ABB Relion 670 Series Commissioning Manual

ABB Relion 670 Series Commissioning Manual

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Relion
670 SERIES
Transformer protection RET670
Version 2.2 ANSI
Commissioning manual

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Summary of Contents for ABB Relion 670 Series

  • Page 1 ® Relion 670 SERIES Transformer protection RET670 Version 2.2 ANSI Commissioning manual...
  • Page 3 Document ID: 1MRK 504 165-UUS Issued: June 2021 Revision: J Product version: 2.2 © 2017 - 2021 Hitachi Power Grids. All rights reserved...
  • Page 4 (eay@cryptsoft.com) and Tim Hudson (tjh@cryptsoft.com). Trademarks ABB is a registered trademark of ABB Asea Brown Boveri Ltd. Manufactured by/for a Hitachi Power Grids company. All other brand or product names mentioned in this document may be trademarks or registered trademarks of their respective holders.
  • Page 5 Disclaimer The data, examples and diagrams in this manual are included solely for the concept or product description and are not to be deemed as a statement of guaranteed properties. All persons responsible for applying the equipment addressed in this manual must satisfy themselves that each intended application is suitable and acceptable, including that any applicable safety or other operational requirements are complied with.
  • Page 6 Conformity This product complies with the directive of the Council of the European Communities on the approximation of the laws of the Member States relating to electromagnetic compatibility (EMC Directive 2004/108/EC) and concerning electrical equipment for use within specified voltage limits (Low-voltage directive 2006/95/EC).
  • Page 7: Table Of Contents

    1MRK 504 165-UUS Rev. J Table of contents Table of contents Section 1 Introduction.......................15 This manual..........................15 Intended audience........................15 Product documentation......................16 1.3.1 Product documentation set......................16 1.3.2 Document revision history....................... 17 1.3.3 Related documents......................... 18 Document symbols and conventions..................18 1.4.1 Symbols...........................18 1.4.2 Document conventions......................19 IEC 61850 edition 1 / edition 2 mapping...................
  • Page 8 Table of contents 1MRK 504 165-UUS Rev. J 4.10.2 Binary output circuits....................... 54 4.11 Checking optical connections....................54 Section 5 Configuring the IED and changing settings........... 55 Overview........................... 55 Configuring analog CT inputs....................55 Supervision of input/output modules..................56 Section 6 Establishing connection and verifying the SPA/IEC communication..57 Entering settings........................57 6.1.1 Entering SPA settings......................57...
  • Page 9 1MRK 504 165-UUS Rev. J Table of contents 10.2 Activating the test mode......................83 10.3 Preparing the connection to the test equipment................83 10.4 Connecting the test equipment to the IED.................84 10.5 Releasing the function to be tested................... 85 10.6 Verifying analog primary and secondary measurement............86 10.7 Testing the protection functionality....................
  • Page 10 Table of contents 1MRK 504 165-UUS Rev. J 11.3.5.3 Verifying the three-phase pickup from winding one side..........102 11.3.5.4 Verifying the single-phase pickup from winding one side..........103 11.3.5.5 Verifying the zero-sequence current reduction from winding two side......103 11.3.5.6 Verifying the three-phase pickup from winding two side..........104 11.3.5.7 Verifying the single-phase pickup from winding two side..........
  • Page 11 1MRK 504 165-UUS Rev. J Table of contents 11.4.9.3 Completing the test......................139 11.4.10 Power swing logic PSLPSCH....................139 11.4.10.1 Function revision history....................140 11.4.10.2 Testing the carrier send and trip signals................140 11.4.10.3 Testing the influence of the residual overcurrent protection..........140 11.4.10.4 Checking the underreaching zone..................141 11.4.10.5...
  • Page 12 Table of contents 1MRK 504 165-UUS Rev. J 11.5.3.2 Completing the test......................170 11.5.4 Four step residual overcurrent protection, (Zero sequence or negative sequence directionality) EF4PTOC (51N/67N)..................170 11.5.4.1 Function revision history....................171 11.5.4.2 Four step directional ground fault protection ..............171 11.5.4.3 Four step non-directional ground fault protection ............172 11.5.4.4...
  • Page 13 1MRK 504 165-UUS Rev. J Table of contents 11.5.11.3 Completing the test......................188 11.5.12 Pole discrepancy protection CCPDSC (52PD)..............188 11.5.12.1 Verifying the settings......................188 11.5.12.2 Completing the test......................189 11.5.13 Directional underpower protection GUPPDUP (37).............. 189 11.5.13.1 Verifying the settings......................189 11.5.13.2 Completing the test......................
  • Page 14 Table of contents 1MRK 504 165-UUS Rev. J 11.6.5.1 Function revision history....................209 11.6.5.2 Check of undervoltage levels................... 209 11.6.5.3 Check of voltage differential trip and alarm levels............211 11.6.5.4 Check of trip and trip reset timers..................212 11.6.5.5 Final adjustment of compensation for VT ratio differences ..........213 11.6.5.6 Completing the test......................
  • Page 15 1MRK 504 165-UUS Rev. J Table of contents 11.10.1 Current circuit supervision CCSSPVC (87) ................234 11.10.1.1 Verifying the settings......................234 11.10.1.2 Completing the test......................234 11.10.2 Fuse failure supervision FUFSPVC..................234 11.10.2.1 Checking that the binary inputs and outputs trip as expected .........234 11.10.2.2 Measuring the trip value for the negative sequence function ..........
  • Page 16 Table of contents 1MRK 504 165-UUS Rev. J 11.11.5.7 Single transformer......................258 11.11.5.8 Parallel voltage regulation....................259 11.11.5.9 Completing the test......................262 11.11.6 Single command, 16 signals SINGLECMD................262 11.11.7 Interlocking..........................262 11.12 Scheme communication......................262 11.12.1 Scheme communication logic for distance or overcurrent protection ZCPSCH (85) ....262 11.12.1.1 Function revision history....................263 11.12.1.2...
  • Page 17 1MRK 504 165-UUS Rev. J Table of contents 11.13.1.6 Completing the test......................275 11.14 Monitoring..........................275 11.14.1 Gas medium supervision SSIMG..................275 11.14.1.1 Function revision history....................276 11.14.1.2 Testing the gas medium supervision for pressure alarm and pressure lockout conditions......................276 11.14.1.3 Testing the gas medium supervision for temperature alarm and temperature lockout conditions.........................
  • Page 18 Table of contents 1MRK 504 165-UUS Rev. J 11.14.14.4 Completing the test......................288 11.15 Metering..........................288 11.15.1 Pulse-counter logic PCFCNT....................288 11.15.2 Function for energy calculation and demand handling ETPMMTR........288 11.15.2.1 Verifying the settings......................288 11.15.2.2 Completing the test......................289 11.16 Station communication......................
  • Page 19 1MRK 504 165-UUS Rev. J Table of contents 15.1.1 Checking the self supervision function.................. 305 15.1.1.1 Determine the cause of an internal failure................305 15.1.2 Self supervision HMI data..................... 305 15.1.2.1 General IED status......................305 15.2 Fault tracing..........................306 15.2.1 Internal fault indications......................306 15.2.2 Using front-connected PC.....................
  • Page 21: Introduction

    1MRK 504 165-UUS Rev. J Section 1 Introduction Section 1 Introduction This manual GUID-AB423A30-13C2-46AF-B7FE-A73BB425EB5F v20 The commissioning manual contains instructions on how to commission the IED. The manual can also be used by system engineers and maintenance personnel for assistance during the testing phase. The manual provides procedures for the checking of external circuitry and energizing the IED, parameter setting and configuration as well as verifying settings by secondary injection.
  • Page 22: Product Documentation

    Section 1 1MRK 504 165-UUS Rev. J Introduction Product documentation 1.3.1 Product documentation set GUID-3AA69EA6-F1D8-47C6-A8E6-562F29C67172 v16 Engineering manual Installation manual Commissioning manual Operation manual Application manual Technical manual Communication protocol manual Cyber security deployment guideline IEC07000220-4-en.vsd IEC07000220 V4 EN-US Figure 1: The intended use of manuals throughout the product lifecycle The engineering manual contains instructions on how to engineer the IEDs using the various tools available within the PCM600 software.
  • Page 23: Document Revision History

    1MRK 504 165-UUS Rev. J Section 1 Introduction describes how to identify disturbances and how to view calculated and measured power grid data to determine the cause of a fault. The application manual contains application descriptions and setting guidelines sorted per function. The manual can be used to find out when and for what purpose a typical protection function can be used.
  • Page 24: Related Documents

    Section 1 1MRK 504 165-UUS Rev. J Introduction Document Date Product version History revision Document not released 2020-09 2.2.4 Functions ZMBURPSB, APPTEF, SCCFPVOC, SCUCPTOC, SCPDPTOV, SCUVPTOV, IEC 61850SIM, ALGOS and SMBRREC added. Updates/enhancements made to functions REFPDIF, ZMFPDIS, ZMFCPDIS, PPLPHIZ, PPL2PHIZ, ZCVPSOF, EF4PTOC, ROV2PTOV, SAPTUF, SAPTOF, CCSSPVC, FUFSPVC, SESRSYN, SMPPTRC, SSIMG, and SSIML.
  • Page 25: Document Conventions

    1MRK 504 165-UUS Rev. J Section 1 Introduction The warning icon indicates the presence of a hazard which could result in personal injury. The caution hot surface icon indicates important information or warning about the temperature of product surfaces. Class 1 Laser product. Take adequate measures to protect the eyes and do not view directly with optical instruments.
  • Page 26: Iec 61850 Edition 1 / Edition 2 Mapping

    Section 1 1MRK 504 165-UUS Rev. J Introduction IEC 61850 edition 1 / edition 2 mapping GUID-C5133366-7260-4C47-A975-7DBAB3A33A96 v9 Function block names are used in ACT and PST to identify functions. Respective function block names of Edition 1 logical nodes and Edition 2 logical nodes are shown in the table below. Table 1: IEC 61850 edition 1 / edition 2 mapping Function block name...
  • Page 27 1MRK 504 165-UUS Rev. J Section 1 Introduction Function block name Edition 1 logical nodes Edition 2 logical nodes EF4PTOC EF4LLN0 EF4PTRC EF4PTRC EF4RDIR EF4RDIR GEN4PHAR GEN4PHAR PH1PTOC PH1PTOC EFPIOC EFPIOC EFPIOC ETPMMTR ETPMMTR ETPMMTR FDPSPDIS FDPSPDIS FDPSPDIS FLTMMXU FMPSPDIS FMPSPDIS FMPSPDIS FRPSPDIS...
  • Page 28 Section 1 1MRK 504 165-UUS Rev. J Introduction Function block name Edition 1 logical nodes Edition 2 logical nodes OV2PTOV GEN2LLN0 OV2PTOV OV2PTOV PH1PTRC PH1PTRC PCFCNT PCGGIO PCFCNT PHPIOC PHPIOC PHPIOC PSLPSCH ZMRPSL PSLPSCH PSPPPAM PSPPPAM PSPPPAM PSPPTRC PSTPDIF PTRSTHR PTRSTHR PTRSTHR QCBAY...
  • Page 29 1MRK 504 165-UUS Rev. J Section 1 Introduction Function block name Edition 1 logical nodes Edition 2 logical nodes SSIML SSIML SSIML STBPTOC STBPTOC BBPMSS STBPTOC SXCBR SXCBR SXCBR SXSWI SXSWI SXSWI T2WPDIF T2WPDIF T2WGAPC T2WPDIF T2WPHAR T2WPTRC T3WPDIF T3WPDIF T3WGAPC T3WPDIF T3WPHAR...
  • Page 30 Section 1 1MRK 504 165-UUS Rev. J Introduction Function block name Edition 1 logical nodes Edition 2 logical nodes ZGVPDIS ZGVLLN0 PH1PTRC PH1PTRC ZGVPDIS ZGVPDIS ZGVPTUV ZGVPTUV ZMCAPDIS ZMCAPDIS ZMCAPDIS ZMCPDIS ZMCPDIS ZMCPDIS ZMFCPDIS ZMFCLLN0 PSFPDIS PSFPDIS ZMFPDIS ZMFPDIS ZMFPTRC ZMFPTRC ZMMMXU ZMMMXU...
  • Page 31: Safety Information

    1MRK 504 165-UUS Rev. J Section 2 Safety information Section 2 Safety information Symbols on the product GUID-E48F2EC3-6AB8-4ECF-A77E-F16CE45CA5FD v4 All warnings must be observed. Read the entire manual before doing installation or any maintenance work on the product. Class 1 Laser product. Take adequate measures to protect your eyes and do not view directly with optical instruments.
  • Page 32: Caution Signs

    Section 2 1MRK 504 165-UUS Rev. J Safety information GUID-BEDD698E-356C-4CF9-9DAE-64DB3CEADEAD v1 Dangerous voltages can occur on the connectors, even though the auxiliary voltage has been disconnected. M2369-2 v3 Always connect the IED to protective ground, regardless of the operating conditions. This also applies to special occasions such as bench testing, demonstrations and off-site configuration.
  • Page 33: Note Signs

    1MRK 504 165-UUS Rev. J Section 2 Safety information M2697-2 v2 Always use a conductive wrist strap connected to protective ground when replacing modules. Electrostatic discharge (ESD) may damage the module and IED circuitry. M2698-2 v2 Take care to avoid electrical shock during installation and commissioning. M2693-2 v2 Changing the active setting group will inevitably change the IED's operation.
  • Page 35: Available Functions

