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ABB Relion 670 Series Commissioning Manual

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Relion
670 SERIES
Busbar protection REB670
Version 2.2 ANSI
Commissioning manual

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  • Page 1 ® Relion 670 SERIES Busbar protection REB670 Version 2.2 ANSI Commissioning manual...
  • Page 3 Document ID: 1MRK 505 372-UUS Issued: July 2022 Revision: K Product version: 2.2 © 2017 - 2022 Hitachi Energy. All rights reserved...
  • Page 4 (eay@cryptsoft.com) and Tim Hudson (tjh@cryptsoft.com). Trademarks ABB is a registered trademark of ABB Asea Brown Boveri Ltd. Manufactured by/for a Hitachi Energy company. All other brand or product names mentioned in this document may be trademarks or registered trademarks of their respective holders.
  • Page 5 Disclaimer The data, examples and diagrams in this manual are included solely for the concept or product description and are not to be deemed as a statement of guaranteed properties. All persons responsible for applying the equipment addressed in this manual must satisfy themselves that each intended application is suitable and acceptable, including that any applicable safety or other operational requirements are complied with.
  • Page 6 Conformity This product complies with the directive of the Council of the European Communities on the approximation of the laws of the Member States relating to electromagnetic compatibility (EMC Directive 2004/108/EC) and concerning electrical equipment for use within specified voltage limits (Low-voltage directive 2006/95/EC).

  • Page 7: Table Of Contents

    1MRK 505 372-UUS Rev. K Table of contents Table of contents Section 1 Introduction......................9 This manual..........................9 Intended audience........................9 Product documentation......................10 1.3.1 Product documentation set......................10 1.3.2 Document revision history....................... 11 1.3.3 Related documents......................... 12 Document symbols and conventions..................12 1.4.1 Symbols...........................12 1.4.2 Document conventions......................13 IEC 61850 edition 1 / edition 2 mapping...................
  • Page 8 Table of contents 1MRK 505 372-UUS Rev. K 4.10 Checking the binary input/output circuits...................44 4.10.1 Binary input circuits......................... 44 4.10.2 Binary output circuits....................... 44 4.11 Checking optical connections....................44 Section 5 Configuring the IED and changing settings........... 45 Overview........................... 45 Configuring analog CT inputs....................45 Supervision of input/output modules..................
  • Page 9 1MRK 505 372-UUS Rev. K Table of contents 9.8.2 How to enable forcing......................63 9.8.2.1 Enable forcing by using LHMI.................... 63 9.8.2.2 Enable forcing using TESTMODE function block...............63 9.8.3 How to change binary input/output signals using forcing............64 9.8.3.1 Forcing by using LHMI....................... 64 9.8.3.2 Forcing by using PCM600....................
  • Page 10 Table of contents 1MRK 505 372-UUS Rev. K 10.4.4.1 Function revision history.....................80 10.4.4.2 Completing the test......................81 10.4.5 Thermal overload protection, two time constants TRPTTR (49)..........82 10.4.5.1 Checking trip and reset values................... 82 10.4.5.2 Completing the test......................82 10.4.6 Breaker failure protection, phase segregated activation and output CCRBRF (50BF) ..
  • Page 11 1MRK 505 372-UUS Rev. K Table of contents 10.4.11.2 Completing the test......................99 10.5 Voltage protection........................99 10.5.1 Two step undervoltage protection UV2PTUV (27)..............99 10.5.1.1 Verifying the settings......................99 10.5.1.2 Completing the test......................100 10.5.2 Two step overvoltage protection OV2PTOV (59)..............101 10.5.2.1 Verifying the settings......................
  • Page 12 Table of contents 1MRK 505 372-UUS Rev. K 10.8.1 Fuse failure supervision FUFSPVC..................114 10.8.1.1 Checking that the binary inputs and outputs trip as expected ......... 114 10.8.1.2 Measuring the trip value for the negative sequence function .......... 114 10.8.1.3 Measuring the trip value for the zero-sequence function ..........115 10.8.1.4 Measuring the trip value for the dead line detection function...........
  • Page 13 1MRK 505 372-UUS Rev. K Table of contents 10.10.2 Liquid medium supervision SSIML..................136 10.10.2.1 Function revision history....................136 10.10.2.2 Testing the liquid medium supervision for level alarm and level lockout conditions..136 10.10.2.3 Testing the gas medium supervision for temperature alarm and temperature lockout conditions.........................
  • Page 14 Table of contents 1MRK 505 372-UUS Rev. K 12.1 Commissioning tests....................... 153 12.2 Periodic maintenance tests..................... 153 12.2.1 Visual inspection........................154 12.2.2 Maintenance tests......................... 154 12.2.2.1 Preparation........................154 12.2.2.2 Recording......................... 154 12.2.2.3 Secondary injection......................155 12.2.2.4 Alarm test......................... 155 12.2.2.5 Self supervision check......................155 12.2.2.6 Trip circuit check......................

  • Page 15: Introduction

    1MRK 505 372-UUS Rev. K Section 1 Introduction Section 1 Introduction This manual GUID-AB423A30-13C2-46AF-B7FE-A73BB425EB5F v20 The commissioning manual contains instructions on how to commission the IED. The manual can also be used by system engineers and maintenance personnel for assistance during the testing phase. The manual provides procedures for the checking of external circuitry and energizing the IED, parameter setting and configuration as well as verifying settings by secondary injection.

  • Page 16: Product Documentation

    Section 1 1MRK 505 372-UUS Rev. K Introduction Product documentation 1.3.1 Product documentation set GUID-3AA69EA6-F1D8-47C6-A8E6-562F29C67172 v16 Engineering manual Installation manual Commissioning manual Operation manual Application manual Technical manual Communication protocol manual Cyber security deployment guideline IEC07000220-4-en.vsd IEC07000220 V4 EN-US Figure 1: The intended use of manuals throughout the product lifecycle The engineering manual contains instructions on how to engineer the IEDs using the various tools available within the PCM600 software.

  • Page 17: Document Revision History

    1MRK 505 372-UUS Rev. K Section 1 Introduction describes how to identify disturbances and how to view calculated and measured power grid data to determine the cause of a fault. The application manual contains application descriptions and setting guidelines sorted per function. The manual can be used to find out when and for what purpose a typical protection function can be used.

  • Page 18: Related Documents

    Section 1 1MRK 505 372-UUS Rev. K Introduction 1.3.3 Related documents GUID-94E8A5CA-BE1B-45AF-81E7-5A41D34EE112 v9 Documents related to REB670 Document numbers Application manual : 1MRK 505 370-UUS Commissioning manual : 1MRK 505 372-UUS Product guide 1MRK 505 373-BEN Technical manual ANSI: 1MRK 505 371-UUS Type test certificate ANSI: 1MRK 505 373-TUS 670 series manuals...

  • Page 19: Document Conventions

    1MRK 505 372-UUS Rev. K Section 1 Introduction The caution icon indicates important information or warning related to the concept discussed in the text. It might indicate the presence of a hazard which could result in corruption of software or damage to equipment or property. The information icon alerts the reader of important facts and conditions.
  • Page 20 Section 1 1MRK 505 372-UUS Rev. K Introduction Table 1: IEC 61850 edition 1 / edition 2 mapping Function block name Edition 1 logical nodes Edition 2 logical nodes ALGOS ALSVS AGSAL AGSAL AGSAL SECLLN0 ALMCALH ALMCALH ALMCALH ALTIM ALTIM ALTMS ALTMS ALTRK...
  • Page 21 1MRK 505 372-UUS Rev. K Section 1 Introduction Function block name Edition 1 logical nodes Edition 2 logical nodes BFPTRC_F24 BFPTRC BFPTRC BICPTRC_01 BICPTRC BICPTRC BICPTRC_02 BICPTRC BICPTRC BICPTRC_03 BICPTRC BICPTRC BICPTRC_04 BICPTRC BICPTRC BICPTRC_05 BICPTRC BICPTRC BTIGAPC B16IFCVI BTIGAPC BUSPTRC_B1 BUSPTRC BUSPTRC...
  • Page 22 Section 1 1MRK 505 372-UUS Rev. K Introduction Function block name Edition 1 logical nodes Edition 2 logical nodes BUTPTRC_B7 BUTPTRC BUTPTRC BUTPTRC_B8 BUTPTRC BUTPTRC BZNPDIF_Z1 BZNPDIF BZNPDIF BZNPDIF_Z2 BZNPDIF BZNPDIF BZNPDIF_Z3 BZNPDIF BZNPDIF BZNPDIF_Z4 BZNPDIF BZNPDIF BZNPDIF_Z5 BZNPDIF BZNPDIF BZNPDIF_Z6 BZNPDIF BZNPDIF...
  • Page 23 1MRK 505 372-UUS Rev. K Section 1 Introduction Function block name Edition 1 logical nodes Edition 2 logical nodes EF4PTOC EF4LLN0 EF4PTRC EF4PTRC EF4RDIR EF4RDIR GEN4PHAR GEN4PHAR PH1PTOC PH1PTOC ETPMMTR ETPMMTR ETPMMTR FLTMMXU FUFSPVC SDDRFUF FUFSPVC SDDSPVC GOPPDOP GOPPDOP GOPPDOP PH1PTRC GUPPDUP GUPPDUP...
  • Page 24 Section 1 1MRK 505 372-UUS Rev. K Introduction Function block name Edition 1 logical nodes Edition 2 logical nodes SCHLCCH SCHLCCH SCHLCCH SCILO SCILO SCILO SCSWI SCSWI SCSWI SESRSYN RSY1LLN0 AUT1RSYN AUT1RSYN MAN1RSYN MAN1RSYN SYNRSYN SYNRSYN SLGAPC SLGGIO SLGAPC SMBRREC SMBRREC SMBRREC SMPPTRC...

