Table 78 Extended Self-Test Log Data Structure - Hitachi HTS542516K9SA00 Specifications

State shall contain a value indicating the state of the device when the command was issued to the
device or the reset occurred as described below.
Value
x0h
x1h
x2h
x3h
x4h
x5h-xAh
xBh-xFh
Note: The value of x is vendor specific
14.16.2.4
This field shall contain the total number of errors attributable to the device that have been reported
by the device during the life of the device. This count shall not include errors attributed to the
receipt of faulty commands such as commands codes not implemented by the device or requests with
invalid parameters or invalid addresses. If the maximum value for this field is reached the count
shall remain at the maximum value when additional errors are encountered and logged.
Extended Self-test log sector
14.16.3
The following table defines the format of each of the sectors that comprise the Extended SMART
self-test log.
The Extended SMART self-test log sector shall support 48-bit and 28-bit addressing. All 28-bit
entries contained in the SMART self-test log, defined in "Self-test log data structure" shall also be
included in the Extended SMART self-test log with all 48-bit entries.
Description
Self-test log data structure revision number
Reserved
Self-test descriptor index (7:0)
Self-test descriptor index (15:8)
Descriptor entry 1
Descriptor entry 2
...
Descriptor entry 18
Vendor specific
Reserved
Data structure checksum

Table 78 Extended Self-test log data structure

These descriptor entries are viewed as a circular buffer. The nineteenth self-test shall create a
descriptor entry that replaces descriptor entry 1. The next self-test after that shall create a
descriptor entry that replaces descriptor entry 2, etc. All unused self-test descriptors shall be filled
with zeros
14.16.3.1
The value of this revision number shall be 01h.
.
Device error count
Self-test log data structure revision number
Page 108 of 171
5K250 (SATA) OEM Specification
State
Unknown
Sleep
Standby
Active/Idle
SMART Off-line or Self-test
Reserved
Vendor specific
Bytes Offset
1 00h
1 01h
1 02h
1 03h
26 04h
26 1Eh
26 1D8h
2 1F2h
11 1F4h
1 1FFh
512