    1MRK 504 165-UUS Rev. J Section 3 Available functions Section 3 Available functions GUID-F5776DD1-BD04-4872-BB89-A0412B4B5CC3 v1 The following tables list all the functions available in the IED. Those functions that are not exposed to the user or do not need to be configured are not described in this manual.
  • Page 36: Back-Up Protection Functions

    Section 3 1MRK 504 165-UUS Rev. J Available functions IEC 61850 or ANSI Function description Transformer function name RET670 (Customized) FMPSPDIS Faulty phase identification with load enchroachment ZMRPDIS, Distance measuring zone, quad characteristic separate Ph-Ph and Ph-E settings ZMRAPDIS FRPSPDIS Phase selection, quadrilateral characteristic with settable angle ZMFPDIS High speed distance protection, quad and mho characteristic...
  • Page 37 1MRK 504 165-UUS Rev. J Section 3 Available functions IEC 61850 or ANSI Function description function name RET670 (Customized) GUPPDUP Directional underpower protection GOPPDOP Directional overpower protection BRCPTOC Broken conductor check CBPGAPC Capacitor bank protection NS2PTOC 46I2 Negative sequence time overcurrent protection for machines, two steps VRPVOC Voltage restrained overcurrent protection APPTEF...
  • Page 38: Control And Monitoring Functions

    Section 3 1MRK 504 165-UUS Rev. J Available functions Control and monitoring functions GUID-E3777F16-0B76-4157-A3BF-0B6B978863DE v21 IEC 61850 or ANSI Function description Transformer function name RET670 (Customized) Control SESRSYN Synchrocheck, energizing check and synchronizing SMBRREC Autorecloser APC15 Control functionality for a single bay, max 15 objects (2CB), including interlocking (see Table 4) APC30 Control functionality for up to 6 bays, max 30 objects (6CBs), including...
  • Page 39 1MRK 504 165-UUS Rev. J Section 3 Available functions IEC 61850 or ANSI Function description Transformer function name RET670 (Customized) CCSSPVC Current circuit supervision FUFSPVC Fuse failure supervision VDSPVC Fuse failure supervision based on voltage difference DELVSPVC 7V_78V Voltage delta supervision, 2 phase DELISPVC Current delta supervision, 2 phase DELSPVC...
  • Page 40 Section 3 1MRK 504 165-UUS Rev. J Available functions IEC 61850 or ANSI Function description Transformer function name RET670 (Customized) LIMITER Definable limiter Absolute value POL_REC Polar to rectangular converter RAD_DEG Radians to degree angle converter CONST_REAL Definable constant for logic functions REALSEL Analog input selctor for real values STOREINT...
  • Page 41 1MRK 504 165-UUS Rev. J Section 3 Available functions IEC 61850 or ANSI Function description Transformer function name RET670 (Customized) I103IED IED status for IEC 60870-5-103 I103SUPERV Supervison status for IEC 60870-5-103 I103USRDEF Status for user defined signals for IEC 60870-5-103 L4UFCNT Event counter with limit supervision PTRSTHR...
  • Page 42 Section 3 1MRK 504 165-UUS Rev. J Available functions Table 4: Number of function instances in APC15 Function name Function description Total number of instances SCILO Interlocking BB_ES A1A2_BS A1A2_DC ABC_BC BH_CONN BH_LINE_A BH_LINE_B DB_BUS_A DB_BUS_B DB_LINE ABC_LINE AB_TRAFO SCSWI Switch controller SXSWI Circuit switch...
  • Page 43 1MRK 504 165-UUS Rev. J Section 3 Available functions Table 5: Number of function instances in APC30 Function name Function description Total number of instances SCILO Interlocking BB_ES A1A2_BS A1A2_DC ABC_BC BH_CONN BH_LINE_A BH_LINE_B DB_BUS_A DB_BUS_B DB_LINE ABC_LINE AB_TRAFO SCSWI Switch controller SXSWI Circuit switch...
  • Page 44: Communication

    Section 3 1MRK 504 165-UUS Rev. J Available functions Configurable logic blocks Q/T Total number of instances SRMEMORYQT TIMERSETQT XORQT Table 7: Total number of instances for extended logic package Extended configurable logic block Total number of instances GATE PULSETIMER RSMEMORY SLGAPC SRMEMORY...
  • Page 45 1MRK 504 165-UUS Rev. J Section 3 Available functions IEC 61850 or function ANSI Function description Transformer name RET670 (Customized) IEC 61850SIM IEC 61850 simulation mode GOOSEBINRCV GOOSE binary receive GOOSEDPRCV GOOSE function block to receive a double point value GOOSEINTRCV GOOSE function block to receive an integer value GOOSEMVRCV...
  • Page 46 Section 3 1MRK 504 165-UUS Rev. J Available functions IEC 61850 or function ANSI Function description Transformer name RET670 (Customized) FRONTSTATUS Access point diagnostic for front Ethernet port SCHLCCH Access point diagnostic for non-redundant Ethernet port RCHLCCH Access point diagnostic for redundant Ethernet ports DHCP DHCP configuration for front access point Remote communication...
  • Page 47: Basic Ied Functions

    1MRK 504 165-UUS Rev. J Section 3 Available functions IEC 61850 or function ANSI Function description Transformer name RET670 (Customized) ZCLCPSCH Local acceleration logic ECPSCH Scheme communication logic for residual overcurrent protection ECRWPSCH Current reversal and weak-end infeed logic for residual overcurrent protection Table 8: Number of function instances in Synchrophasor report, 24 phasors Function name...
  • Page 48 Section 3 1MRK 504 165-UUS Rev. J Available functions IEC 61850 or function Description name DSTENABLE Enables or disables the use of daylight saving time DSTEND GPS time synchronization module IRIG-B Time synchronization SETGRPS Number of setting groups ACTVGRP Active parameter setting group TESTMODE Test mode functionality CHNGLCK...
  • Page 49 1MRK 504 165-UUS Rev. J Section 3 Available functions Table 10: Local HMI functions IEC 61850 or function Description name LHMICTRL Local HMI signals LANGUAGE Local human machine language SCREEN Local HMI Local human machine screen behavior FNKEYTY1–FNKEYTY5 Parameter setting function for HMI in PCM600 FNKEYMD1–...
  • Page 51: Starting Up

    1MRK 504 165-UUS Rev. J Section 4 Starting up Section 4 Starting up Factory and site acceptance testing GUID-38C2B5FA-9210-4D85-BA21-39CE98A1A84A v2 Testing the proper IED operation is carried out at different occasions, for example: • Acceptance testing • Commissioning testing • Maintenance testing This manual describes the workflow and the steps to carry out the commissioning testing.
  • Page 52: Checking The Power Supply

    Section 4 1MRK 504 165-UUS Rev. J Starting up Checking the power supply M11725-2 v6 Do not insert anything else to the female connector but the corresponding male connector. Inserting anything else (such as a measurement probe) may damage the female connector and prevent a proper electrical contact between the printed circuit board and the external wiring connected to the screw terminal block.
  • Page 53: Setting Up Communication Between Pcm600 And The Ied

    1MRK 504 165-UUS Rev. J Section 4 Starting up t (s) xx04000310-1-en.vsd IEC04000310 V2 EN-US Figure 2: Typical IED start-up sequence 1 IED energized. Green LED instantly starts flashing 2 LCD lights up and "IED startup" is displayed 3 The main menu is displayed. A steady green light indicates a successful startup. If the upper row in the window indicates ‘Fail’...
  • Page 54 Section 4 1MRK 504 165-UUS Rev. J Starting up DHCP is available for the front port, and a device connected to it can thereby obtain an automatically assigned IP address via the local HMI path Main menu/ Configuration/ Communication/ Ethernet configuration/ Front port/ DHCP.
  • Page 55 1MRK 504 165-UUS Rev. J Section 4 Starting up IEC13000057-1-en.vsd IEC13000057 V1 EN-US Figure 3: Select: Search programs and files Type View network connections and click on the View network connections icon. Transformer protection RET670 Commissioning manual © 2017 - 2021 Hitachi Power Grids. All rights reserved...
  • Page 56 Section 4 1MRK 504 165-UUS Rev. J Starting up IEC13000058-1-en.vsd IEC13000058 V1 EN-US Figure 4: Click View network connections Right-click and select Properties. IEC13000059-1-en.vsd IEC13000059 V1 EN-US Figure 5: Right-click Local Area Connection and select Properties Select the TCP/IPv4 protocol from the list of configured components using this connection and click Properties.
  • Page 57 1MRK 504 165-UUS Rev. J Section 4 Starting up IEC13000060-1-en.vsd IEC13000060 V1 EN-US Figure 6: Select the TCP/IPv4 protocol and open Properties Select Use the following IP address and define IP address and Subnet mask if the front port is used and if the IP address is not set to be obtained automatically by the IED,see Figure 7.
  • Page 58: Writing An Application Configuration To The Ied

    Section 4 1MRK 504 165-UUS Rev. J Starting up The PC and IED must belong to the same subnetwork for this set-up to work. Setting up the PC to access the IED via a network The same method is used as for connecting to the front port. The PC and IED must belong to the same subnetwork for this set-up to work.
  • Page 59: Checking Vt Circuits

    1MRK 504 165-UUS Rev. J Section 4 Starting up Both the primary and the secondary sides must be disconnected from the line and the IED when plotting the excitation characteristics. If the CT secondary circuit ground connection is removed without the current transformer primary being de-energized, dangerous voltages may result in the secondary CT circuits.
  • Page 60: Checking The Binary Input/Output Circuits

    Section 4 1MRK 504 165-UUS Rev. J Starting up Verify that the contacts are of current circuit type. Verify that the short circuit jumpers are located in the correct slots. Voltage circuit Verify that the contacts are of voltage circuit type. Check that no short circuit jumpers are located in the slots dedicated for voltage.
  • Page 61: Configuring The Ied And Changing Settings

    1MRK 504 165-UUS Rev. J Section 5 Configuring the IED and changing settings Section 5 Configuring the IED and changing settings Overview M11730-2 v7 The customer specific values for each setting parameter and a configuration file have to be available before the IED can be set and configured, if the IED is not delivered with a configuration.
  • Page 62: Supervision Of Input/Output Modules

    Section 5 1MRK 504 165-UUS Rev. J Configuring the IED and changing settings The following parameter shall be set for every current transformer connected to the IED: Table 11: CT configuration Parameter description Parameter name Range Default Rated CT primary current in A CTPRIMn from 0 to 99999 3000...
  • Page 63: Establishing Connection And Verifying The Spa/Iec Communication

    1MRK 504 165-UUS Rev. J Section 6 Establishing connection and verifying the SPA/IEC communication Section 6 Establishing connection and verifying the SPA/IEC communication Entering settings M11735-2 v2 If the IED is connected to a monitoring or control system via the rear SPA/IEC103 port, the SPA/IEC103 port has to be set either for SPA or IEC103 use.
  • Page 64: Verifying The Communication

    Section 6 1MRK 504 165-UUS Rev. J Establishing connection and verifying the SPA/IEC communication Verifying the communication M11735-77 v1 To verify that the rear communication with the SMS/SCS system is working, there are some different methods. Choose one of the following. 6.2.1 Verifying SPA communication M11735-81 v5...
  • Page 65: Optical Budget Calculation For Serial Communication With Spa/Iec

    1MRK 504 165-UUS Rev. J Section 6 Establishing connection and verifying the SPA/IEC communication Optical budget calculation for serial communication with SPA/IEC M11736-4 v2 Table 13: Example Distance 1 km Distance 25 m Glass Plastic Maximum attenuation - 11 dB - 7 dB 4 dB/km multi mode: 820 nm - 62.5/125 um 4 dB...
  • Page 67: Establishing Connection And Verifying The Lon Communication

    1MRK 504 165-UUS Rev. J Section 7 Establishing connection and verifying the LON communication Section 7 Establishing connection and verifying the LON communication Communication via the rear ports M12196-2 v1 7.1.1 LON communication M12196-4 v6 LON communication is normally used in substation automation systems. Optical fiber is used within the substation as the physical communication link.
  • Page 68: The Lon Protocol

    Section 7 1MRK 504 165-UUS Rev. J Establishing connection and verifying the LON communication Table 14: Specification of the fiber optic connectors Glass fiber Plastic fiber Cable connector ST-connector snap-in connector Cable diameter 62.5/125 m 1 mm Max. cable length 1000 m 10 m Wavelength...
  • Page 69 1MRK 504 165-UUS Rev. J Section 7 Establishing connection and verifying the LON communication M11888-3 v5 The LON communication setting parameters are set via the local HMI. Refer to the Technical manual for more detailed specifications. If LON communication from the IED stops because of illegal communication parameter settings (outside the setting range) or due to other kind of disturbance, it is possible to reset the IED's LON port.
  • Page 70: Optical Budget Calculation For Serial Communication With Lon

    Section 7 1MRK 504 165-UUS Rev. J Establishing connection and verifying the LON communication Optical budget calculation for serial communication with M11737-4 v2 Table 19: Example Distance 1 km Distance10 m Glass Plastic Maximum attenuation -11 dB - 7 dB 4 dB/km multi mode: 820 nm - 62.5/125 um 4 dB 0.3 dB/m plastic: 620 nm - 1mm...
  • Page 71: Establishing Connection And Verifying The Iec 61850 Communication