  • Page 25: Safety Information

    1MRK 505 372-UUS Rev. K Section 2 Safety information Section 2 Safety information Symbols on the product GUID-E48F2EC3-6AB8-4ECF-A77E-F16CE45CA5FD v4 All warnings must be observed. Read the entire manual before doing installation or any maintenance work on the product. Class 1 Laser product. Take adequate measures to protect your eyes and do not view directly with optical instruments.

  • Page 26: Caution Signs

    Section 2 1MRK 505 372-UUS Rev. K Safety information M2370-2 v1 Never connect or disconnect a wire and/or a connector to or from a IED during normal operation. Hazardous voltages and currents are present that may be lethal. Operation may be disrupted and IED and measuring circuitry may be damaged. GUID-BEDD698E-356C-4CF9-9DAE-64DB3CEADEAD v1 Dangerous voltages can occur on the connectors, even though the auxiliary voltage has been disconnected.

  • Page 27: Note Signs

    1MRK 505 372-UUS Rev. K Section 2 Safety information M2695-2 v2 Always transport PCBs (modules) using certified conductive bags. M2696-2 v1 Do not connect live wires to the IED. Internal circuitry may be damaged M2697-2 v2 Always use a conductive wrist strap connected to protective ground when replacing modules.

  • Page 29: Available Functions

    1MRK 505 372-UUS Rev. K Section 3 Available functions Section 3 Available functions GUID-F5776DD1-BD04-4872-BB89-A0412B4B5CC3 v1 The following tables list all the functions available in the IED. Those functions that are not exposed to the user or do not need to be configured are not described in this manual.

  • Page 30: Back-Up Protection Functions

    Section 3 1MRK 505 372-UUS Rev. K Available functions Back-up protection functions GUID-06D023C0-3F72-4D89-A0A5-F4B452234B7B v1 IEC 61850 or ANSI Function description Busbar function name REB670 (Customized) Current protection OC4PTOC Directional phase overcurrent protection, four steps 51_67 PH4SPTOC Single phase overcurrent protection, four steps 0-24 EF4PTOC Directional residual overcurrent protection, four steps...
  • Page 31 1MRK 505 372-UUS Rev. K Section 3 Available functions IEC 61850 or ANSI Function description Busbar function name REB670 (Customized) APC30 Control functionality for up to 6 bays, max 30 objects (6CBs), including interlocking (see Table QCBAY Bay control 1+5/APC30 LOCREM Handling of LR-switch positions 1+5/APC30...
  • Page 32 Section 3 1MRK 505 372-UUS Rev. K Available functions IEC 61850 or ANSI Function description Busbar function name REB670 (Customized) ANDQT, Configurable logic blocks Q/T (see Table INDCOMBSPQT, INDEXTSPQT, INVALIDQT, INVERTERQT, ORQT, PULSETIMERQT, RSMEMORYQT, SRMEMORYQT, TIMERSETQT, XORQT AND, GATE, INV, Extension logic package (see Table LLD, OR,...
  • Page 33 1MRK 505 372-UUS Rev. K Section 3 Available functions IEC 61850 or ANSI Function description Busbar function name REB670 (Customized) CMMXU Current measurement VMMXU Voltage measurement phase-phase CMSQI Current sequence measurement VMSQI Voltage sequence measurement VNMMXU Voltage measurement phase-ground AISVBAS General service value presentation of analog inputs EVENT Event function...
  • Page 34 Section 3 1MRK 505 372-UUS Rev. K Available functions Table 3: Total number of instances for basic configurable logic blocks Basic configurable logic block Total number of instances GATE PULSETIMER RSMEMORY SRMEMORY TIMERSET Table 4: Number of function instances in APC30 Function name Function description Total number of instances...

  • Page 35: Communication

    1MRK 505 372-UUS Rev. K Section 3 Available functions Table 5: Total number of instances for configurable logic blocks Q/T Configurable logic blocks Q/T Total number of instances ANDQT INDCOMBSPQT INDEXTSPQT INVALIDQT INVERTERQT ORQT PULSETIMERQT RSMEMORYQT SRMEMORYQT TIMERSETQT XORQT Table 6: Total number of instances for extended logic package Extended configurable logic block Total number of instances...
  • Page 36 Section 3 1MRK 505 372-UUS Rev. K Available functions IEC 61850 or function ANSI Function description Busbar name REB670 (Customized) RS485PROT Operation selection for RS485 RS485GEN RS485 DNPGEN DNP3.0 communication general protocol CHSERRS485 DNP3.0 for EIA-485 communication protocol CH1TCP, CH2TCP, DNP3.0 for TCP/IP communication protocol CH3TCP, CH4TCP CHSEROPT...
  • Page 37 1MRK 505 372-UUS Rev. K Section 3 Available functions IEC 61850 or function ANSI Function description Busbar name REB670 (Customized) AP_1-AP_6 AccessPoint_ABS AP_FRONT Access point front Precision time protocol ROUTE_1-ROUTE_6 Route_ABS1-Route_ABS6 FRONTSTATUS Access point diagnostic for front Ethernet port SCHLCCH Access point diagnostic for non-redundant Ethernet port RCHLCCH Access point diagnostic for redundant Ethernet ports...

  • Page 38: Basic Ied Functions

    Section 3 1MRK 505 372-UUS Rev. K Available functions Basic IED functions GUID-C8F0E5D2-E305-4184-9627-F6B5864216CA v14 Table 7: Basic IED functions IEC 61850 or function Description name INTERRSIG Self supervision with internal event list SELFSUPEVLST TIMESYNCHGEN Time synchronization module BININPUT, Time synchronization SYNCHCAN, SYNCHGPS, SYNCHCMPPS,...
  • Page 39 1MRK 505 372-UUS Rev. K Section 3 Available functions IEC 61850 or function Description name PRIMVAL Primary system values SAFEFILECOPY Safe file copy function ALTMS Time master supervision ALTIM Time management CAMCONFIG Central account management configuration CAMSTATUS Central account management status TOOLINF Tools information COMSTATUS...

  • Page 41: Starting Up

    1MRK 505 372-UUS Rev. K Section 4 Starting up Section 4 Starting up Factory and site acceptance testing GUID-38C2B5FA-9210-4D85-BA21-39CE98A1A84A v2 Testing the proper IED operation is carried out at different occasions, for example: • Acceptance testing • Commissioning testing • Maintenance testing This manual describes the workflow and the steps to carry out the commissioning testing.

  • Page 42: Checking The Power Supply

    Section 4 1MRK 505 372-UUS Rev. K Starting up Checking the power supply M11725-2 v6 Do not insert anything else to the female connector but the corresponding male connector. Inserting anything else (such as a measurement probe) may damage the female connector and prevent a proper electrical contact between the printed circuit board and the external wiring connected to the screw terminal block.

