged, screen doesn't be shown or
lectric discharge of entire screen is generated.
Test Point : GND~B1(Y B/D), GND~B10(Z B/D).
Wave format : B1(Y B/D) or B10(Z B/D) has no output
wave.
<IPM Normal Output Wave>
Measurance position : Sustain section enlarge the after
O
measuring B1 wave of Y B/D and B10 wave of Z B/D.
(Full White Pattern)

3-2. FET Ass'y(Y B/D : HS1, HS2, HS3) Damage

(1) When Pass Set_Up FET(Q10) is damaged, screen doesn't
be shown.
Test Point : Enlarge the after measuring GND~B1(Y B/D)
O
Wave format : As shown fig. 2
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<Fig. 2 When the Pass Set_Up FET is damaged>
(2) When Set_Down FET/Pass_Top FET(HS1, HS3) is
damaged, Mis - discharge of entire screen is generated.
Test Point : Enlarge the after measuring
O
GND~B1(Y B/D)
Wave format : As shown fig. 3
O
<Fig. 3 When the Set_Down FET is damaged>
(3) When Ramp FET(HS2) is damaged.
Test Point : Enlarge the after measuring
O
GND~B1(Y B/D)
Wave format : As shown fig. 4
O
<Fig. 4 When the Ramp FET is damaged>
<FET Ass'y normal output wave>
Measurance position : Reset section enlargement wave
O
of B1(Y B/D) (Full White Pattern)

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