Nokia NPE-4 Service Manual page 24

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3.1.12. ST_UPP_REGISTER_VER_TEST:
This function compares the ASIC version to the compilation flag. Major ASIC version in UPP version register is compared against
ASIC version compilation flag. If the version is correct the result is ST_OK. If the version is wrong the result is ST_FAIL.
3.1.13. ST_RF_CHIP_ID_TEST:
This is the product specific selftest. Each product makes its own implementation. This test checks wether the ID register on the RF
Chip can be read and that it contains reasonable values. Usually this is done by asking RF Chip ID from DSP. In a word, this tests
the RFBUS lines (data, clock, enable) between the UPP and RF part.
3.1.14. ST_WARRANTY_TEST:
This function tests the Warranty Information State. If WIS is not WT_INFO_STATE_DEF the result is ST_OK. If WIS is
WT_INFO_STATE_DEF the result is ST_FAIL.
3.1.15. ST_FLASH_CHECKSUM_TEST:
This function calculates the checksum over flash ROM areas and checksum is compared to precalculated checksum in flash
header. If checksums are the same the result is ST_OK. If checksums are not same the result is ST_FAIL.
3.1.16. ST_LCD_TEST:
This function tests the connection of LCD by checking voltage level of VLCD. If voltage level is ok the result is ST_OK. If voltage
level is not ok the result is ST_FAIL.
3.1.17. ST_IR_IF_TEST:
This function performs a self test on the IR device. The test checks that IR energy is looped back when the module is operating
normally.
3.1.18. ST_UEM_CBUS_IF_TEST:
This function tests that the connection to UEM via CBUS is working. First the value is written to UEM register and then it is read
back. The written and read values are compared with each other. If the values are the same, the result is ST_OK. If the values are
not same, the result is ST_FAIL. So basically this tests the CBUS lines (data, clock, enable) between UEM and UPP.
3.1.19. ST_PA_TEMP_TEST:
This function tests that PA temp line AD conversion is within reasonable limits. This means that the value is not at the bottom or
top end of the scale. First, several raw values of the temperature (PATEMP) are read. Then the average is calculated and compared
to the limits. If temperature is within the limits the result is ST_OK. If temperature is outside the limits the result is ST_FAIL. In a
word, this tests the PATEMP line between the UEM and RF.
3.1.20. ST_RADIO_TEST:
This function provides a method to turn on the radio and verify that the radio chip is present. If detection fails power will be
automaticelly turned off from the chip. If radio supply voltage VFLASH2 is missing or FMCtrlClk and FMCtrlDa lines are not
working the result is ST_FAIL. If the radio chip is present and working ok the result is ST_OK.
© NMP 2002
CONFIDENTIAL
NPE-4 6310/NPL-1 6310i
Date 15.08.2002
Checked by:
SCCE Training Group
24 (25)
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Version 1.0 Approved
Approved by:
SCCE