  • Page 43: Ied Start-Up Sequence

    1MRK 505 372-UUS Rev. K Section 4 Starting up 4.4.2 IED start-up sequence M11727-3 v13 When the IED is energized, the green LED starts flashing instantly. After approximately 55 seconds the window lights up and the window displays ‘IED Startup’. The main menu is displayed and the upper row should indicate ‘Available’...
  • Page 44 Section 4 1MRK 505 372-UUS Rev. K Starting up • Direct point-to-point link between PCM600 and the IED front port. The front port can be seen as a service port. • A link via a station LAN or from remote via a network. The physical connection and the IP address must be configured in both cases to enable communication.
  • Page 45 1MRK 505 372-UUS Rev. K Section 4 Starting up IEC13000057-1-en.vsd IEC13000057 V1 EN-US Figure 3: Select: Search programs and files Type View network connections and click on the View network connections icon. Busbar protection REB670 Commissioning manual © 2017 - 2022 Hitachi Energy. All rights reserved...
  • Page 46 Section 4 1MRK 505 372-UUS Rev. K Starting up IEC13000058-1-en.vsd IEC13000058 V1 EN-US Figure 4: Click View network connections Right-click and select Properties. IEC13000059-1-en.vsd IEC13000059 V1 EN-US Figure 5: Right-click Local Area Connection and select Properties Select the TCP/IPv4 protocol from the list of configured components using this connection and click Properties.
  • Page 47 1MRK 505 372-UUS Rev. K Section 4 Starting up IEC13000060-1-en.vsd IEC13000060 V1 EN-US Figure 6: Select the TCP/IPv4 protocol and open Properties Select Use the following IP address and define IP address and Subnet mask if the front port is used and if the IP address is not set to be obtained automatically by the IED,see Figure 7.

  • Page 48: Writing An Application Configuration To The Ied

    Section 4 1MRK 505 372-UUS Rev. K Starting up The PC and IED must belong to the same subnetwork for this set-up to work. Setting up the PC to access the IED via a network The same method is used as for connecting to the front port. The PC and IED must belong to the same subnetwork for this set-up to work.

  • Page 49: Checking Vt Circuits

    1MRK 505 372-UUS Rev. K Section 4 Starting up Both the primary and the secondary sides must be disconnected from the line and the IED when plotting the excitation characteristics. If the CT secondary circuit ground connection is removed without the current transformer primary being de-energized, dangerous voltages may result in the secondary CT circuits.

  • Page 50: Checking The Binary Input/Output Circuits

    Section 4 1MRK 505 372-UUS Rev. K Starting up Verify that the contacts are of current circuit type. Verify that the short circuit jumpers are located in the correct slots. Voltage circuit Verify that the contacts are of voltage circuit type. Check that no short circuit jumpers are located in the slots dedicated for voltage.

  • Page 51: Configuring The Ied And Changing Settings

    1MRK 505 372-UUS Rev. K Section 5 Configuring the IED and changing settings Section 5 Configuring the IED and changing settings Overview M11730-2 v7 The customer specific values for each setting parameter and a configuration file have to be available before the IED can be set and configured, if the IED is not delivered with a configuration.

  • Page 52: Supervision Of Input/Output Modules

    Section 5 1MRK 505 372-UUS Rev. K Configuring the IED and changing settings Table 9: CT configuration Parameter description Parameter name Range Default Rated CT primary current in A CTPRIMn from 0 to 99999 3000 n = channel number This parameter defines the primary rated current of the CT. For two set of CTs with ratio 1000/1 and 1000/5 this parameter is set to the same value of 1000 for both CT inputs.

  • Page 53: Establishing Connection And Verifying The Spa/Iec Communication

    1MRK 505 372-UUS Rev. K Section 6 Establishing connection and verifying the SPA/IEC communication Section 6 Establishing connection and verifying the SPA/IEC communication Entering settings M11735-2 v2 If the IED is connected to a monitoring or control system via the rear SPA/IEC103 port, the SPA/IEC103 port has to be set either for SPA or IEC103 use.

  • Page 54: Verifying The Communication

    Section 6 1MRK 505 372-UUS Rev. K Establishing connection and verifying the SPA/IEC communication Verifying the communication M11735-77 v1 To verify that the rear communication with the SMS/SCS system is working, there are some different methods. Choose one of the following. 6.2.1 Verifying SPA communication M11735-81 v5...

  • Page 55: Optical Budget Calculation For Serial Communication With Spa/Iec

    1MRK 505 372-UUS Rev. K Section 6 Establishing connection and verifying the SPA/IEC communication Optical budget calculation for serial communication with SPA/IEC M11736-4 v2 Table 11: Example Distance 1 km Distance 25 m Glass Plastic Maximum attenuation - 11 dB - 7 dB 4 dB/km multi mode: 820 nm - 62.5/125 um 4 dB...

  • Page 57: Establishing Connection And Verifying The Lon Communication

    1MRK 505 372-UUS Rev. K Section 7 Establishing connection and verifying the LON communication Section 7 Establishing connection and verifying the LON communication Communication via the rear ports M12196-2 v1 7.1.1 LON communication M12196-4 v6 LON communication is normally used in substation automation systems. Optical fiber is used within the substation as the physical communication link.

  • Page 58: The Lon Protocol

    Section 7 1MRK 505 372-UUS Rev. K Establishing connection and verifying the LON communication Table 12: Specification of the fiber optic connectors Glass fiber Plastic fiber Cable connector ST-connector snap-in connector Cable diameter 62.5/125 m 1 mm Max. cable length 1000 m 10 m Wavelength...
  • Page 59 1MRK 505 372-UUS Rev. K Section 7 Establishing connection and verifying the LON communication M11888-3 v5 The LON communication setting parameters are set via the local HMI. Refer to the Technical manual for more detailed specifications. If LON communication from the IED stops because of illegal communication parameter settings (outside the setting range) or due to other kind of disturbance, it is possible to reset the IED's LON port.

  • Page 60: Optical Budget Calculation For Serial Communication With Lon

    Section 7 1MRK 505 372-UUS Rev. K Establishing connection and verifying the LON communication Optical budget calculation for serial communication with M11737-4 v2 Table 17: Example Distance 1 km Distance10 m Glass Plastic Maximum attenuation -11 dB - 7 dB 4 dB/km multi mode: 820 nm - 62.5/125 um 4 dB 0.3 dB/m plastic: 620 nm - 1mm...

  • Page 61: Establishing Connection And Verifying The Iec 61850 Communication

    1MRK 505 372-UUS Rev. K Section 8 Establishing connection and verifying the IEC 61850 communication Section 8 Establishing connection and verifying the IEC 61850 communication Overview SEMOD172103-4 v9 The rear optical Ethernet ports are used for: • process bus (IEC/UCA 61850-9-2LE) communication •...

  • Page 63: Testing Ied Operation

    1MRK 505 372-UUS Rev. K Section 9 Testing IED operation Section 9 Testing IED operation Preparing for test IP336-1 v1 9.1.1 Requirements M11740-2 v11 IED test requirements: • Calculated settings • Application configuration diagram • Signal matrix (SMT) configuration • Terminal connection diagram •...

  • Page 64: Preparing The Ied To Verify Settings

    Section 9 1MRK 505 372-UUS Rev. K Testing IED operation All references to CT and VT must be interpreted as analog values received from merging units (MU) via IEC/UCA 61850-9-2LE communication protocol, analog values received from the transformer input module, or analog values received from the LDCM. When using a MU test simulator, make sure it is set to the correct SVID and that the system frequency is set to the same as in the IED.

  • Page 65: Activating The Test Mode

    1MRK 505 372-UUS Rev. K Section 9 Testing IED operation For information about the functions to test, for example signal or parameter names, see the technical manual. The correct initiation of the disturbance recorder is made on pickup and/or release or trip from a function.

  • Page 66: Connecting The Test Equipment To The Ied

    Section 9 1MRK 505 372-UUS Rev. K Testing IED operation supply DC power to the protection IED. When FT switch is used for testing, care shall be exercised to open the tripping circuit, ahead of manipulating the CT fingers. The RTXH test-plug handle leads may be connected to any type of test equipment or instrument. When a number of protection IEDs of the same type are tested, the test-plug handle only needs to be moved from the test switch of one protection IED to the test switch of the other, without altering the previous connections.

  • Page 67: Releasing The Function To Be Tested

    1MRK 505 372-UUS Rev. K Section 9 Testing IED operation IN (I4,I5) VN (U4,U5) TRIP A TRIP B TRIP C IEC 61850 ANSI09000652-1-en.vsd ANSI09000652 V1 EN-US Figure 9: Connection example of the test equipment to the IED when test equipment is connected to the transformer input module Releasing the function to be tested M11413-2 v8...

  • Page 68: Verifying Analog Primary And Secondary Measurement

    Section 9 1MRK 505 372-UUS Rev. K Testing IED operation The Function test modes menu is located in the local HMI under Main menu/Test /Function test modes. Browse to the function instance that needs to be released. Set parameter Blocked for the selected function to No. Verifying analog primary and secondary measurement M11745-2 v14 Verify that the connections are correct and that measuring and scaling is done correctly.

  • Page 69: How To Enable Forcing

    1MRK 505 372-UUS Rev. K Section 9 Testing IED operation while the IED is in test mode. For inputs, this is true regardless of the actual signal voltage present on the input. For outputs, any output relay can be forced to be active or not, regardless of the current requested state of the output in the IED logic configuration.

  • Page 70: How To Change Binary Input/Output Signals Using Forcing

    Section 9 1MRK 505 372-UUS Rev. K Testing IED operation 9.8.3 How to change binary input/output signals using forcing GUID-7DF9FAF1-68B1-49AF-9DE4-2A8D6F6FAEFE v2 Once the IED is in IED test mode, the LHMI/PCM600 menus can be used to control input/output signals freely. 9.8.3.1 Forcing by using LHMI GUID-D885671F-79E5-4B75-8777-B59E44F6FCFC v1...

  • Page 71: Forcing By Using Pcm600

    1MRK 505 372-UUS Rev. K Section 9 Testing IED operation IEC15000022 V1 EN-US It is possible to power-cycle the IED in this state without losing the forcing states and values. This means that once a signal is forced, and the IED remains in IED test mode, the input or output will appear “frozen”...
  • Page 72 Section 9 1MRK 505 372-UUS Rev. K Testing IED operation outputs on multiple I/O boards at the same time. It is also possible to abort this operation (described in step 6 below) and to undo all forcing. Right click on the IED in the plant structure and select Signal Monitoring. Click on the List View tab.

  • Page 73: How To Undo Forcing Changes And Return The Ied To Normal Operation

    1MRK 505 372-UUS Rev. K Section 9 Testing IED operation This commits the values to the IED and exits the editing session. Click Cancel to abort the changes and revert back to actual IED values. IEC15000032 V1 EN-US Regardless if the forcing changes are commited or canceled, the forcing is still active. To force more signals, click the button Start editing signal value for forcing again.
  • Page 74 Section 9 1MRK 505 372-UUS Rev. K Testing IED operation IEC15000031 V1 EN-US Click Yes in the confirmation dialogue box. PCM600 will revert all forced signals back to unforced and the real signal values will immediately take effect again. This may change both binary input values and output relay states and will undo any forcing done by using the LHMI.

  • Page 75: Testing Functionality By Secondary Injection

    1MRK 505 372-UUS Rev. K Section 10 Testing functionality by secondary injection Section 10 Testing functionality by secondary injection 10.1 Testing disturbance report 10.1.1 Introduction M17101-2 v7 The following sub-functions are included in the disturbance report function: • Disturbance recorder •...

  • Page 76: Event Recorder (Er) And Event List (El)

    Section 10 1MRK 505 372-UUS Rev. K Testing functionality by secondary injection Evaluation of the results from the disturbance recording function requires access to a PC either permanently connected to the IED or temporarily connected to the Ethernet port (RJ-45) on the front. The PCM600 software package must be installed in the PC.

  • Page 77: General

    1MRK 505 372-UUS Rev. K Section 10 Testing functionality by secondary injection installation and commissioning, they share also the same principles and similar procedures. For presentation simplicity purpose, only the installation and commissioning of the two-zone busbar differential protection applications are described here to illustrate the principle. 10.3.1.1 General SEMOD65859-3 v4...
  • Page 78 Section 10 1MRK 505 372-UUS Rev. K Testing functionality by secondary injection 3-Ph current Test Set REB 670 REB 670 REB 670 en01000112_2_ansi.vsd ANSI01000112-2 V1 EN-US Figure 12: Typical test connection for CTx current input when test switch is delivered together with one-phase REB670 IED The testing will be explained from one general current input CTx (that is 1 ≤...

  • Page 79: Stability Of The Busbar Differential Protection

    1MRK 505 372-UUS Rev. K Section 10 Testing functionality by secondary injection • de-energize the binary input CTRLZA and energize the binary input CTRLZB, if the value of ZoneSel is CtrlIncludes, • energize the binary input CTRLZA and de-energize binary input CTRLZB, if the value of ZoneSel is CtrlExcludes •...

  • Page 80: Operation Of Fast Open Ct Detection Algorithm

    Section 10 1MRK 505 372-UUS Rev. K Testing functionality by secondary injection The test will be explained for CT1 and one general current input CTx (2 ≤ x ≤ Nmax, where Nmax is the maximum number of used CT inputs). Follow the following test instructions to perform the stability test: Connect the currents I1 and I2 from the three-phase test set to the current terminals of CT1 and CTx inputs of the IED as shown in Figure 13.

  • Page 81: Operation Of Slow Open Ct Detection Algorithm

    1MRK 505 372-UUS Rev. K Section 10 Testing functionality by secondary injection Connect the currents I1 and I2 from the three-phase test set test set to the current terminals of CT1 and CTx inputs of the IED as shown in Figure 13. Make sure that the current measurement from CT1 and CTx inputs are included into the same differential zone (see the previous test instructions for more details).

  • Page 82: Completing The Test

    Section 10 1MRK 505 372-UUS Rev. K Testing functionality by secondary injection Make sure there is enough current for slow open CT algorithm to operate, when the current is disconnected later during testing, by checking that the value of the product 0.15 × I2 × CTprim1 is bigger than the value of OCTOperLev.

  • Page 83: Function Revision History

    1MRK 505 372-UUS Rev. K Section 10 Testing functionality by secondary injection 10.4.1.1 Function revision history GUID-154CAE8E-8FD4-460C-852D-6E5C93545F0D v1 Document Product History revision revision 2.2.1 2.2.1 2.2.2 2.2.3 2.2.3 2.2.4 2.2.4 2.2.4 2.2.5 • The harmonic restraint function changed to freeze the definite and IDMT timers. •...

  • Page 84: Completing The Test

    Section 10 1MRK 505 372-UUS Rev. K Testing functionality by secondary injection If the test has been performed by injection of current in phase A, repeat the test, injecting current into phases B and C with polarizing voltage connected to phases B, respectively C (1 out of 3 currents for operation).

  • Page 85: Completing The Test

    1MRK 505 372-UUS Rev. K Section 10 Testing functionality by secondary injection If there is any configuration logic, which is used to enable or block any of 4 available overcurrent steps, make sure that step under test is enabled (that is, end fault protection). Increase the injected current and note the operated value of the studied step of the function.

  • Page 86: Four Step Directional Ground Fault Protection

    Section 10 1MRK 505 372-UUS Rev. K Testing functionality by secondary injection 10.4.3.2 Four step directional ground fault protection SEMOD53296-208 v8 Connect the test set for single current injection to the appropriate IED terminals. Connect the injection current to terminals A and neutral. Set the injected polarizing voltage slightly larger than the set minimum polarizing voltage (5% of Vn) and set the injection current to lag the voltage by an angle equal to the set reference characteristic angle (AngleRCA), if the forward directional function is selected.
  • Page 87 1MRK 505 372-UUS Rev. K Section 10 Testing functionality by secondary injection Document Product History revision revision 2.2.3 2.2.3 2.2.4 2.2.4 Maximum value changed to 2000.0 % of IBase for IMin1, IMin2, IMin3 and IMin4 settings. 2.2.5 GUID-F7AA2194-4D1C-4475-8853-C7D064912614 v4 When inverse time overcurrent characteristic is selected, the trip time of the stage will be the sum of the inverse time delay and the set definite time delay.
  • Page 88 Section 10 1MRK 505 372-UUS Rev. K Testing functionality by secondary injection 10.4.5 Thermal overload protection, two time constants TRPTTR (49) SEMOD53632-3 v5 Prepare the IED for verification of settings as outlined in section "Requirements" and section "Preparing for test" in this chapter.
  • Page 89 1MRK 505 372-UUS Rev. K Section 10 Testing functionality by secondary injection 10.4.6 Breaker failure protection, phase segregated activation and output CCRBRF (50BF) M12104-2 v13 Prepare the IED for verification of settings outlined in Section "Preparing the IED to verify settings".
  • Page 90 Section 10 1MRK 505 372-UUS Rev. K Testing functionality by secondary injection 10.4.6.3 Checking the residual (ground fault) current trip value Pickup_N set below Pickup_PH M12104-80 v10 Check the low set Pickup_N current where setting FunctionMode = Current and setting BuTripMode = 1 out of 4 Apply the fault condition, including BFI_3P of CCRBRF (50BF), with a current just below set Pickup_N.
  • Page 91 1MRK 505 372-UUS Rev. K Section 10 Testing functionality by secondary injection Set RetripMode = Always. Apply the fault condition, including initiation of CCRBRF (50BF), well above the set current value. Verify that re-trip is achieved after the set time t1, and the back-up trip after time t2. Apply the fault condition, including initiation of CCRBRF (50BF), with current below set current value.
  • Page 92 Section 10 1MRK 505 372-UUS Rev. K Testing functionality by secondary injection 10.4.6.7 Verifying instantaneous back-up trip at CB faulty condition M12104-197 v7 Applies in a case where a signal from CB supervision function regarding CB being faulty and unable to trip is connected to input 52FAIL.
  • Page 93 1MRK 505 372-UUS Rev. K Section 10 Testing functionality by secondary injection Set FunctionMode = Current or CB Pos. Leave the inputs for CB close inactivated. These signals should not influence. Apply the fault condition, including initiation of CCRBRF (50BF), with current above the set Pickup_PH value.
  • Page 94 Section 10 1MRK 505 372-UUS Rev. K Testing functionality by secondary injection 10.4.6.13 Test of FollowStart&Mode behaviour GUID-D68675FC-2533-4D6F-A26B-E1611FB7B32A v1 Set StartMode = FollowStart&Mode. Set FunctionMode = Current. Set RetripMode = UseFunctionMode. Use default value for tStartTimeout = 1.0 s. Use default value for time delay backup trip t2 = 0.150 s. Use default value for time delay re-trip t1 = 0.000 s.
  • Page 95 1MRK 505 372-UUS Rev. K Section 10 Testing functionality by secondary injection • Calculated settings • Valid configuration diagram for the IED • Valid terminal diagram for the IED • Technical reference manual • Single phase test equipment The technical reference manual contains application and functionality summaries, function blocks, logic diagrams, input and output signals, a list of setting parameters and technical data for the function.
  • Page 96 Section 10 1MRK 505 372-UUS Rev. K Testing functionality by secondary injection 10.4.7.3 Checking the re-trip and back-up times SEMOD128582-54 v6 The check of the set times can be made in connection with the check of operate values above. Choose the applicable function and trip mode, such as FunctMode = Current and RetripMode = UseFunctionMode.
  • Page 97 1MRK 505 372-UUS Rev. K Section 10 Testing functionality by secondary injection 10.4.7.5 Verifying the back-up trip mode SEMOD128582-115 v3 In the cases, it is assumed that FunctionMode = Current is selected. Checking that back-up tripping is not achieved at normal CB tripping SEMOD128582-119 v4 Use the actual tripping modes.
  • Page 98 Section 10 1MRK 505 372-UUS Rev. K Testing functionality by secondary injection Checking the case with fault current above set value Pickup_PH GUID-91453035-A2A6-42EF-B580-D2AA1C4A8810 v1 The operation shall be as in RetripMode = UseFunctionMode. Procedure Set FunctionMode = Current or CB Pos. Leave the inputs for CB close inactivated.
  • Page 99 1MRK 505 372-UUS Rev. K Section 10 Testing functionality by secondary injection Check that STALARM signal is set after 1.0s and backup trip is blocked. Reset START signal after 3.5s, ensure that STALARM reset immediately. Set START after 3.6s, ensure that backup trip is set after t2 backup trip delay has expired (3.750 s). 10.4.7.11 Test of FollowStart&Mode behaviour GUID-D68675FC-2533-4D6F-A26B-E1611FB7B32A v1...
  • Page 100 Section 10 1MRK 505 372-UUS Rev. K Testing functionality by secondary injection Connect the test set for injection of voltage and current corresponding to the mode to be used in the application. If a three-phase test set is available this could be used for all the modes. If a single- phase current/voltage test set is available the test set should be connected to a selected input for one-phase current and voltage.
  • Page 101 1MRK 505 372-UUS Rev. K Section 10 Testing functionality by secondary injection and equal to 180° for reverse power protection). Check that the monitored active power is equal to 100% of rated power and that the reactive power is equal to 0% of rated power. Change the angle between the injected current and voltage to Angle1 + 90°.
  • Page 102 Section 10 1MRK 505 372-UUS Rev. K Testing functionality by secondary injection 10.4.11 Capacitor bank protection CBPGAPC GUID-00163D04-EBA8-4CD2-9B7A-B3EC15D32069 v2 Prepare the IED for verification of settings as outlined in section "Preparing for test" in this chapter. In this section it is shown how to test the capacitor bank protection function CBPGAPC for application on a 60Hz, 200MVAr, 400kV SCB with 500/5A ratio CT.
  • Page 103 1MRK 505 372-UUS Rev. K Section 10 Testing functionality by secondary injection Stop injection of all currents (that is, set all currents back to 0A). Check that all above mentioned function binary output signals now have logical value zero. Repeat above steps 1-7 for phase B and phase C. Note that the operation of this feature is based on current peak value.
  • Page 104 Section 10 1MRK 505 372-UUS Rev. K Testing functionality by secondary injection Note that operation of this feature is based on injected current and internally calculated true RMS values. That means that this feature is also able to trip for current signals with varying frequency.
  • Page 105 1MRK 505 372-UUS Rev. K Section 10 Testing functionality by secondary injection Check that all above mentioned function binary output signals now have logical value zero. Repeat above steps 1 - 8 for phase B and phase C. Repeat above steps 1 - 8 to test different points from the above table. Operation of this feature is based on internally calculated peak RMS voltage value.
  • Page 106 Section 10 1MRK 505 372-UUS Rev. K Testing functionality by secondary injection The trip value in secondary volts is calculated according to the following equations: For phase-to-ground measurement: < Vpickup VBase ´ ´ VTprim (Equation 15) ANSIEQUATION2430 V1 EN-US For phase-to-phase measurement: <...
  • Page 107 1MRK 505 372-UUS Rev. K Section 10 Testing functionality by secondary injection 10.5.2 Two step overvoltage protection OV2PTOV (59) M13806-2 v6 Prepare the IED for verification of settings as outlined in section "Requirements" and section "Preparing for test" in this chapter. 10.5.2.1 Verifying the settings M13806-9 v2...
  • Page 108 Section 10 1MRK 505 372-UUS Rev. K Testing functionality by secondary injection 10.5.3.1 Function revision history GUID-22110E0B-DEFB-461F-A437-4D221DB88799 v2 Document Product History revision revision 2.2.1 2.2.1 2.2.2 2.2.3 2.2.3 2.2.4 2.2.4 2.2.5 10.5.3.2 Verifying the settings SEMOD54358-35 v11 Apply a single-phase voltage either to a single-phase voltage input or to a residual voltage input with the pickup value below the set value Pickup1.