    1MRK 504 165-UUS Rev. J Section 8 Establishing connection and verifying the IEC 61850 communication Section 8 Establishing connection and verifying the IEC 61850 communication Overview SEMOD172103-4 v9 The rear optical Ethernet ports are used for: • process bus (IEC/UCA 61850-9-2LE) communication •...
  • Page 72 Section 8 1MRK 504 165-UUS Rev. J Establishing connection and verifying the IEC 61850 communication that other signal is shown as Ok. Be sure to re-connect the removed connection after completed verification. Transformer protection RET670 Commissioning manual © 2017 - 2021 Hitachi Power Grids. All rights reserved...
  • Page 73: Establishing Connection And Verifying The Ieee C37.118/1344 Communication

    1MRK 504 165-UUS Rev. J Section 9 Establishing connection and verifying the IEEE C37.118/1344 communication Section 9 Establishing connection and verifying the IEEE C37.118/1344 communication Overview GUID-EFD77C28-6F7C-4277-8C7E-30E78CC8EFAD v3 The IED can support synchrophasor data communication via IEEE C37.118 and/or IEEE1344 with maximum 8 TCP clients and 6 UDP client groups, simultaneously.
  • Page 74: Setting The Tcp/Udp Client Communication

    Section 9 1MRK 504 165-UUS Rev. J Establishing connection and verifying the IEEE C37.118/1344 communication 1.1. Select the port. 1.2. Set values for Mode, IPAddress and IPMask. Mode must be set to Normal. 1.3. Check that the correct IP address is assigned to the port. Set the TCP communication parameters by navigating to: Main menu /Configuration / Communication /Station communication /phasor measurement /PMU Configuration / PMUCONF .
  • Page 75 1MRK 504 165-UUS Rev. J Section 9 Establishing connection and verifying the IEEE C37.118/1344 communication IEC140000133-1-en.vsd IEC140000133 V1 EN-US Figure 9: PMU Connection Tester tool The following steps explain how to set the PMU Connection Tester parameters in order to establish an IEEE C37.118 connection with the PMU: Set the IP stack on PMU Connection Tester to IPv4.
  • Page 76 Section 9 1MRK 504 165-UUS Rev. J Establishing connection and verifying the IEEE C37.118/1344 communication IEC140000134-1-en.vsd IEC140000134 V1 EN-US 1.1. Navigate to the Settings tab. 1.2. Force the IP stack to IPv4 by setting the parameter ForceIPv4 to True. Set the Connection Parameters on PMU Connection Tester for TCP communication according to the PMU configuration.
  • Page 77 1MRK 504 165-UUS Rev. J Section 9 Establishing connection and verifying the IEEE C37.118/1344 communication 2.4. Set the Device ID Code in PMU Connection Tester per PMU Data Stream ID Number (IDCODE). The PMU Data Stream ID Number is a user assigned ID number (1-65534) for each data stream sent out from the PMU and it is defined under parameter PMUdataStreamIDCODE.
  • Page 78: Verifying The Communication

    Section 9 1MRK 504 165-UUS Rev. J Establishing connection and verifying the IEEE C37.118/1344 communication 3.4. Set the Port as the TCP port defined in the PMU for control of data sent over UDP client group 1 (Default value: 4713). This can be found under the parameter TCPportUDPdataCtrl1 as one of the UDP communication parameters.
  • Page 79 1MRK 504 165-UUS Rev. J Section 9 Establishing connection and verifying the IEEE C37.118/1344 communication IEC140000139-1-en.vsd IEC140000139 V1 EN-US Figure 11: Graphic view over streaming synchrophasor data • Open the drop-down menu in the Command field. There is a list of commands that can be sent from the client (PMU Connection Tester) to the PMU.
  • Page 80 Section 9 1MRK 504 165-UUS Rev. J Establishing connection and verifying the IEEE C37.118/1344 communication IEC140000140-1-en.vsd IEC140000140 V1 EN-US Figure 12: Drop-down menu with commands for testing the PMU • Switch to the Protocol Specific tab. Here, all the IEEE C37.118 message types can be seen. If the HeaderFrame is not included, ask the PMU to send the header frame via the Send Header Frame command (Previous stage).
  • Page 81 1MRK 504 165-UUS Rev. J Section 9 Establishing connection and verifying the IEEE C37.118/1344 communication IEC140000141-1-en.vsd IEC140000141 V1 EN-US Figure 13: All the IEEE C37.118 message types • It is also possible to capture the IEEE C37.118 synchrophasor data in an Excel file. This is done by navigating to File /Capture /Start Stream Debug Capture...
  • Page 82 Section 9 1MRK 504 165-UUS Rev. J Establishing connection and verifying the IEEE C37.118/1344 communication IEC140000142-1-en.vsd IEC140000142 V1 EN-US Figure 14: Start capturing the IEEE C37.118 synchrophasor data • The synchrophasor data capturing process can be stopped at any point of time by navigating to File /Capture /Stop Stream Debug Capture...
  • Page 83 1MRK 504 165-UUS Rev. J Section 9 Establishing connection and verifying the IEEE C37.118/1344 communication IEC140000143-1-en.vsd IEC140000143 V1 EN-US Figure 15: Stop capturing the IEEE C37.118 synchrophasor data • Open the capture file and observe the captured synchrophasor data. In order to get the Phasor names on top of each column (See figure 16), the capture process should start before connecting the PMU Connection Tester to the PMU, i.e.
  • Page 84: Verifying The Ieee C37.118/1344 Udp Communication

    Section 9 1MRK 504 165-UUS Rev. J Establishing connection and verifying the IEEE C37.118/1344 communication IEC140000144 V1 EN-US Figure 16: Captured synchrophasor data 9.5.2 Verifying the IEEE C37.118/1344 UDP communication GUID-F0D1117D-3D0F-498F-A00C-242763F8A4E6 v1 After setting both PMU configuration and the UDP client configuration (As explained in sections Setting the PMU station communication (PMU Report),...
  • Page 85: Optical Budget Calculation For Pmu - Pdc Communication

    1MRK 504 165-UUS Rev. J Section 9 Establishing connection and verifying the IEEE C37.118/1344 communication Optical budget calculation for PMU - PDC communication GUID-F5DEACB1-4B83-4C68-B59A-694CAC78AF3D v3 Most of the times, the PMU IEDs are located in the substations. A local PDC might be located in the substation.
  • Page 87: Testing Ied Operation

    1MRK 504 165-UUS Rev. J Section 10 Testing IED operation Section 10 Testing IED operation 10.1 Preparing for test IP336-1 v1 10.1.1 Requirements M11740-2 v11 IED test requirements: • Calculated settings • Application configuration diagram • Signal matrix (SMT) configuration •...
  • Page 88: Preparing The Ied To Verify Settings

    Section 10 1MRK 504 165-UUS Rev. J Testing IED operation This IED is designed for a maximum continuous current of four times the rated current. All references to CT and VT must be interpreted as analog values received from merging units (MU) via IEC/UCA 61850-9-2LE communication protocol, analog values received from the transformer input module, or analog values received from the LDCM.
  • Page 89: Activating The Test Mode

    1MRK 504 165-UUS Rev. J Section 10 Testing IED operation For information about the functions to test, for example signal or parameter names, see the technical manual. The correct initiation of the disturbance recorder is made on pickup and/or release or trip from a function.
  • Page 90: Connecting The Test Equipment To The Ied

    Section 10 1MRK 504 165-UUS Rev. J Testing IED operation The RTXH test-plug handle leads may be connected to any type of test equipment or instrument. When a number of protection IEDs of the same type are tested, the test-plug handle only needs to be moved from the test switch of one protection IED to the test switch of the other, without altering the previous connections.
  • Page 91: Releasing The Function To Be Tested

    1MRK 504 165-UUS Rev. J Section 10 Testing IED operation IN (I4,I5) VN (U4,U5) TRIP A TRIP B TRIP C IEC 61850 ANSI09000652-1-en.vsd ANSI09000652 V1 EN-US Figure 19: Connection example of the test equipment to the IED when test equipment is connected to the transformer input module 10.5 Releasing the function to be tested...
  • Page 92: Verifying Analog Primary And Secondary Measurement

    Section 10 1MRK 504 165-UUS Rev. J Testing IED operation The Function test modes menu is located in the local HMI under Main menu/Test /Function test modes. Browse to the function instance that needs to be released. Set parameter Blocked for the selected function to No. 10.6 Verifying analog primary and secondary measurement M11745-2 v14...
  • Page 93: Testing The Protection Functionality

    1MRK 504 165-UUS Rev. J Section 10 Testing IED operation IEC10000032-1-en.vsd IEC10000032 V1 EN-US Figure 20: PCM600 disturbance report tool display after communication interruption 10.7 Testing the protection functionality GUID-125B6F28-D3E5-4535-9CD6-6C056B79F496 v2 Each protection function must be tested individually by secondary injection. •...
  • Page 94: How To Enable Forcing

    Section 10 1MRK 504 165-UUS Rev. J Testing IED operation Be observant that forcing of binary inputs and outputs on an IED, with inappropriate setup, can result in potential danger. 10.8.2 How to enable forcing GUID-50280F59-A98C-4E48-AB6D-2B4C138943DD v2 To enable forcing, the IED must first be put into IED test mode. While the IED is not in test mode, the LHMI/PCM600 menus that relate to forcing will not have any effect on the input/output status due to safety reasons.
  • Page 95: Forcing By Using Lhmi

    1MRK 504 165-UUS Rev. J Section 10 Testing IED operation 10.8.3.1 Forcing by using LHMI GUID-D885671F-79E5-4B75-8777-B59E44F6FCFC v1 Editing a signal value directly GUID-E0C115BE-3AD1-48C7-BA2D-29857CD3D3ED v1 • Edit the input/output value directly to select the desired logical level, by doing following: Select the value line of the desired signal, see figure 21. Press the Enter key to edit the value.
  • Page 96: Forcing By Using Pcm600

    Section 10 1MRK 504 165-UUS Rev. J Testing IED operation It is possible to power-cycle the IED in this state without losing the forcing states and values. This means that once a signal is forced, and the IED remains in IED test mode, the input or output will appear “frozen”...
  • Page 97 1MRK 504 165-UUS Rev. J Section 10 Testing IED operation IEC15000024 V1 EN-US The Signal Monitoring menu changes and indicates the forcing values that can be edited. IEC15000025 V1 EN-US Select and edit the values. Click Acknowledge and send. IEC15000026 V1 EN-US This commits the values to the IED and exits the editing session.
  • Page 98: How To Undo Forcing Changes And Return The Ied To Normal Operation

    Section 10 1MRK 504 165-UUS Rev. J Testing IED operation 10.8.4 How to undo forcing changes and return the IED to normal operation GUID-00E2BAD8-A29E-4B9D-80E6-E12F59E019BD v1 Regardless of which input/output signals have been forced, all forced signals will return to their normal states immediately when the IED is taken out of test mode.
  • Page 99 1MRK 504 165-UUS Rev. J Section 10 Testing IED operation This may change both binary input values and output relay states and will undo any forcing done by using the LHMI. If the IED is left in test mode, then it is still possible to perform new forcing operations, both from LHMI and from PCM600 Transformer protection RET670 Commissioning manual...
  • Page 101: Testing Functionality By Secondary Injection

    1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection Section 11 Testing functionality by secondary injection 11.1 Testing disturbance report 11.1.1 Introduction M17101-2 v7 The following sub-functions are included in the disturbance report function: • Disturbance recorder •...
  • Page 102: Event Recorder (Er) And Event List (El)

    Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection Evaluation of the results from the disturbance recording function requires access to a PC either permanently connected to the IED or temporarily connected to the Ethernet port (RJ-45) on the front. The PCM600 software package must be installed in the PC.
  • Page 103: Verifying The Settings

    1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection 11.3.1.1 Verifying the settings SEMOD54284-51 v11 Go to Main menu /Test /Function test modes /Differential protection and make sure that the restricted earth fault protection, low impedance function REFPDIF (87N) is set to Disabled and that the four step residual overcurrent function EF4PTOC (51N/67N) under Main menu /Test /Function test modes /Current protection is set to Disabled, since they are configured to the same current transformer inputs as the transformer differential protection.
  • Page 104: Verifying The Settings

    Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection 11.3.2.1 Verifying the settings SEMOD55257-46 v5 Connect a single-phase or three-phase test set to inject the operating voltage. The injection is done across the measuring branch. The required trip and alarm voltage, as well as the used stabilizing resistance value must be set in the function.
  • Page 105: Verifying The Settings

    1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection Document Product History revision revision 2.2.3 2.2.4 2.2.4 The upper limit of ROA setting range is changed from 90 degrees to 119 degrees. 2.2.5 11.3.3.2 Verifying the settings SEMOD55252-86 v12 Connect the test set for single-phase current injection to the protection terminals connected to the CT in the power transformer neutral-to-ground circuit.
  • Page 106 Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection Increase the injected current in phase A slowly by more than the set Pick Up ICV. No signal shall be activated. Decrease the injected current in phase A to half the rated current. Increase the injected current in phase A in a step by more than the set Pick Up ICV.
  • Page 107: Completing The Test

    1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection Connect a trip output contact to a timer. Decrease the injected current stepwise to 50 % of the trip level and check the time delay. Repeat steps 3 – 6 for phases B and C. 11.3.4.2 Completing the test GUID-BE74F565-7465-4300-B2A6-D99CE8844147 v2...
  • Page 108: Verifying The Zero-Sequence Current Reduction From The Winding One Side

    Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection and DIFANGLE outputs have value that corresponds to the PST tap position at which the function needs to be tested. Apply the logical value one to the binary input STOPCOMP into PSTPDIF function. The function will now remember the transformation ratio and phase angle shift, which corresponds to this particular PST tap.
  • Page 109: Verifying The Single-Phase Pickup From Winding One Side

    1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection CTsec  IdMin I Pickup Base W Ph W CTprim (Equation 2) IECEQUATION18058 V1 EN-US The pickup current is independent of the actual phase angle shift across the protected PST.
  • Page 110: Verifying The Three-Phase Pickup From Winding Two Side

    Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection CTsec  I njected W Base W CTprim (Equation 3) IECEQUATION18059 V1 EN-US The phase angle for all three injected current on the test set shall have the same value of zero degree.
  • Page 111 1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection IEC18000247 V1 EN-US Figure 23: Single-phase pickup factor when ZSCurrSubtrW2 = Off For phase angle shifts greater than ±60 degrees, actual operation will happen in one of other two phases where current has not been injected. •...
  • Page 112: Verifying The Operate Characteristic

    Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection 11.3.5.8 Verifying the operate characteristic GUID-2A65B94E-3525-4022-A237-B8ABC596DC92 v2 Connect the test set for injection of two three-phase current sets to the current terminals of the IED, which are connected to the CTs on the winding one and winding two sides respectively of the power transformer.
  • Page 113 1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection To verify the settings for the operating points according to the following fault types should be tested: • One phase-to-phase fault • One phase-to-ground fault The shape of the operating characteristic depends on the values of the setting parameters. The figures illustrating the characteristic for the distance protection function can be used for settings with and without load encroachment.
  • Page 114 Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection Test point Reach Set value Comments 0.85 x RFPP x tan (ArgRLd) ArgLd = angle for the maximal load transfer 0.85 x RFPP RLdFw x tan (ArgLd) RLdFw RLdFw –0.2143 x RFPP/2 Exact: 0.8 x RFPP/2 (ArgDir=20°)
  • Page 115: Measuring The Operating Limit Of Set Values

    1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection Table 21: Test points for phase-to-earth L3-E (Ohm/Loop) Test point Reach Value Comments (2 x X1 (2 x X1 + X0 2 x R1 + R0 0.8 x (2 x X1 + X0 0.8 x (2 x R1 + R0...
  • Page 116: Measuring The Operating Time Of Distance Protection Zones

    Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection Observe that the zones that are not tested have to be blocked and the zone that is tested has to be released. Repeat steps 1 to 3 to find the operating value for the phase-to-ground fault C-E according to figure and table 21.
  • Page 117 1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection loop ArgNegRes loop 50% of RLdFwd RFltFwdPG ANSI09000734-2-en.vsd ANSI09000734 V2 EN-US Figure 27: Operating characteristic for phase selection function, forward direction single-phase faults Table 22: Test points for phase-to-ground loop CG (Ohm/loop) Test point Reach Value...
  • Page 118: Measuring The Operating Limit Of Set Values

    Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection phase LdAngle ArgNegRes 60° phase ArgDir 50% RLdFwd 0.5·RFltFwdPP ANSI09000735-1-en.vsd ANSI09000735 V1 EN-US Figure 28: Operating characteristic for phase selection function, forward direction phase-to-phase faults Table 23: Test points for phase-to-phase loops A-B (Ohm/phase) Test point Reach Value...
  • Page 119: Completing The Test

    1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection Supply the IED with healthy conditions for at least two seconds. Apply the fault condition and slowly decrease the measured impedance to find the operate value for of the phase-to-ground loop ECG, test point 1, according to figure 27. Compare the result of the measurement with the expected value according to table 22.
  • Page 120: Phase-To-Phase Faults

    Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection 11.4.3.1 Phase-to-phase faults M14944-292 v8 ZAngPP Ohm/phase IEC07000009-4-en.vsd IEC07000009 V4 EN-US Figure 29: Proposed test points for phase-to-phase fault Table 24: Test points for phase-to-phase (ohms / phase) Test reach Value...
  • Page 121: Faulty Phase Identification With Load Encroachment Fmpspdis (21)

    1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection ZAngPG Ohm/loop ANSI07000010-1-en.vsd ANSI07000010 V1 EN-US Figure 30: Proposed test points for phase-to-ground faults Table 25: Test points for phase-to-ground loops A-B (Ohm/Loop) Test Reach Value Comments points ZPG ·...
  • Page 122 Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection Ensure that the maximum continuous current in an IED does not exceed four times its rated value, if the measurement of the operating characteristics runs under constant voltage conditions. The test procedure has to take into consideration that the shaped load encroachment characteristic is active.
  • Page 123 1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection (2 x X1set+X0set)/3 ArgLd (Ω /loop) ArgDir 25% of RFPEZx 50% of RFPEZx alt. 80% of RFPG RFPG (Load encroachment) ANSI05000369-3-en.vsdx ANSI05000369 V3 EN-US Figure 32: Distance protection characteristic with test points for phase-to-ground measurements Table is used in conjunction with figure 32.
  • Page 124 Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection Test point Reach Set value Comments 0.5 x X1 Exact –0.5 x R1 x tan(ArgNegRes-90) –0.23 x X1 0.8 x X1 Exact –0.5 x R1 x tan(ArgNegRes-90) –0.37 x X1 0.5 x X1 0.5 x R1 Only used when OperationLdCmp setting is 0 (Disabled)
  • Page 125: Measuring The Operating Limit Of Set Values

    1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection Test point Reach Value Comments 0.5 x (2 x X1 + X0 0.5 x (2 x R1 + R0 RFPG 11.4.5.1 Measuring the operating limit of set values GUID-02EE80DB-CE52-49F0-99C4-14FD84766009 v3 Procedure: Subject the IED to healthy normal load conditions for at least two seconds.
  • Page 126 Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection Measure operating characteristics during constant current conditions. Keep the measured current as close as possible to the rated value of its associated input transformer, or lower. But ensure that it is higher than 30% of the rated current.
  • Page 127 1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection phase LdAngle ArgNegRes 60° phase ArgDir 50% RLdFwd 0.5·RFltFwdPP ANSI09000735-1-en.vsd ANSI09000735 V1 EN-US Figure 34: Operating characteristic for phase selection function, forward direction phase-to-phase faults Table 28: Test points for phase-to-ground loop CG (Ohm/loop) Test point Value Comments...
  • Page 128: Measuring The Operating Limit Of Set Values

    Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection Table 29: Test points for phase-to-phase loops A-B Test point Value Comments RLdFwd 0.85·X1 R=0.491·X1+0.5 RFLdFwdPP 0.85·X1·1/tan(60°)+0.5 RFLdFwdPP 0.85·X1 -0.85·X1·tan (AngNegRes-90°) 0.5·RFLdFwdPP·tan (ArgLd) 0.5·RFLdFwdPP -0.5·RLdFwd·tan (ArgDir) 0.5·RLdFwd The table showing test points for phase-to-phase loops is used together with figure 34. 11.4.6.1 Measuring the operating limit of set values GUID-B1B7DEB6-7BC3-4A90-8D8F-E4E69B434AFA v3...
  • Page 129: High Speed Distance Protection Zones, Quadrilateral And Mho Characteristic Zmfpdis (21)

    1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection 11.4.7 High speed distance protection zones, quadrilateral and mho characteristic ZMFPDIS (21) GUID-DF1650F4-EC3E-402B-BE26-EF2EF1034237 v8 Prepare the IED for verification of settings outlined in section "Requirements" and section "Preparing for test"...
  • Page 130 Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection The figures illustrating the characteristic for the distance protection function can be used when the load encroachment affects the zone characteristic and when it is not. The solid lines designate the diagram applicable when the load encroachment is overlapping with the zone.
  • Page 131 1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection Test point Reach Set value Comments -0.8 x R x tan( ArgDir) = minimum of RFPP/2 and RLdFwd ArgDir = 20⁰ fixed 0.8 x R -0.4 x R x tan( ArgDir) = minimum of RFPP/2 and RLdFwd ArgDir = 20⁰...
  • Page 132: Measuring The Operating Limit Of Set Values

    Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection Test point Reach Value Comments 0.8 x (2 x X1 + X0 0.8 x (2 x R1 + R0 )/3 +RFPG 0.5 x (2 x X1 + X0 0.5 x (2 x R1 )/3 + RFPG 0.85 x RFPG x tan(LdAngle)
  • Page 133: Measuring The Operating Time Of Distance Protection Zones

    1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection Test points 8, 9, 10 and 11 are intended to test the directional lines of impedance protection. Since directionality is a common function for all seven measuring zones, it is only necessary to test 8, 9, 10 and 11 once, in the forward direction in order to test the accuracy of directionality (directional angles).
  • Page 134: Verifying The Settings

    Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection Document Product History revision revision 2.2.4 2.2.4 Zone BU (Backup) is added. Now there are seven zones in total. Zone 2 direction and directional blinders (ArgDir, ArgNegRes) are now settable. Setting tTauDC is added; a parameter for optional fine tuning of performance.
  • Page 135 1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection X1set ArgLd (Ω/phase) ArgDir 25% of RFPPZx/2 50% of RFPPZx/2 RFPP/2 ANSI05000368-2-en.vsdx ANSI05000368 V2 EN-US Figure 37: Distance protection characteristic with test points for phase-to-phase measurements Table 32: Test points for phase-to-phase loops A-B (Ohm/Loop) Test point Reach...
  • Page 136 Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection Test point Reach Set value Comments 0.5 x X1 Exact –0.5 x R1 x tan(ArgNegRes=30°) –0.23 x X1 0.8 x X1 Exact –0.5 x R1 x tan(ArgNegRes=30°) –0.37 x X1 0.5 x X1 0.5 x R1 0.5 x RFPPZx...
  • Page 137: Measuring The Operating Limit Of Set Values

    1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection Test point Reach Value Comments 0.5 x (2 x X1 + R0 0.5 x (2 x R1 )/3 + RFPGZx 0.85 x RFPGZx LdAngle = angle for the maximal load transfer tan(LdAngle 0.85 x RFPGZx RLdFwdset x tan(LdAngleSet)
  • Page 138: Measuring The Operating Time Of Distance Protection Zones

    Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection 11.4.8.4 Measuring the operating time of distance protection zones GUID-70AEC42A-9BC7-445A-AE21-2CEC0C3A79DC v3 Procedure: Subject the IED to healthy normal load conditions for at least two seconds. Apply the fault condition to find the operating time for the phase-to-phase fault according to test point 10 in figure and table for zone 1.
  • Page 139: Verifying The Signal And Settings

    1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection Document Product History revision revision 2.2.4 2.2.4 Power swing unblocking feature is made available to have phase selection and thereby, releasing distance measuring loops for faults during power swing. Added new outputs FLTL1, FLTL2, FLTL3, FLT1PH, FLT2PH, FLT3PH, STCND, and RELCND.
  • Page 140 Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection R1LIn X1OutFw X1InFw R1FInRv R1FInFw ArgLd ArgLd RLdInRv RLdInFw RLdOutFw RLdOutRv X1InRv X1OutRv IEC18000101-1-en.vsdx IEC18000101 V1 EN-US Figure 39: Proposed test points to measure the outer and inner boundaries of operating characteristics Where, ΔFw =...
  • Page 141 1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection Test point Comment 0.8 * (R1FInFw + ∆Fw) -0.8 * (R1FInFw + ∆Fw) * tan (ArgLd) R1FInFw + ∆Fw -0.8 * X1OutRv -X1OutRv -(0.8 * R1LIn + R1FInRv + -0.8 * X1OutRv ∆Rv) -0.8 * (R1FInRv + ∆Rv)
  • Page 142 Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection Testing the power swing detection logic ZMBURPSB (68) GUID-E19CFFAA-3853-4895-A149-32F6E78B2C69 v1 Preconditions The following output signals shall be configured to binary outputs: ZOUT, measured impedance within outer impedance boundary and ZIN, measured impedance within inner impedance boundary and PICKUP, power swing detection.
  • Page 143 1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection Inject the faulty phase voltage in accordance with the test point P1. At this condition, the outputs ZIN and ZOUT get deactivated and START signal will be maintained for a set duration of tH.
  • Page 144 Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection inject voltage in one of the phases accordingly by keeping constant current in all three phases. With this condition, the output signal START will be activated. Create a condition such that residual current is measured (that is, earth fault occurs in the power system) and its value should be above the value seen during unbalanced loading condition.
  • Page 145: Completing The Test

    1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection Testing the power swing unblocking logic GUID-1B635221-493D-4DB3-938C-6C61461E3B16 v1 Preconditions The following output signals shall be configured to binary outputs: FLTL1, FLTL2, FLTL3, FLT1PH, FLT2PH, FLT3PH and START. Ensure that the setting OpModePSU is set to On. Inject rated currents and voltages in all three phases.
  • Page 146: Function Revision History

    Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection 11.4.10.1 Function revision history GUID-DFB27CD5-5AC0-4D8B-B306-F74173F71E4E v1 Document Product History revision revision 2.2.1 2.2.1 2.2.2 2.2.3 2.2.3 2.2.4 2.2.4 2.2.4 2.2.5 Deleted DO Rx 11.4.10.2 Testing the carrier send and trip signals M14946-8 v3 Procedure Set the operation of all distance zones, which are supposed to be blocked by the operation of...
  • Page 147: Checking The Underreaching Zone

    1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection BLKZMUR must appear together with the fault and must remain active until the fault has been switched off plus the time delay, as set on the tBlkTr timer. Initiate a phase-to-phase fault within the operating area of both power-swing zones.
  • Page 148 Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection voltage and current amplitude and the angle between the injected voltage and current. The parameter setting shall be according to the real application chosen values. Procedure Feed the IED with current and voltage corresponding to a normal operation point Injected voltage V equal to base voltage (VBase) and the injected current I equal to half the base current (IBase).
  • Page 149 1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection Zone 1 Zone 2 X’ Pole slip impedance movement Zone 2 TripAngle Zone 1 WarnAngle ANSI07000099_2_en.vsd ANSI07000099 V2 EN-US Figure 41: Setting of the pole slip protection PSPPPAM (78) Transformer protection RET670 Commissioning manual ©...
  • Page 150: Completing The Test

    Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection Imin > 0.10 IBase Vmax < 0.92 VBase PICKUP 0.2 £ f(Ucos) £ 8Hz d ³ PickupAngle ZONE1 Z cross line ZA - ZC ZONE2 Z cross line ZC - ZB Counter b a ³...
  • Page 151: Verifying The Settings

    1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection windings split into two groups per phase, when each group is equipped with current transformers. The protection function performs a simple summation of the currents of the two channels I3P1 and I3P2. 11.4.12.1 Verifying the settings GUID-708C4033-3111-481F-9868-FF207C18C9F9 v2...
  • Page 152 Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection Reference is made to the numerical values of the example, explained in the “Setting guidelines” of the Application Manual. A test current equal to 2.5 time the base current of the generator is chosen; this choice is related to the selected test voltage that is applied while testing the point SE and RE.
  • Page 153 1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection and the voltages that are related to them: 0 078 0 565 20918 0 570 0 20918 11931 × × × × t FwdZ FwdZ FwdR FwdX (Equation 16) EQUATION14052 V1 EN-US 0 003 0 282...
  • Page 154 Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection • Symmetric three-phase current, where the current is the summation of two currents that have the same magnitude, but different frequencies. 20918 10459 (Equation 20) GUID-F02E8D18-FF87-45BE-8142-E8FA19F6966B V1 EN-US The first current I has frequency 50 Hz, magnitude 10459 A (that is, 1.162 A secondary) and phase angle 0º.
  • Page 155: Test Of Point Re (R Fwdr , X Fwdx )

    1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection 11.4.12.2 Test of point RE (R FwdR FwdX GUID-911D370F-8767-4D6C-9621-8663DD26006C v1 The trajectory of the impedance does not enter the lens characteristic. GUID-5C5E9BEB-AA60-474E-ACEC-B972ACFE6FA2 v1 Preliminary steady state test at 50 Hz GUID-8F95CCCC-3282-48E8-9F5E-3F3E77CCCAAE v1 •...
  • Page 156 Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection VT s 1 1 11931 95 1 × × × × t FwdZ 13 8 VT p (Equation 25) EQUATION14057 V1 EN-US     59 33 ForwardX ∠...
  • Page 157 1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection     ForwardX 59 33 ∠  =  = arctan arctan 82. . 14°       ForwardR 8 19 (Equation 32) EQUATION14058 V1 EN-US frequency of V = 50 Hz...
  • Page 158: Test Of The Boundary Between Zone 1 And Zone 2, Which Is Defined By The Parameter Reachz1

    Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection VT s 0 9 11931 77 81 × × × × t FwdZ 13 8 VT p (Equation 37) EQUATION14063 V1 EN-US     59 33 ForwardX ∠...
  • Page 159 1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection frequency of I = 50 Hz 10459 1 162 × × 9000 (Equation 44) EQUATION14062 V1 EN-US ∠I = 0º frequency of I = 50 Hz • Check that the service values (VOLTAGE, CURRENT, R(%), X(%)) are according to the injected quantities and that ROTORANG is close to 3.14 rad.
  • Page 160 Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection 10459 1 162 × × 9000 (Equation 49) EQUATION14059 V1 EN-US ∠I = 0º frequency of I = 50 Hz 10459 1 162 × × 9000 (Equation 50) EQUATION14062 V1 EN-US ∠I = 180º...
  • Page 161 1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection • VOLTAGE = 1.29 kV • CURRENT = 20918 A • R = 0.89% • X=6.42% • ROTORANG = -3.04 rad Note that these values identify a point inside the lens characteristic in zone 1, that is close to the boundary between zone 1 and zone 2.
  • Page 162: Test Of The Point Se (R Rvsr , X Rvsx )

    Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection Expected result: start of the protection function and trip in zone 1 when trip conditions are fulfilled. 11.4.12.4 Test of the point SE (R RvsR RvsX GUID-335F54E6-52DE-4BF1-A34B-0C2DB8059CC1 v1 The trajectory of the impedance traverses the lens characteristic in zone 1 GUID-2DD20D2E-6188-4631-A584-5E68B212E011 v1 Preliminary steady state test at 50 Hz...
  • Page 163 1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection Steady voltage and current are applied in order to get a steady high impedance, that is a point in the plane R-X which is far away from the lens characteristic. Define the following three-phase symmetrical quantities (the phase angle is related to phase L1): VT s 0 9 5899...
  • Page 164 Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection VT s 1 1 5899 47 02 × × × × t RvsZ 13 8 VT p (Equation 71) EQUATION14069 V1 EN-US æ ö æ ö ReverseX 29.60 Ð...
  • Page 165 1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection = 0 A • State 2: main test step. Define the following three-phase symmetrical quantities (the phase angle is related to phase L1): VT s 1 1 5899 47 02 ×...
  • Page 166: Automatic Switch Onto Fault Logic Zcvpsof

    Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection COMMON TRIP COMMAND (trip) TRIPZ1 (tripZone1) TRIPZ2 (tripZone2) START (start) GENMODE (generatorMode) MOTMODE (motorMode) time in seconds → IEC10000142-1-en.vsd IEC10000142 V1 EN-US Figure 44: Boolean output signals for the injected current with two components: a 50 Hz current component and a 49.5 Hz current component 11.4.13 Automatic switch onto fault logic ZCVPSOF...
  • Page 167: Activating Zcvpsof Externally

    1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection Document Product History revision revision 2.2.4 2.2.4 Updated technical data for setting parameters tDuration, tDLD and tOperate. 2.2.5 11.4.13.2 Activating ZCVPSOF externally M13850-14 v8 Set AutoInitMode to DLD disabled and Mode to Impedance. Activate the switch onto fault BC input.
  • Page 168: Function Revision History

    Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection 11.4.14.1 Function revision history GUID-E2FF644E-DD3A-4549-B15A-2395B9709DA6 v2 Document Product History revision revision 2.2.1 2.2.1 2.2.2 2.2.3 2.2.3 2.2.4 2.2.4 Setting ranges and setting descriptions have been updated in order to make the function more user friendly.
  • Page 169: Completing The Test

    1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection OperMode Fault type/Faulted phase current to the IED A_BG/IA A_BG/IB B_CG/IB B_CG/IC C_CG/IA C_AG/IC 231a No Trip Trip Trip No Trip No Trip Trip 312a Trip No Trip No Trip Trip No Trip...
  • Page 170: Completing The Test

    Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection two phase-to-ground faults with one phase current are tested. The result shall be according to Table 37. It should be checked that the fault will give phase-to-phase voltage, phase-to-ground voltage, zero-sequence voltage and phase current so that the conditions set for the logic are fulfilled.
  • Page 171 1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection Z1Fwd LineAngle Z1Rev IEC11000312-2-en.vsd IEC11000312 V2 EN-US Figure 45: Proposed four test points for phase-to-phase fault Where, Z1Fwd is the forward positive sequence impedance setting for zone 1 Z1Rev is the reverse positive sequence impedance setting for zone 1 LineAngle...
  • Page 172 Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection ZxFwd LineAngle ZxRev IEC11000313-1-en.vsd IEC11000313 V2 EN-US Figure 46: Proposed four test points for phase-to-earth fault Where, ZxFwd is the forward positive sequence impedance setting for zone x (where, x is 2- 3 depending on the zone selected) ZxRev is the reverse positive sequence impedance setting for zone x (where x is 2- 3 depending on the...
  • Page 173: Completing The Test

    1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection current of an IED does not exceed four times Its rated value, if the measurement of the operating characteristics runs under constant voltage conditions. Measuring the operate limit of set values of load encroachment function The load encroachment does not have any special output to be verified.
  • Page 174: Measuring The Trip Limit Of Set Values

    Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection Ensure that the maximum continuous current, supplied from the current source used for the test of the IED, does not exceed four times the rated current value of the IED. 11.5.1.1 Measuring the trip limit of set values M11754-11 v7...
  • Page 175: Verifying The Settings

    1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection Document Product History revision revision 2.2.4 2.2.4 2.2.5 • The harmonic restraint function changed to freeze the definite and IDMT timers. • The maximum value of the settings IMin1, IMin2, IMin3 and IMin4 has been decreased to 1000.0 % of IBase.
  • Page 176: Completing The Test

    Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection If 2 out of 3 or 3 out of 3 currents are chosen for operation: Check that the function will not trip with current in one phase only. Repeat the above described tests for the higher set stages.
  • Page 177: Function Revision History

    1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection Values of the logical signals for D2PTOC are available on the local HMI under Main menu/Test/ Function status /Current protection/ResidualOverCurr4Step(51N_67N,4(IN>)) / EF4PTOC(51N_67N;4(IN>)):x, where x = instance number. The Signal Monitoring in PCM600 shows the same signals that are available on the local HMI. 11.5.4.1 Function revision history GUID-0F9199B0-3F86-45E0-AFC2-747052A20AE1 v2...
  • Page 178: Four Step Non-Directional Ground Fault Protection

    Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection 11.5.4.3 Four step non-directional ground fault protection SEMOD53296-202 v5 Do as described in Section 11.5.4.2, but without applying any polarizing voltage. 11.5.4.4 Completing the test SEMOD53296-122 v5 Continue to test another function or end the test by changing the TESTMODE setting to Disabled. Restore connections and settings to the original values, if changed for testing purposes.
  • Page 179: Completing The Test

    1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection Increase the injected current and note the value at which the studied step of the function trip. Decrease the current slowly and note the reset value. Block lower set steps when testing higher set steps according to the instructions that follow. Connect a trip output contact to a timer.
  • Page 180: Measuring The Trip And Time Limit For Set Values

    Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection 11.5.6.1 Measuring the trip and time limit for set values SEMOD175060-12 v2 Operation mode 3I · cosφ SEMOD175060-34 v9 Procedure Set the polarizing voltage to 1.2 · VNRelPU and set the phase angle between voltage and current to the set characteristic angle (RCADir).
  • Page 181 1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection  0 RCADir Trip area    3   ROADir ANSI06000650-3-en.vsd ANSI06000650 V3 EN-US Figure 48: Characteristic with ROADir restriction Transformer protection RET670 Commissioning manual © 2017 - 2021 Hitachi Power Grids. All rights reserved...
  • Page 182 Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection RCADir = 0º Trip area Instrument transformer  angle error RCAcomp Characteristic after angle compensation (to prot) (prim) ANSI06000651-2-en.vsd ANSI06000651 V2 EN-US Figure 49: Explanation of RCAcomp Operation mode 3I ·...
  • Page 183 1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection TDSN SRef 3 ⋅ ⋅ ⋅ cos ϕ Tinv test test (Equation 82) ANSIEQUATION2403 V2 EN-US Compare the result with the expected value. The expected value depends on whether definite or inverse time was selected. Continue to test another function or complete the test by setting the test mode to Disabled.
  • Page 184: Completing The Test

    Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection Non-directional ground fault current protection SEMOD175060-117 v10 Procedure Measure that the trip current is equal to the INNonDirPU setting. The function activates the PICKUP and PUDIRIN output. Measure the trip time of the timer by injecting a current of 200% of the trip value. Compare the result with the expected value.
  • Page 185: Completing The Test

    1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection Check the time until the actual temperature TEMP has reached the AlarmTemp level during injection. Monitor the signal ALARM until it appears on the corresponding binary output or on the local HMI. Measure the LFPTTR/LCPTTR (26)protection trip time.
  • Page 186: Completing The Test

    Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection Switch on the injection current and check that ALARM1 and ALARM2 contacts trip at the set percentage level and that the trip time for tripping is in accordance with the set Time Constant 1 (Tau1).
  • Page 187: Checking The Phase Current Trip Value, Pickup_Ph

    1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection 11.5.9.2 Checking the phase current trip value, Pickup_PH M12104-23 v14 The check of the Pickup_PH current level is best made in FunctionMode = Current and BuTripMode = 1 out of 3 or 2 out of 4.
  • Page 188: Verifying The Back-Up Trip Mode

    Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection Set RetripMode = Off. Apply the fault condition, including initiation of CCRBRF (50BF), well above the set current value. Verify that no re-trip, but back-up trip is achieved after set time. Disconnect AC and BFI_3P input signals.
  • Page 189: Verifying Instantaneous Back-Up Trip At Cb Faulty Condition

    1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection Checking the case BuTripMode = 2 out of 4 M12104-179 v7 The ground-fault current setting Pickup_N may be equal to or below phase-current setting Pickup_PH. Set BuTripMode = 2 out of 4. Apply the fault condition, including initiation of CCRBRF (50BF), with one-phase current above set Pickup_PH and residual (ground fault) above set Pickup_N.
  • Page 190: Verifying The Casefunctionmode = Current Or Cb Pos

    Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection Disconnect the trip signal(s). Keep the CB closed signal(s). Apply input signal(s), for initiation of CCRBRF (50BF). Arrange disconnection of CB closed signal(s) well before set back-up trip time t2. Verify that back-up trip is not achieved.
  • Page 191: Verifying That Backup Signal Is Released When Stalarm Is Reset

    1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection 11.5.9.12 Verifying that backup signal is released when STALARM is reset GUID-49CA34B6-5AE9-4E45-9F4E-33DA5F626209 v1 Set StartMode = FollowStart. Set FunctionMode = Current. Use default value for tStartTimeout = 1.0 s. Use default value for time delay backup trip t2 = 0.150 s.
  • Page 192: Function Revision History

    Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection 11.5.10.1 Function revision history GUID-D32C2C38-452F-45B0-85C1-6C9542089357 v1 Document Product History revision revision 2.2.1 2.2.1 2.2.2 2.2.3 2.2.3 2.2.4 2.2.4 2.2.4 2.2.5 11.5.10.2 Measuring the trip limit of set values M14922-6 v8 Check that the input logical signals BLOCK and ENABLE and the output logical signal TRIP are all logical zero.
  • Page 193: Function Revision History

    1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection Logical signals for BRPTOC protection are available on the local HMI under Main menu /Settings /IED Settings /Current protection /OvercurrBinRel (50, 3I>) /BRPTOC (50, 3I>):x . The Signal Monitoring in PCM600 shows the same signals that are available on the local HMI. 11.5.11.1 Function revision history GUID-23898A65-D896-479E-9122-E8D9D6CC4FEB v1...
  • Page 194: Completing The Test

    Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection 11.5.11.3 Completing the test M14922-50 v4 Continue to test another function or end the test by changing the TESTMODE setting to Disabled. Restore connections and settings to the original values, if changed for testing purposes. 11.5.12 Pole discrepancy protection CCPDSC (52PD) SEMOD55625-59 v6...
  • Page 195: Completing The Test

    1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection 11.5.12.2 Completing the test SEMOD55625-106 v4 Continue to test another function or end the test by changing the TESTMODE setting to Disabled. Restore connections and settings to the original values, if changed for testing purposes. 11.5.13 Directional underpower protection GUPPDUP (37) SEMOD175027-3 v5...
  • Page 196: Completing The Test

    Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection Set value: Mode Formula used for complex power calculation × (Equation 89) EQUATION2060-ANSI V1 EN-US = × × (Equation 90) EQUATION2061-ANSI V1 EN-US = × × (Equation 91) EQUATION2062-ANSI V1 EN-US = ×...
  • Page 197: Completing The Test

    1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection Connect the test set for injection of voltage and current corresponding to the mode to be used in the application. If a three phase test set is available this could be used for all the modes. If a single phase current/voltage test set is available the test set should be connected to a selected input for one phase current and voltage.
  • Page 198: Completing The Test

    Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection Check that the input logical signal BLOCK to the BRCPTOC (46) function block is logical zero and note on the local HMI that the output signal TRIP from the BRCPTOC (46) function block is equal to the logical 0.
  • Page 199 1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection Inject SCB rated current (that is, 0.587A at 50Hz for this SCB) in at least one phase (preferably perform this test with three phase injection). After couple of seconds stop injection of all currents (that is, set all currents back to 0A). Check that function binary output signal RECNINH is set to logical 1 and that only resets after the set time under parameter tReconnInhibit (for example 300s for this SCB) has expired.
  • Page 200 Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection Reactive power overload feature GUID-6DA88E90-366A-494F-B3A4-F8B5A3FD6396 v3 Note that during testing the reactive power overload feature the harmonic voltage overload feature or overcurrent feature may also give pickup and trip signals depending on their actual settings.
  • Page 201: Completing The Test

    1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection Note that operation of this feature is based on internally calculated voltage peak RMS value. That means that this feature is also able to trip for current signals with varying frequency.
  • Page 202: Negative-Sequence Time Overcurrent Protection For Machines Ns2Ptoc (46I2)

    Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection 11.5.17 Negative-sequence time overcurrent protection for machines NS2PTOC (46I2) GUID-48A6DA1D-5CF5-4C1B-B1A4-3F2C73851FD4 v2 GUID-F7AA2194-4D1C-4475-8853-C7D064912614 v4 When inverse time overcurrent characteristic is selected, the trip time of the stage will be the sum of the inverse time delay and the set definite time delay.
  • Page 203: Completing The Test

    1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection This means that if current jumps from 0 to 2 times pickup and negative sequence capability value of generator K1 is set to 10 sec and current pickup level I2-1> is set to 10% of rated generator current, then TRST1 and TRIP signals operates at time equal to 250 s ±...
  • Page 204: Verifying The Settings

    Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection 11.5.18.2 Verifying the settings GUID-3A2B7FF5-330E-4A0D-AB74-EBAE6258C176 v1 Verifying settings by secondary injection GUID-39632D30-A8D8-417D-985C-8F886106783E v4 Connect the test set for three-phase current injection and three-phase voltage injection to the appropriate IED terminals. Go to Main menu /Settings /IED Settings /Current protection /VoltageRestOverCurr ( 51V,2(I>/ V<))/VRPVOC (51V,2(I>/V<)):1 /General and make sure that the function is enabled, that is, Operation is set to Enabled.
  • Page 205 1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection If VDepMode = Slope, the minimum measured phase-to-phase voltage is lower than 0,25*VBase; if VDepMode = Step, the minimum measured phase-to-phase voltage is lower than VHighLimit/ 100*VBase: • VA: Ampl = 10 / √3;...
  • Page 206: Completing The Test

    Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection This means that if the measured phase current jumps from 0 to 2 times the set trip level and time multiplier k is set to 1.0 s (default value), then the TROC and TRIP signals will trip after a time delay equal to 13.5 s ±...
  • Page 207: Verifying The Signals And Settings

    1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection 11.5.19.1 Verifying the signals and settings GUID-36A0055E-CA32-4D85-A580-59032B3AC4AE v1 All of the following test will assume the following CT and VT ratios, and IBase and UBase settings: • CT ratio 1000A/1A •...
  • Page 208 Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection The default value for IMinForward =2.5% is used for this test. Inject the following analogue quantities given in secondary amperes and volts and wait for three seconds to obtain the trip output (the default delay for tTrip=2s): Magnitude=40mA;...
  • Page 209 1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection Magnitude=40mA; Angle=0 degrees Magnitude=75V; Angle=0 degrees 1) Inject set value for IMinReverse+1.5% of CT secondary rated current, (that is0.025A+0.015A when IMinReverse =2.5% and CT rated secondary is 1A). The following signals that shall be given from the APPTEF function: •...
  • Page 210: Completing The Test

    Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection Test of function operation for intermittent EF GUID-ADDA3A73-9884-41B1-96D0-EE9653004E96 v1 Change the following settings from the default values: • OperationMode = Start and Trip in order to obtain the trip signal •...
  • Page 211 1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection Check that the IED settings are appropriate, especially the PICKUP value, the definite time delay and the 1 out of 3 operation mode. Supply the IED with three-phase voltages at their rated values. Slowly decrease the voltage in one of the phases, until the PICKUP signal appears.
  • Page 212: Completing The Test

    Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection 11.6.1.2 Completing the test M13796-25 v5 Continue to test another function or end the test by changing the TESTMODE setting to Disabled. Restore connections and settings to the original values, if changed for testing purposes. 11.6.2 Two step overvoltage protection OV2PTOV (59) M13806-2 v6...
  • Page 213: Completing The Test

    1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection 11.6.2.3 Completing the test M13806-43 v6 Continue to test another function or end the test by changing the TESTMODE setting to Disabled. Restore connections and settings to the original values, if changed for testing purposes. 11.6.3 Two step residual overvoltage protection ROV2PTOV (59N) SEMOD54358-3 v7...
  • Page 214: Completing The Test

    Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection where: t(s) Trip time in seconds Settable time multiplier of the function for step 1 Measured voltage Vpickup> Set pickup voltage for step 1 For example, if the measured voltage jumps from 0 to 1.2 times the set pickup voltage level and time multiplier TD1 is set to 0.05 s (default value), then the TRST1 and TRIP signals trip at a time equal to 0.250 s ±...
  • Page 215: Completing The Test

    1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection 11.6.4.2 Completing the test M6583-85 v4 Continue to test another function or end the test by changing the TESTMODE setting to Disabled. Restore connections and settings to the original values, if changed for testing purposes. 11.6.5 Voltage differential protection VDCPTOV (60) SEMOD175258-3 v2...
  • Page 216 Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection ANSI07000106-1-en.vsd ANSI07000106 V2 EN-US Figure 51: Connection of the test set to the IED for test of V1 block level where: is three-phase voltage group1 (V1) is three-phase voltage group2 (V2) Decrease slowly the voltage in phase VA of the test set until the PICKUP signal resets.
  • Page 217: Check Of Voltage Differential Trip And Alarm Levels

    1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection ANSI07000107-1-en.vsd ANSI07000107 V2 EN-US Figure 52: Connection of the test set to the IED for test of V2 block level where: is three-phase voltage group1 (V1) is three-phase voltage group2 (V2) Apply voltage higher than the highest set value of VDTrip, V1Low and V2Low to the V1 three-phase inputs and to one phase of the V2 inputs according to figure 52.
  • Page 218: Check Of Trip And Trip Reset Timers

    Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection ANSI07000108-1-en.vsd ANSI07000108 V2 EN-US Figure 53: Connection of the test set to the IED for test of alarm levels, trip levels and trip timer where: is three-phase voltage group1 (V1) is three-phase voltage group2 (V2) Apply 1.2 ·...
  • Page 219: Final Adjustment Of Compensation For Vt Ratio Differences

    1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection Check the measured time by comparing it to the set trip time tTrip. Increase the voltage until PICKUP signal resets. Measure the time from reset of PICKUP signal to reset of TRIP signal.
  • Page 220: Completing The Test

    Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection Simultaneously disconnect all the three-phase voltages from the IED. No TRIP signal should appear. Reset the BLKU binary input. Inject the measured voltages at rated values for at least set tRestore time. Activate the BLOCK binary input.
  • Page 221 1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection • VoltageInput = negSeq • I > = 125% IBase • VDepFact1 = (1-117)/I> = 0.064 Values of the logical signals and the service values for SCCFPVOC (51 V) are available on the local HMI under: Main menu/Tests/Function status/Unbalance protection/ CapBankCascadingFail(51V,2(I>/U<))/SCCFPVOC (51V, 2(I>/U<)):x, where x = instance number.
  • Page 222: Completing The Test

    Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection • VoltageInput = 3×ZeroSeq • I > = 125% IBase • VDepFact1 = (1-117)/I> = 0.064 Values of the logical signals and service values for SCCFPVOC (51 V) are available on the local HMI under: Main menu/Tests/Function status/Unbalance protection/ CapBankCascadingFail(51V,2(I>/U<))/SCCFPVOC (51V, 2(I>/U<)):x, where x = instance number.
  • Page 223 1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection • 1 Unbalance Curr - Select this option using the parameter setting SCBConf, if one unbalance current is connected to the function. • 3 Unbalance Curr - Select this option using the parameter setting SCBConf, if three unbalance currents are connected to the function.
  • Page 224 Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection Step No. Changes after step 5 Expected output WARNING TEST Retain constant currents* of I = 1∠0° A, WARNING and WRNˍA signals should become HIGH after the set time delay = 1∠240°...
  • Page 225 1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection • IUnbalAlm> = 20% IB2 • IUnbalWrn> = 10% IB2 • IMin = 10% IB1 The logical signals and service values for SCUCPTOC function are available on the local HMI under: Main menu/Tests/Function status/Unbalance protection /CapBankCurrentUnbalance(60N, Iub>)/SCUCPTOC(60N, Iub>):x/outputs , where x = instance number.
  • Page 226: Completing The Test

    Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection Step No. Changes after step 3 Expected output START and TRIP TEST Change I = 0.55∠0° A, Change • START, PU_A, PU_B, and PU_C signals should UNBA become HIGH = 0.55∠0°...
  • Page 227 1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection • Grounded - Select this option by using the parameter setting SCBGndType, if the capacitor bank is grounded. • Ungrounded - Select this option by using the parameter setting SCBGndType, if the capacitor bank is ungrounded.
  • Page 228 Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection Step no. Changes after step 2 Expected output 4-e** Activate binary input TRIGCOMP for 1 s • The output COMPEXED should become HIGH for 100 ms and LASTCOMP output should display the date and time of compensation...
  • Page 229 1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection UDIFLx ´ PUDIFLx UBase (Equation 112) IECEQUATION19376 V1 EN-US Verifying the function in Ungrounded mode GUID-069FCF45-61B1-486C-8C0E-D1CC66B3BB3F v1 The following procedures are performed to test the function in Ungrounded mode. If there is a VT present in the neutral, then the setting NeutVoltMeas is set to available.
  • Page 230 Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection Step no. Changes after step 2 Expected output 4-f * * Activate binary input TRIGCOMP for 1 s • The output COMPEXED should become HIGH for 100 ms and LASTCOMP output should display the date and time of compensation •...
  • Page 231 1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection If the neutral VT is not available, then the setting NeutVoltMeas is set to Not available. Set the following parameters: • Operation = Enable • tDefWrn =5 s; tDefAlm =5 s; tDefTrip =5 s •...
  • Page 232: Completing The Test

    Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection Step no. Changes after step 2 Expected output TRIP Signal Test Repeat Sub-step 4–a Sub-step 4–b Inject U = 31.00 V in secondary at rated • BFI_3P and PU_A signals should TapL1 become HIGH after a time delay given by frequency...
  • Page 233 1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection • UNUnbalAlm> = 2.5% UBase • UNUnbalWrn> = 1.0% UBase • UMin> = 75% UBase Activate the RESETCOMP input to ensure that the stored values of the compensation factors are reset to zero.
  • Page 234: Completing The Test

    Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection Step No. Changes after step 4 Expected Output WARNING TEST Retain the constant voltages* of WARNING signal should become HIGH after the = 63.5∠0° V, U set time delay. 63.5∠240°...
  • Page 235: Completing The Test

    1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection Note the frequency value at which the TRIP signal appears and compare it with the set value StartFrequency. Increase the frequency until its rated value is reached. Check that the PICKUP signal resets. Supply the IED with three-phase voltages at their rated values and frequency 20 mHz over the set value StartFrequency.
  • Page 236: Completing The Test

    Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection Set the frequency to 20 mHz under the trip value. Increase the frequency with a 40 mHz step, applying it for a period that is 10% longer than tDelay. Measure the time delay for the TRIP signal, and compare it with the set value.
  • Page 237: Completing The Test

    1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection The test above can be repeated to check a positive setting of PickupFreqGrad. The tests above can be repeated to check the time to reset. The tests above can be repeated to test the RESTORE signal, when the frequency recovers from a low value.
  • Page 238: Built-In Overcurrent Feature (Non-Directional)

    Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection Due to the versatile possibilities of CVGAPC itself, but also the possibilities of logic combinations in the application configuration of outputs from more than one CVGAPC function block, it is hardly possible to define a fully covering general commissioning test.
  • Page 239: Overcurrent Feature With Directionality

    1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection Connect the test set for injection of three-phase currents and three-phase voltages to the appropriate current and voltage terminals of the IED. Inject current(s) and voltage(s) in a way that relevant measured (according to setting parameter CurrentInput and VoltageInput) currents and voltages are created from the test set.
  • Page 240: Completing The Test

    Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection 11.9.2.6 Completing the test SEMOD56488-99 v2 Continue to test another function or end the test by changing the TESTMODE setting to Disabled. Restore connections and settings to the original values, if changed for testing purposes. 11.10 Secondary system supervision SEMOD53556-1 v1...
  • Page 241: Measuring The Trip Value For The Negative Sequence Function

    1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection • The signal BLKV should appear with almost no time delay. • The signals BLKZ and 3PH should not appear on the IED. • Only the distance protection function can trip. •...
  • Page 242: Measuring The Trip Value For The Zero-Sequence Function

    Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection Repeat steps and 2. Then slowly increase the measured current in one phase until the BLKV signal disappears. Record the measured current and calculate the corresponding negative-sequence current according to the equation (observe that the currents in the equation are phasors): ×...
  • Page 243: Measuring The Trip Value For The Dead Line Detection Function

    1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection are the measured phase currents I and I ANSIEQUATION00020 V1 EN-US Compare the result with the set value of the zero-sequence trip current. Consider that the set value 3I0<...
  • Page 244: Completing The Test

    Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection 11.10.2.6 Completing the test M1405-130 v5 Continue to test another function or end the test by changing the TESTMODE setting to Disabled. Restore connections and settings to the original values, if changed for testing purposes. 11.10.3 Fuse failure supervision GUID-DCCD4C4A-8335-43BA-A2B2-9994380985B0 v2...
  • Page 245: Completing The Test

    1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection Delta supervision function has 6 different modes of operation. Proceed as follows to test the function in a particular mode. Set the following parameters: • Operation = Enabled •...
  • Page 246: Completing The Test

    Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection Delta supervision function has four different modes of operation. Proceed as follows to test the function in a particular mode. Set the following parameters: • Operation = ON •...
  • Page 247: Completing The Test

    1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection • Operation = ON • MinStVal = 10 • DelSt> = 100 • DeltaT = 7 • tHold = 100 Set a constant voltage input of UL1 = 63.5 V at 0° and UL2 = 63.5 V at 180° secondary and a current signal at IL1 = 1A at 0°...
  • Page 248 Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection Figure shows the general test connection for a breaker-and-a-half diameter with one-phase voltage connected to the line side. Test VMeasure equipment V-Bus Ph/N V-Bus Ph/Ph Input Phase A,B,C AB,BC,CA V-Line VMeasure...
  • Page 249: Testing The Synchronizing Function

    1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection 11.11.1.1 Testing the synchronizing function M2377-21 v8 The voltage inputs used are: V3PL1 VA, VB or VC line 1 voltage inputs on the IED V3PBB1 Bus1 voltage input on the IED Testing the frequency difference M2377-116 v11 The frequency difference test should verify that operation is achieved when the frequency difference...
  • Page 250 Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection Apply voltages V-Line (for example) = 80% GblBaseSelLine and V-Bus = 80% GblBaseSelBusGblBaseSelBus with the same phase-angle and frequency. Check that the AUTOSYOK and MANSYOK outputs are activated. The test can be repeated with different voltage values to verify that the function trips within the set VDiffSC.
  • Page 251: Testing The Energizing Check

    1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection Apply voltages V-Line equal to 100% GblBaseSelLine and V-Bus equal to 100% GblBaseSelBus, with a frequency difference equal to 0 mHz and a phase difference lower than the set value. Check that the AUTOSYOK and MANSYOK outputs are activated.
  • Page 252: Testing The Voltage Selection

    Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection Verify the settings AutoEnerg or ManEnerg to be DBLL. Apply a single-phase voltage of 30% GblBaseSelBus to the V-Bus and a single-phase voltage of 100% GblBaseSelLine to the V-Line. Check that the AUTOENOK and MANENOK outputs are activated after set tAutoEnerg respectively tManEnerg.
  • Page 253 1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection Testing the voltage selection for double breaker M2377-691 v6 This test should verify that correct voltage is selected for the measurement in the SESRSYN function used for a diameter in a Breaker-and-a-half arrangement. Apply a single-phase voltage of 100% GblBaseSelLine to the V-Line and a single-phase voltage of 100% GblBaseSelBus to the V-Bus.
  • Page 254: Completing The Test

    Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection Bus 1 Bus 2 CB1 52 CB3 352 (SESRSYN 1) (SESRSYN 3) CB2 252 (SESRSYN 2) LN1 989 LN2 989 Line 1 Line 2 ANSI11000274.en.v1 ANSI11000274 V1 EN-US Figure 57: Objects used in the voltage selection logic 11.11.1.5...
  • Page 255 1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection Figure illustrates a suggested testing arrangement, where the circuit-breaker (CB) is simulated by an external bi-stable relay (BR), for example a relay type RXMVB2 or RXMD or Breaker Simulator of Hitachi Power grids.
  • Page 256: Preparation Of The Verification

    Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection To test ANSI04000202-1-en.vsd ANSI04000202 V2 EN-US Figure 58: Simulating the CB operation by a bi-stable relay/breaker simulator and manual switches 11.11.2.1 Preparation of the verification M12400-40 v8 Check the function settings on the local HMI under Main menu/Settings /IED Settings/Control / Autorecloser79,5(0–>1)/SMBRREC:x(79,5(0–>)):x If any timer settings are reduced to speed up or facilitate the testing, they shall be set to normal after testing.
  • Page 257: Switching The Auto Recloser To On And Off Enabled And Disabled

    1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection If SESRSYN (25) as an internal function or external device is not operated by the injection, input signal SYNC must be connected as a permanent high signal or controlled by a switch. Read and make notes of the reclosing operation counters on the local HMI under Main menu / Test/Function status /Control/AutoRecloser79,5(0–>1) /SMBRREC(79,5(0–>1)):x Possibly reset the counters to Zero.
  • Page 258: Checking The Auto Reclosing Conditions

    Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection If just single-pole reclosing is selected, ARMode = 1ph, a check can be run to make sure that a three-pole trip does not result in any auto reclosing. Other similar cases can be checked as required.
  • Page 259: Completing The Test

    1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection The output READY shall be low, and PREP3P shall be high. Apply a single phase fault and thereby a RI signal. Check that a definitive three phase trip and no auto reclosing takes place. Testing auto reclosing in a multi-breaker arrangement M12400-185 v7 The usual arrangement is to have an auto recloser per circuit-breaker.
  • Page 260: Function Revision History

    Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection 11.11.4 Function revision history GUID-CC62CA75-201A-4C5D-9FD4-89DBFD56F97C v2 11.11.5 Voltage control TR1ATCC, TR8ATCC, TCMYLTC, TCLYLTC SEMOD175185-3 v13 Prepare the IED for verification of settings as outlined in section "Requirements" and section "Preparing for test"...
  • Page 261: Secondary Test

    1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection • Tap change timeout duration - effectively the maximum transformer tap change time, tTCTimeout, available on the local HMI under Main menu /Settings /IED Settings /Control / TransformerTapControl(84,⇅) /TCMYLTC(84,⇅):x/TCLYLTC(84,⇅):x /tTCTimeout •...
  • Page 262: Check The Activation Of The Voltage Control Operation

    Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection If V < V1 or V > V2, a command timer will pickup, which is constant time or inverse time defined by setting t1 and t1Use. The command timer will trip while the measured voltage stays outside the inner deadband (defined by setting VDeadbandInner).
  • Page 263: Check The Undervoltage Block Function

    1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection Detection of this command will involve locating the allocated binary output for a low pulse command in the Signal Matrix in PCM600 and monitoring a positive from this output. Return the applied voltage to VSet.
  • Page 264: Single Transformer

    Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection 11.11.5.7 Single transformer SEMOD175185-669 v2 Load drop compensation SEMOD175185-672 v5 Confirm that OperationLDC is set to Enabled. Confirm settings for Rline and Xline. Calculate the expected load voltage V (displayed as a measured value on the local HMI) based on secondary injection of transformer secondary voltage (VB = VSet) and rated load current (I I1Base), in accordance with equation 122.
  • Page 265: Parallel Voltage Regulation

    1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection When setting OperationLDC set to Enabled, the voltage regulation algorithm uses the calculated value for load voltage as the regulating quantity to compare against VSet and the voltage deadband limits VDeadband and VDeadbandInner.
  • Page 266 Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection currents for each transformer based on impedance values and respective compensating factors, and is therefore more complex for greater than two transformers. Confirm that OperationPAR is set to CC for the transformers in the parallel group. For parallel operation, it is also recommended that settings be confirmed for parallel group membership, governed by setting TnRXOP in the local HMI under Main menu/Settings /IED Settings/Control /TransformerVoltageControl(90, U↕)/TR8ATCC(90, U↕||):x/ParCtrl...
  • Page 267 1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection > Vdi V (Equation 128) EQUATION2093-ANSI V1 EN-US VB Vset (for the purposes of this test procedure) (Equation 129) EQUATION2095-ANSI V1 EN-US Therfore: × × > Ci Icc i Xi V Vset (Equation 130) EQUATION2097-ANSI V1 EN-US...
  • Page 268: Completing The Test

    Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection VTmismatch during parallel operation SEMOD175185-859 v4 Confirm that OperationPAR is set to MF for each transformer in the parallel group. Review the setting for VTmismatch and tVTmismatch. Inject a voltage V equal to VSet for Transformer 1 and a voltage less than (VSet –...
  • Page 269: Function Revision History

    1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection Activation of the different zones verifies that the CS signal is issued from the intended zones. The CS signal from the independent tripping zone must have a tSendMin minimum time. Check the tripping function by activating the CR and CR_GUARD inputs with the overreaching zone used to achieve the PLTR_CRD signal.
  • Page 270: Testing Blocking Scheme

    Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection Check that the other zones operate according to their zone timer and that the send (CS) signal is obtained only for the zones that are configured to give the actual signal. Also the zone connected to CS underreach is giving CS in this mode.
  • Page 271: Completing The Test

    1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection Activate the guard input signal (CR_GUARD) of the IED. Using the scheme selected, check that a signal accelerated trip (TRIP) is obtained when the guard signal is deactivated. 11.12.1.7 Completing the test M13868-84 v6...
  • Page 272: Testing Permissive Overreaching

    Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection Check that other zones operate according to their zone timers and that the send (CS_x) signal is obtained only for the zone and phase configured to generate the actual signal. Deactivate the receive (CRLx) signal in the IED.
  • Page 273: Function Revision History

    1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection Values of the logical signals for ZCRWPSCH are available on the local HMI under Main menu/Tests/ Function status / Scheme communication / ZCRWPSCH(85) /ZCRWPSCH:1. The Signal Monitoring in PCM600 shows signals that are available on the Local HMI. The current reversal logic and the weak-end infeed functions are tested during the secondary-injection test of the impedance or overcurrent protection zones together with the scheme communication logic for the distance protection function ZCPSCH (85).
  • Page 274: Weak End Infeed Logic

    Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection Set the healthy condition to an impedance at 50% of the reach of the reverse zone connected to IRV. Activate the receive (CRL) signal. After the pickup condition is obtained for reverse zone, apply a fault at 50% of the reach of the forward zone connected to WEIBLK2.
  • Page 275: Completing The Test

    1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection 11.12.3.4 Completing the test M14947-105 v5 Continue to test another function or end the test by changing the TESTMODE setting to Disabled. Restore connections and settings to the original values, if changed for testing purposes. 11.12.4 Scheme communication logic for residual overcurrent protection ECPSCH (85)
  • Page 276: Completing The Test

    Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection Compare the measured time with the set value tCoord. Activate the CR binary input. Check that the CRL output is activated when the CR input is activated. Switch the fault current on (110% of the set operating current) and wait longer than the set value tCoord.
  • Page 277: Current Reversal And Weak-End Infeed Logic For Residual Overcurrent Protection Ecrwpsch (85)

    1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection 11.12.5 Current reversal and weak-end infeed logic for residual overcurrent protection ECRWPSCH (85) M13936-2 v8 Prepare the IED for verification of settings as outlined in section "Requirements" and section "Preparing for test"...
  • Page 278: Completing The Test

    Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection Activate the BLOCK binary input. Activate the CRL binary input. No ECHO and CS should appear. Switch off the polarizing voltage and reset the BLOCK and CRL binary input. If setting WEI = Echo &...
  • Page 279: Logic

    1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection 11.13 Logic SEMOD53577-1 v1 11.13.1 Tripping logic, common 3-phase output SMPPTRC (94) SEMOD54375-102 v10 Prepare the IED for verification of settings outlined in Section "Preparing the IED to verify settings".
  • Page 280: 1P/2P/3P Operating Mode

    Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection Consider using an adequate time interval between faults, to overcome a reset time, which is activated by SMBRREC (79). A three-pole trip should occur for each separate fault and all of the trips.
  • Page 281: Circuit Breaker Lockout

    1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection 11.13.1.5 Circuit breaker lockout SEMOD54375-170 v11 The following tests should be carried out when the built-in lockout function is used in addition to possible other tests, which depends on the complete configuration of an IED. Check that AutoLock and TripLockout are both set to Disabled.
  • Page 282: Function Revision History

    Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection 11.14.1.1 Function revision history GUID-7F31EFA5-F8D8-4D8D-85DA-3418F70ABE94 v2 Document Product History revision revision 2.2.1 2.2.1 2.2.2 2.2.3 2.2.3 2.2.4 2.2.4 Binary quality inputs SENPRESQ and SENTEMPQ have been added for pressure and temperature sensor signals in order to control alarm and lockout signals.
  • Page 283: Completing The Test

    1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection Activate BLOCK binary input and check that the outputs TEMPALM, TEMPLO, ALARM and LOCKOUT disappear. Reset the BLOCK binary input. Ensure that temperature lockout condition exists and then activate the reset lockout input RESETLO and check that the outputs TEMPLO and LOCKOUT reset.
  • Page 284: Testing The Gas Medium Supervision For Temperature Alarm And Temperature Lockout Conditions

    Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection Ensure that binary input SENLEVELQ is activated and reduce the liquid level input below LevelLOLimit or activate the binary input signal SENLVLLO, check that LVLLO signal after a set time delay of tLevelLockOut.
  • Page 285 1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection POSCLOSE POSOPEN Test of CB contact travel time 4.1. Test the set timing defined by OpenTimeCorr, CloseTimeCorr, tTrOpenAlm and tTrCloseAlm. 4.2. Change the status of the auxiliary contacts such that travel time to open TTRVOP and travel time to close TTRVCL exceed the respective set values (tTrOpenAlm and tTrCloseAlm).
  • Page 286: Completing The Test

    Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection 9.1. Test the actual set value defined by SpChAlmTime. 9.2. Enable SPRCHRST input. Also activate SPRCHRD after a time greater than set time SpChAlmTime. 9.3. At this condition, SPCHALM is activated. 10.
  • Page 287 1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection Verifying HPTMPMAX and TOTCALC outputs GUID-95D0A8EC-8901-4269-9FD3-7D7F386E6BB3 v1 Connect the test set for injection of three-phase currents to the appropriate current terminals of the IED. Activate the TOTVALID input and set some temperature value in TOTEMP input. Supply the IED with three-phase currents slightly more than the rated value.
  • Page 288: Completing The Test

    Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection Supply the IED with three-phase currents slightly more than the rated value. Note the hot spot temperature (HPTMPMAX) and maintain it for another 1 hour. Check the LOLINDAY and LOLINYRS outputs after 1 hour and compare it with the calculated loss of life value using IEC standard method.
  • Page 289: Completing The Test

    1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection Compute the time between the ALARM signal raise to CMLI2TALM signal raise and multiply with the squared injected current. Add the calculated value with previously calculated I t value. Compare the calculated value with the set MaxI2tCmlWx value.
  • Page 290: Completing The Test

    Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection Compare the harmonic amplitude level value with the set warning limit value. Continue to inject the same level of harmonics level until the TDDALM signal appears and note down the time from TDDWRN set to TDDALM set.
  • Page 291: Completing The Test

    1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection Compare the harmonic amplitude level value with the set warning limit value. Continue to inject the same level of harmonics level until the THDALM signal appears and note down the time from THDWRN set to THDALM set.
  • Page 292: Completing The Test

    Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection Verification of function monitoring outputs Connect the test set for injection of three-phase currents and three-phase voltage to the appropriate current and voltage terminals of the IED. Ensure the TRIP, TRLx* output signals from PHPIOC function block connected to TRINALL, TRINLx* input signals of SMPPTRC function block.
  • Page 293: Measuring The Operate Limit

    1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection The result is displayed on the local HMI or via PCM600. Distances to faults for the last 100 recorded disturbances can be found on the local HMI under Main menu/Disturbance Records /Disturbance #n(n = 1–100)/General Information If PCM600 is used, the result is displayed on the recording list after upload, including loop selection information.
  • Page 294: Completing The Test

    Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection in % for single-phase-to-ground faults with mutual zero sequence current. Where: = the expected value of a distance to fault in percent = set test point on the test set = set zero-sequence reactance of a line = set positive-sequence reactance of a line = set mutual zero-sequence impedance of a line...
  • Page 295: Completing The Test

    1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection After some time (multiple of minute) remove the current and voltage input from CVMMXN function block. Check the EAFACC and ERFACC output in the next 1 minute cycle for the retaining the same value. 10.
  • Page 296: Remote Communication

    Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection system, because the command function blocks are connected in a delivery-specific way between bays and the station level and transmit. Command and transmit function blocks included in the operation of different built-in functions must be tested at the same time as their corresponding functions.
  • Page 297: Basic Ied Functions

    1MRK 504 165-UUS Rev. J Section 11 Testing functionality by secondary injection ANSI07000188 V1 EN-US Figure 59: Test of RTC with I/O 11.18 Basic IED functions SEMOD52026-1 v1 11.18.1 Parameter setting group handling SETGRPS M11369-2 v4 Prepare the IED for verification of settings as outlined in section "Preparing for test"...
  • Page 298: Completing The Test

    Section 11 1MRK 504 165-UUS Rev. J Testing functionality by secondary injection 11.18.1.2 Completing the test M11369-39 v4 Continue to test another function or end the test by changing the TESTMODE setting to Disabled. Restore connections and settings to the original values, if changed for testing purposes. 11.19 Exit test mode SEMOD53244-3 v6...
  • Page 299: Primary Injection Testing

    1MRK 504 165-UUS Rev. J Section 12 Primary injection testing Section 12 Primary injection testing IP10812-1 v1 SEMOD65857-3 v3 Whenever it becomes necessary to work on primary equipment, it is essential that all the necessary switching, locking, grounding and safety procedures are observed and obeyed in a rigid and formalized manner.
  • Page 300: Voltage Control Of Parallel Transformers

    Section 12 1MRK 504 165-UUS Rev. J Primary injection testing IEC13000251-1-en.vsd In this view, check the following settings: 3.1. Check that Control Mode is set to Manual. 3.2. Operate the tap changer so that the Load Voltage corresponds to the Voltage Set Point. 3.3.
  • Page 301: Minimum Circulating Current (Mcc) Method

    1MRK 504 165-UUS Rev. J Section 12 Primary injection testing For parallel operation, it is also recommended to confirm the setting for the general parallel arrangement of transformers in Main menu /Settings/IED Settings /Control/TransformerVoltageControl(90, U↕) / TR8ATCC(90, U↕||):x/ParCtrl . General parallel arrangement of transformers are defined by setting TnRXOP to On or Off.
  • Page 302: Master Follower (Mf) Method

    Section 12 1MRK 504 165-UUS Rev. J Primary injection testing Set the control mode to Automatic for all transformers. For transformer T1, adjust the parameter Comp on the local HMI in Main menu/Settings/IED Settings/Control/TransformerVoltageControl(90, U↕) /TR8ATCC(90, U↕||):x/ParCtrl /Compso that the LOWER output is activated due to circulating current. Comp is a setting for circulating current Compensating Factor, and it is effectively a multiplier value to change the sensitivity of the voltage regulation function to measured values of circulating current.
  • Page 303: Completing The Test

    1MRK 504 165-UUS Rev. J Section 12 Primary injection testing IEC13000252-1-en.vsd Manually execute Raise commands to step up the tap changer one step for all transformers in the parallel group Check that the value of BUSVOLT is below overvoltage blocking level OVPartBK and above the undervoltage blocking level UVPartBK.
  • Page 305: Checking The Directionality

    1MRK 504 165-UUS Rev. J Section 13 Checking the directionality Section 13 Checking the directionality 13.1 Overview GUID-7E504488-F341-477A-953A-EB0B262911EB v2 Before starting this process, all individual devices that are involved in the fault clearance process of the protected object must have been individually tested and must be set in operation. The circuit breaker must be ready for an open-close-open cycle.
  • Page 306 Section 13 1MRK 504 165-UUS Rev. J Checking the directionality • L1Dir = Forward • L2Dir = Forward • L3Dir = Forward The following will be shown if the load current flows in the reverse direction (importing): • L1Dir = Reverse •...
  • Page 307: Commissioning And Maintenance Of The Fault Clearing System

    1MRK 504 165-UUS Rev. J Section 14 Commissioning and maintenance of the fault clearing system Section 14 Commissioning and maintenance of the fault clearing system 14.1 Commissioning tests SEMOD56513-5 v5 During commissioning all protection functions shall be verified with the setting values used at each plant. The commissioning tests must include verification of all circuits by highlighting the circuit diagrams and the configuration diagrams for the used functions.
  • Page 308: Visual Inspection

    Section 14 1MRK 504 165-UUS Rev. J Commissioning and maintenance of the fault clearing system When protection IEDs are combined with built-in control, the test interval can be increased drastically, up to for instance 15 years, because the IED continuously reads service values, operates the breakers, and so on.
  • Page 309: Secondary Injection

    1MRK 504 165-UUS Rev. J Section 14 Commissioning and maintenance of the fault clearing system 14.2.2.3 Secondary injection SEMOD56528-17 v2 The periodic maintenance test is done by secondary injection from a portable test set. Each protection shall be tested according to the secondary injection test information for the specific protection IED. Only the setting values adopted shall be checked for each protection function.
  • Page 310: Measurement Of Service Currents

    Section 14 1MRK 504 165-UUS Rev. J Commissioning and maintenance of the fault clearing system 14.2.2.7 Measurement of service currents SEMOD56528-30 v4 After a maintenance test it is recommended to measure the service currents and service voltages recorded by the protection IED. The service values are checked on the local HMI or in PCM600. Ensure that the correct values and angles between voltages and currents are recorded.
  • Page 311: Troubleshooting

    1MRK 504 165-UUS Rev. J Section 15 Troubleshooting Section 15 Troubleshooting 15.1 Checking the self supervision signals IP1474-1 v2 15.1.1 Checking the self supervision function IP1473-1 v1 15.1.1.1 Determine the cause of an internal failure M11657-2 v2 This procedure describes how to navigate the menus in order to find the cause of an internal failure when indicated by the flashing green LED on the HMI module.
  • Page 312: Fault Tracing

    Section 15 1MRK 504 165-UUS Rev. J Troubleshooting Indicated result Possible reason Proposed action (Protocol name) Ready No problem detected. None. (Protocol name) Fail Protocol has failed. (I/O module name) No problem detected. None. Ready (I/O module name) Fail I/O modules has failed. Check that the I/O module has been configured and connected to the IOP1- block.
  • Page 313: Using Front-Connected Pc

    1MRK 504 165-UUS Rev. J Section 15 Troubleshooting HMI Signal Name: Status Description Time Sync READY / FAIL This signal will be active when the source of the time synchronization is lost, or when the time system has to make a time reset. