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I
Section
Listed on the title page of this m anual is a m icrofiche part number. This number
1-4.
can be used to order 4 x 6 inch microfilm transparencies of the m anual. Each microfiche
contains up to 6 0 photo-duplicates of the m anual pages. The m icrofiche package also
incluc;les the latest m anual changes suppleme!lt as w ell as
order an additional m anual, use the part number listed on the title page of this manual.
1 -5.
DESCRIPTIO N
The HP Model 4085M Switching M atrix, shown in F igure I-I along with its
1-6.
furnished accessories, consists of the HP Model 4084A Sw itching Matrix Controller and
the HP Model 4085A Switching Matrix. The 4085M is designed for systemization with the
HP Model 4 1 4 5 A Semiconductor Parameter Analyzer and the HP M odel 9 8 1 6 or 9836
Desktop Computer. Figure 1-2 shows the basic configuration of the system. This system
can m easure and characterize the dc parameters of virtually any low-to-medium power
semiconductor device, whether on the wafer or packaged.
The 4084A Switching M atrix Controller, in response to commands sent from the
1-7.
computer over the HP-lB, controls the connections between the m easurement pins of the
4085A and the stimulus/measurement units, voltage sources, and voltage monitors of the
414 5A. The 4084A also pro\lides dc power to the 4085A and contains a ROM-based 4085A
relay exerciser, which can be initiated manually from the front panel of the 4084A, or
under program control from the computer.
1 -8.
The 4085A Switching Matrix has eight instrument ports for connection of the
stimulus/measurement units, voltage m onitors, and voltage sources of the 4145A, and can
be equipped with twelve to forty-eight m easurement pin boards, each having force, sense,
and guard terminals, which function as the m easurement terminals. Extensive guarding is
used on the m easurement pin boards and within the 4085A to eliminate the effects of
noise and to reduce interterminal leakage current, the prime sources of error in low
current m easurem ents.
Switching between the m easurement terminals and the instrument ports is done by drY'
reed relays on the pin boards. Pin boards can be · easily removed and installed, making it
easy to replace defective relays. Defective relays can be quickly isolated by the relay
test function of the 4084A. For wafer m easurements, the 4085A can be mounted on any
manual or automatic wafer prober that can accommodate a Fairchild Century VII type
small test head. For m easurement of packaged devices, one of the available test fixtures
can be m ounted on the 4085A.
r--- ---- ---- - ---- ---- -- - --
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__
_
_
_
1-2
Control Cable
BNC
C?-bles-
�6�7�A J
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___
4085M
Triaxial
Figure 1-2. System Configuration
pertinent s. e rvice· notes. To
all
A
40
8
4
DJWO
- - -
--
- -
--
\
414SA
HP - 18 Cables
Cables
Mode14085 M
,
I
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9836/16
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