  • Page 109 1MRK 505 372-UUS Rev. K Section 10 Testing functionality by secondary injection For example, if the measured voltage jumps from 0 to 1.2 times the set pickup voltage level and time multiplier TD1 is set to 0.05 s (default value), then the TRST1 and TRIP signals trip at a time equal to 0.250 s ±...
  • Page 110 Section 10 1MRK 505 372-UUS Rev. K Testing functionality by secondary injection ANSI07000106-1-en.vsd ANSI07000106 V2 EN-US Figure 14: Connection of the test set to the IED for test of V1 block level where: is three-phase voltage group1 (V1) is three-phase voltage group2 (V2) Decrease slowly the voltage in phase VA of the test set until the PICKUP signal resets.
  • Page 111 1MRK 505 372-UUS Rev. K Section 10 Testing functionality by secondary injection ANSI07000107-1-en.vsd ANSI07000107 V2 EN-US Figure 15: Connection of the test set to the IED for test of V2 block level where: is three-phase voltage group1 (V1) is three-phase voltage group2 (V2) Apply voltage higher than the highest set value of VDTrip, V1Low and V2Low to the V1 three-phase inputs and to one phase of the V2 inputs according to figure 15.
  • Page 112 Section 10 1MRK 505 372-UUS Rev. K Testing functionality by secondary injection ANSI07000108-1-en.vsd ANSI07000108 V2 EN-US Figure 16: Connection of the test set to the IED for test of alarm levels, trip levels and trip timer where: is three-phase voltage group1 (V1) is three-phase voltage group2 (V2) Apply 1.2 ·...
  • Page 113 1MRK 505 372-UUS Rev. K Section 10 Testing functionality by secondary injection Check the measured time by comparing it to the set trip time tTrip. Increase the voltage until PICKUP signal resets. Measure the time from reset of PICKUP signal to reset of TRIP signal.
  • Page 114 Section 10 1MRK 505 372-UUS Rev. K Testing functionality by secondary injection Activate the BLKU binary input. Simultaneously disconnect all the three-phase voltages from the IED. No TRIP signal should appear. Reset the BLKU binary input. Inject the measured voltages at rated values for at least set tRestore time. Activate the BLOCK binary input.
  • Page 115 1MRK 505 372-UUS Rev. K Section 10 Testing functionality by secondary injection The test above can be repeated to check the time to reset. The tests above can be repeated to test the frequency dependent inverse time characteristic. Verification of the low voltage magnitude blocking M16289-39 v7 Check that the IED settings are appropriate, for example the PUFrequency, VMin, and the tDelay.
  • Page 116 Section 10 1MRK 505 372-UUS Rev. K Testing functionality by secondary injection Note the voltage magnitude value and compare it with the set value. Slowly increase the frequency of the applied voltage, to a value above PUFrequency. Check that the PICKUP signal does not appear. Wait for a time corresponding to tDelay, make sure that the TRIP signal does not appear.
  • Page 117 1MRK 505 372-UUS Rev. K Section 10 Testing functionality by secondary injection 10.7 Multipurpose protection SEMOD53552-1 v1 10.7.1 Function revision history GUID-74F9B9A9-91EB-45BA-A883-6BA325C8B272 v1 Document Product History revision revision 2.2.1 2.2.1 2.2.2 2.2.3 2.2.3 2.2.4 2.2.4 2.2.4 2.2.5 • The harmonic restraint function changed to freeze the definite and IDMT timers. •...
  • Page 118 Section 10 1MRK 505 372-UUS Rev. K Testing functionality by secondary injection Go to Main menu /Test /Function test modes /Multipurpose protection / GeneralCurrentVoltage(GAPC) /CVGAPC:x and make sure that CVGAPC to be tested is unblocked and other functions that might disturb the evaluation of the test are blocked. Connect the test set for injection of three-phase currents to the appropriate current terminals of the IED.
  • Page 119 1MRK 505 372-UUS Rev. K Section 10 Testing functionality by secondary injection Definite times may be tested as above (non-directional overcurrent feature). For inverse time characteristics the PICKUP value (to which the overcurrent ratio has to be calculated) is the actual pickup value as got with actual restraining from the voltage restraining quantity.
  • Page 120 Section 10 1MRK 505 372-UUS Rev. K Testing functionality by secondary injection 10.8 Secondary system supervision SEMOD53556-1 v1 10.8.1 Fuse failure supervision FUFSPVC M1405-2 v8 Prepare the IED for verification of settings as outlined in section "Requirements" and section "Preparing for test"...
  • Page 121 1MRK 505 372-UUS Rev. K Section 10 Testing functionality by secondary injection Simulate normal operating conditions with the three-phase currents in phase with their corresponding phase voltages and with all of them equal to their rated values. Slowly decrease the measured voltage in one phase until the BLKV signal appears. Record the measured voltage and calculate the corresponding negative-sequence voltage according to the equation (observe that the voltages in the equation are phasors): ×...
  • Page 122 Section 10 1MRK 505 372-UUS Rev. K Testing functionality by secondary injection × (Equation 25) EQUATION1819-ANSI V1 EN-US Where: are the measured phase voltages EQUATION1820-ANSI V1 EN-US Compare the result with the set value of the zero-sequence tripping voltage (consider that the set value 3V0Pickup is in percentage of the base voltage.) Repeat steps and 2.
  • Page 123 1MRK 505 372-UUS Rev. K Section 10 Testing functionality by secondary injection • The BLKV and BLKZ signals appear without any time delay. The BLKZ signal will be activated only if the internal deadline detection is not activated at the same time. •...
  • Page 124 Section 10 1MRK 505 372-UUS Rev. K Testing functionality by secondary injection Set SealIn to On, Vdif Main block to 20% of VBase and VSealIn to 70% of VBase. Apply three-phase voltages with the value slightly below VSealIn level. Decrease one of the three-phase voltages on main fuse group. The voltage change must be greater than the set value for Vdif Main block.
  • Page 125 1MRK 505 372-UUS Rev. K Section 10 Testing functionality by secondary injection Step No. OpMode Changes after step 2 Expected output RMS or DFT Mag Change UL1 back to 63.5V STL1 , STRISE, BFI_3P signal should be TRUE for 100 ms DFT Angle (vector Change UL1 to 63.5V at 15°...
  • Page 126 Section 10 1MRK 505 372-UUS Rev. K Testing functionality by secondary injection Step No. OpMode Changes after step 2 Expected output Instantaneous 1 Change IL1 to 2 A STL1 , STRISE, BFI_3P signal should be cycle or TRUE for 100 ms Instantaneous 2 cycle Instantaneous 1...
  • Page 127 1MRK 505 372-UUS Rev. K Section 10 Testing functionality by secondary injection 10.9 Control SEMOD53560-1 v2 10.9.1 Synchrocheck, energizing check, and synchronizing SESRSYN (25) M2377-3 v12 This section contains instructions on how to test the synchrochecksynchronism check, energizing check, and synchronizing function SESRSYN (25) for single, double and breaker-and-a-half arrangements. Prepare the IED for verification of settings as outlined in section "Requirements"...
  • Page 128 Section 10 1MRK 505 372-UUS Rev. K Testing functionality by secondary injection Test VMeasure equipment V-Bus Ph/N V-Bus Ph/Ph Input Phase A,B,C AB,BC,CA V-Line VMeasure Ph/N Ph/Ph Input Phase A,B,C AB,BC,CA ANSI05000480-3-en.vsd ANSI05000480 V3 EN-US Figure 17: General test connection with three-phase voltage connected to the line side ANSI05000481-4-en.vsd ANSI05000481 V4 EN-US Figure 18:...
  • Page 129 1MRK 505 372-UUS Rev. K Section 10 Testing functionality by secondary injection V3PL1 VA, VB or VC line 1 voltage inputs on the IED V3PBB1 Bus1 voltage input on the IED Testing the frequency difference M2377-116 v11 The frequency difference test should verify that operation is achieved when the frequency difference between bus and line is less than set value of FreqDiffMax and above set value of FreqDiffMin.
  • Page 130 Section 10 1MRK 505 372-UUS Rev. K Testing functionality by secondary injection Apply voltages V-Line (for example) = 80% GblBaseSelLine and V-Bus = 80% GblBaseSelBusGblBaseSelBus with the same phase-angle and frequency. Check that the AUTOSYOK and MANSYOK outputs are activated. The test can be repeated with different voltage values to verify that the function trips within the set VDiffSC.
  • Page 131 1MRK 505 372-UUS Rev. K Section 10 Testing functionality by secondary injection Apply voltages V-Line equal to 100% GblBaseSelLine and V-Bus equal to 100% GblBaseSelBus, with a frequency difference equal to 0 mHz and a phase difference lower than the set value. Check that the AUTOSYOK and MANSYOK outputs are activated.
  • Page 132 Section 10 1MRK 505 372-UUS Rev. K Testing functionality by secondary injection Verify the settings AutoEnerg or ManEnerg to be DBLL. Apply a single-phase voltage of 30% GblBaseSelBus to the V-Bus and a single-phase voltage of 100% GblBaseSelLine to the V-Line. Check that the AUTOENOK and MANENOK outputs are activated after set tAutoEnerg respectively tManEnerg.
  • Page 133 1MRK 505 372-UUS Rev. K Section 10 Testing functionality by secondary injection Testing the voltage selection for double breaker M2377-691 v6 This test should verify that correct voltage is selected for the measurement in the SESRSYN function used for a diameter in a Breaker-and-a-half arrangement. Apply a single-phase voltage of 100% GblBaseSelLine to the V-Line and a single-phase voltage of 100% GblBaseSelBus to the V-Bus.
  • Page 134 Section 10 1MRK 505 372-UUS Rev. K Testing functionality by secondary injection Bus 1 Bus 2 CB1 52 CB3 352 (SESRSYN 1) (SESRSYN 3) CB2 252 (SESRSYN 2) LN1 989 LN2 989 Line 1 Line 2 ANSI11000274.en.v1 ANSI11000274 V1 EN-US Figure 20: Objects used in the voltage selection logic 10.9.1.5...
  • Page 135 1MRK 505 372-UUS Rev. K Section 10 Testing functionality by secondary injection Figure illustrates a suggested testing arrangement, where the circuit-breaker (CB) is simulated by an external bi-stable relay (BR), for example a relay type RXMVB2 or RXMD or Breaker Simulator of Hitachi Power grids.
  • Page 136 Section 10 1MRK 505 372-UUS Rev. K Testing functionality by secondary injection To test ANSI04000202-1-en.vsd ANSI04000202 V2 EN-US Figure 21: Simulating the CB operation by a bi-stable relay/breaker simulator and manual switches 10.9.2.1 Preparation of the verification M12400-40 v8 Check the function settings on the local HMI under Main menu/Settings /IED Settings/Control / Autorecloser79,5(0–>1)/SMBRREC:x(79,5(0–>)):x If any timer settings are reduced to speed up or facilitate the testing, they shall be set to normal after testing.
  • Page 137 1MRK 505 372-UUS Rev. K Section 10 Testing functionality by secondary injection If SESRSYN (25) as an internal function or external device is not operated by the injection, input signal SYNC must be connected as a permanent high signal or controlled by a switch. Read and make notes of the reclosing operation counters on the local HMI under Main menu / Test/Function status /Control/AutoRecloser79,5(0–>1) /SMBRREC(79,5(0–>1)):x Possibly reset the counters to Zero.
  • Page 138 Section 10 1MRK 505 372-UUS Rev. K Testing functionality by secondary injection If just single-pole reclosing is selected, ARMode = 1ph, a check can be run to make sure that a three-pole trip does not result in any auto reclosing. Other similar cases can be checked as required.
  • Page 139 1MRK 505 372-UUS Rev. K Section 10 Testing functionality by secondary injection The output READY shall be low, and PREP3P shall be high. Apply a single phase fault and thereby a RI signal. Check that a definitive three phase trip and no auto reclosing takes place. Testing auto reclosing in a multi-breaker arrangement M12400-185 v7 The usual arrangement is to have an auto recloser per circuit-breaker.
  • Page 140 Section 10 1MRK 505 372-UUS Rev. K Testing functionality by secondary injection 10.9.4 Function revision history GUID-CC62CA75-201A-4C5D-9FD4-89DBFD56F97C v2 10.9.5 Single command, 16 signals SINGLECMD SEMOD172444-5 v3 For the single command function block, it is necessary to configure the output signal to corresponding binary output of the IED.
  • Page 141 1MRK 505 372-UUS Rev. K Section 10 Testing functionality by secondary injection 10.10.1.1 Function revision history GUID-7F31EFA5-F8D8-4D8D-85DA-3418F70ABE94 v2 Document Product History revision revision 2.2.1 2.2.1 2.2.2 2.2.3 2.2.3 2.2.4 2.2.4 Binary quality inputs SENPRESQ and SENTEMPQ have been added for pressure and temperature sensor signals in order to control alarm and lockout signals.
  • Page 142 Section 10 1MRK 505 372-UUS Rev. K Testing functionality by secondary injection Activate BLOCK binary input and check that the outputs TEMPALM, TEMPLO, ALARM and LOCKOUT disappear. Reset the BLOCK binary input. Ensure that temperature lockout condition exists and then activate the reset lockout input RESETLO and check that the outputs TEMPLO and LOCKOUT reset.
  • Page 143 1MRK 505 372-UUS Rev. K Section 10 Testing functionality by secondary injection Ensure that binary input SENLEVELQ is activated and reduce the liquid level input below LevelLOLimit or activate the binary input signal SENLVLLO, check that LVLLO signal after a set time delay of tLevelLockOut.
  • Page 144 Section 10 1MRK 505 372-UUS Rev. K Testing functionality by secondary injection POSCLOSE POSOPEN Test of CB contact travel time 4.1. Test the set timing defined by OpenTimeCorr, CloseTimeCorr, tTrOpenAlm and tTrCloseAlm. 4.2. Change the status of the auxiliary contacts such that travel time to open TTRVOP and travel time to close TTRVCL exceed the respective set values (tTrOpenAlm and tTrCloseAlm).
  • Page 145 1MRK 505 372-UUS Rev. K Section 10 Testing functionality by secondary injection 9.1. Test the actual set value defined by SpChAlmTime. 9.2. Enable SPRCHRST input. Also activate SPRCHRD after a time greater than set time SpChAlmTime. 9.3. At this condition, SPCHALM is activated. 10.
  • Page 146 Section 10 1MRK 505 372-UUS Rev. K Testing functionality by secondary injection 10.10.6 Function revision history GUID-5883ADA7-549A-464B-AC60-082A50165A2B v1 Document Product History revision revision 2.2.3 2.2.3 2.2.4 2.2.4 2.2.4 2.2.5 Updated monitoring till 9 order current harmonics. Refer to document revision H for monitoring till 5 order current harmonics.
  • Page 147 1MRK 505 372-UUS Rev. K Section 10 Testing functionality by secondary injection Continue to inject the same level of harmonics level until the 2NDHDALM signal appears and note down the time from 2NDHDWRN signal set to 2NDHDALM signal set. Compare the noted time value with the set time limit value of alarm. Repeat Steps for the harmonics until 9 order.
  • Page 148 Section 10 1MRK 505 372-UUS Rev. K Testing functionality by secondary injection Continue to inject the same level of harmonics level until the 2NDHDALM signal appears and note down the time from 2NDHDWRN signal set to 2NDHDALM signal set. Compare the noted time value with the set time limit value of alarm. Repeat Steps for the harmonics until 9 order.
  • Page 149 1MRK 505 372-UUS Rev. K Section 10 Testing functionality by secondary injection Check that the FLTILxMAG*, FLTILxANG*, FLTINMAG, FLTINANG, FLTULxMAG*, FLTULxANG*, FLTUNMAG, FLTUNANG, IMAXMAG, ILxMAXPK* and ILxMAX* output signals reads the corresponding values after PostTrig setting. Check the TRIGDUR output which shows the TRIGFLTUI input signal active duration in ms. Check the TRIGTIME output which shows the IED current date and time of the instant when TRIGFLTUI input signal become active.
  • Page 150 Section 10 1MRK 505 372-UUS Rev. K Testing functionality by secondary injection 10. Activate STOPACC input after some time and supply the IED with same current and voltage. 11. Check that the ACCINPRG signal disappears immediately and EAFACC and ERFACC outputs also stop updating.
  • Page 151 1MRK 505 372-UUS Rev. K Section 10 Testing functionality by secondary injection Command and transmit function blocks included in the operation of different built-in functions must be tested at the same time as their corresponding functions. 10.13 Remote communication SEMOD53601-1 v1 10.13.1 Binary signal transfer M14951-2 v6...
  • Page 152 Section 10 1MRK 505 372-UUS Rev. K Testing functionality by secondary injection ANSI07000188 V1 EN-US Figure 22: Test of RTC with I/O 10.14 Basic IED functions SEMOD52026-1 v1 10.14.1 Parameter setting group handling SETGRPS M11369-2 v4 Prepare the IED for verification of settings as outlined in section "Preparing for test"...
  • Page 153 1MRK 505 372-UUS Rev. K Section 10 Testing functionality by secondary injection 10.14.1.2 Completing the test M11369-39 v4 Continue to test another function or end the test by changing the TESTMODE setting to Disabled. Restore connections and settings to the original values, if changed for testing purposes. 10.15 Exit test mode SEMOD53244-3 v6...
  • Page 155 1MRK 505 372-UUS Rev. K Section 11 Primary injection testing Section 11 Primary injection testing IP10812-1 v1 SEMOD65857-3 v3 Whenever it becomes necessary to work on primary equipment, it is essential that all the necessary switching, locking, grounding and safety procedures are observed and obeyed in a rigid and formalized manner.
  • Page 156 Section 11 1MRK 505 372-UUS Rev. K Primary injection testing Check that the current is present only in the phase being tested. If the injected current is high enough, check that trip contacts operate accordingly to the scheme wiring. Check that trip information is stored in the disturbance recorder and event list (if connected). Switch off the current.
  • Page 157 1MRK 505 372-UUS Rev. K Section 11 Primary injection testing Connect the test set for primary current injection to the main CTs as shown in figure 24. Make sure that current measurement from two used CT inputs are included in the same differential zone.
  • Page 159 1MRK 505 372-UUS Rev. K Section 12 Commissioning and maintenance of the fault clearing system Section 12 Commissioning and maintenance of the fault clearing system 12.1 Commissioning tests SEMOD56513-5 v5 During commissioning all protection functions shall be verified with the setting values used at each plant. The commissioning tests must include verification of all circuits by highlighting the circuit diagrams and the configuration diagrams for the used functions.
  • Page 160 Section 12 1MRK 505 372-UUS Rev. K Commissioning and maintenance of the fault clearing system When protection IEDs are combined with built-in control, the test interval can be increased drastically, up to for instance 15 years, because the IED continuously reads service values, operates the breakers, and so on.
  • Page 161 1MRK 505 372-UUS Rev. K Section 12 Commissioning and maintenance of the fault clearing system 12.2.2.3 Secondary injection SEMOD56528-17 v2 The periodic maintenance test is done by secondary injection from a portable test set. Each protection shall be tested according to the secondary injection test information for the specific protection IED. Only the setting values adopted shall be checked for each protection function.
  • Page 162 Section 12 1MRK 505 372-UUS Rev. K Commissioning and maintenance of the fault clearing system 12.2.2.7 Measurement of service currents SEMOD56528-30 v4 After a maintenance test it is recommended to measure the service currents and service voltages recorded by the protection IED. The service values are checked on the local HMI or in PCM600. Ensure that the correct values and angles between voltages and currents are recorded.
  • Page 163 1MRK 505 372-UUS Rev. K Section 13 Troubleshooting Section 13 Troubleshooting 13.1 Checking the self supervision signals IP1474-1 v2 13.1.1 Checking the self supervision function IP1473-1 v1 13.1.1.1 Determine the cause of an internal failure M11657-2 v2 This procedure describes how to navigate the menus in order to find the cause of an internal failure when indicated by the flashing green LED on the HMI module.
  • Page 164 Section 13 1MRK 505 372-UUS Rev. K Troubleshooting Indicated result Possible reason Proposed action (Protocol name) Fail Protocol has failed. (I/O module name) No problem detected. None. Ready (I/O module name) Fail I/O modules has failed. Check that the I/O module has been configured and connected to the IOP1- block.
  • Page 165 1MRK 505 372-UUS Rev. K Section 13 Troubleshooting HMI Signal Name: Status Description Application READY / FAIL This signal will be active if one or more of the application threads are not in the state that Runtime Engine expects. The states can be CREATED, INITIALIZED, RUNNING, etc.
  • Page 166 Section 13 1MRK 505 372-UUS Rev. K Troubleshooting The internal events in this list not only refer to faults in the IED, but also to other activities, such as change of settings, clearing of disturbance reports, and loss of external time synchronization. The information can only be retrieved from the Parameter Setting software package.
  • Page 167 1MRK 505 372-UUS Rev. K Section 13 Troubleshooting The Hint menu is currently only available in English. All the entries are in English, regardless of which language is selected. The supported list of hints are as follows: Table 24: Hint menu Headline Explanation Incorrect setting of SyncLostMode...
  • Page 168 Section 13 1MRK 505 372-UUS Rev. K Troubleshooting Headline Explanation LDCM not running the application image LDCM in <slot number> is running the factory image instead of the application image. The factory image is older than the required FW version and does not contain the latest updates and fixes.
  • Page 169 1MRK 505 372-UUS Rev. K Section 13 Troubleshooting Headline Explanation Mismatching data batch size to DistRep Check cycle time for SMAI and 3PHSUM blocks connected to Disturbance Report blocks. SMAI and 3PHSUM blocks shall have the same cycle time. LDCM missing connections LDCM transmitter is missing connections.
  • Page 170 Section 13 1MRK 505 372-UUS Rev. K Troubleshooting If any configuration that makes the module needed remains, then the HW reconfig will not remove the module. The module will still be needed. An error indication for the module will appear, if the module is physically removed from the IED and the IED is restarted with some part of the configuration still requiring the module.
  • Page 171 1MRK 505 372-UUS Rev. K Section 13 Troubleshooting • Remove the IED from the panel if necessary. • Remove the rear plate of the IED. • Remove the front plate. • Remove the screws of the transformer input module, both front and rear. Pull out the faulty module.
  • Page 173 1MRK 505 372-UUS Rev. K Section 14 Glossary Section 14 Glossary M14893-1 v20 Alternating current Actual channel Application configuration tool within PCM600 A/D converter Analog-to-digital converter ADBS Amplitude deadband supervision Analog digital conversion module, with time synchronization Analog input ANSI American National Standards Institute Access Point Autoreclosing...
  • Page 174 Section 14 1MRK 505 372-UUS Rev. K Glossary Class C Protection Current Transformer class as per IEEE/ ANSI CMPPS Combined megapulses per second Communication Management tool in PCM600 CO cycle Close-open cycle Codirectional Way of transmitting G.703 over a balanced line. Involves two twisted pairs making it possible to transmit information in both directions Command COMTRADE...
  • Page 175 1MRK 505 372-UUS Rev. K Section 14 Glossary Ethernet configuration tool EHV network Extra high voltage network Electronic Industries Association Electromagnetic compatibility Electromotive force Electromagnetic interference EnFP End fault protection Enhanced performance architecture Electrostatic discharge F-SMA Type of optical fiber connector Fault number FIPS Federal Information Processing Standards...
  • Page 176 Section 14 1MRK 505 372-UUS Rev. K Glossary HVDC High-voltage direct current IDBS Integrating deadband supervision International Electrical Committee IEC 60044-6 IEC Standard, Instrument transformers – Part 6: Requirements for protective current transformers for transient performance IEC 60870-5-103 Communication standard for protection equipment. A serial master/slave protocol for point-to-point communication IEC 61850 Substation automation communication standard...
  • Page 177 1MRK 505 372-UUS Rev. K Section 14 Glossary LIB 520 High-voltage software module Liquid crystal display LDAPS Lightweight Directory Access Protocol LDCM Line data communication module Local detection device Light-emitting diode LON network tool Local operating network Miniature circuit breaker Mezzanine carrier module Milli-ampere module Main processing module...
  • Page 178 Section 14 1MRK 505 372-UUS Rev. K Glossary Parallel redundancy protocol Power supply module Parameter setting tool within PCM600 Precision time protocol PT ratio Potential transformer or voltage transformer ratio PUTT Permissive underreach transfer trip RASC Synchrocheck relay, COMBIFLEX Relay characteristic angle RISC Reduced instruction set computer RMS value...
  • Page 179 1MRK 505 372-UUS Rev. K Section 14 Glossary Starpoint Neutral/Wye point of transformer or generator Static VAr compensation Trip coil Trip circuit supervision Transmission control protocol. The most common transport layer protocol used on Ethernet and the Internet. TCP/IP Transmission control protocol over Internet Protocol. The de facto standard Ethernet protocols incorporated into 4.2BSD Unix.
  • Page 180 Section 14 1MRK 505 372-UUS Rev. K Glossary Three times the zero sequence voltage. Often referred to as the residual voltage or the neutral point voltage Busbar protection REB670 Commissioning manual © 2017 - 2022 Hitachi Energy. All rights reserved...
  • Page 182 Hitachi Energy Sweden AB Grid Automation Products SE-721 59 Västerås, Sweden Phone +46 (0) 10 738 00 00 https://hitachienergy.com/protection-control Scan this QR code to visit our website © 2017 - 2022 Hitachi Energy. All rights reserved...

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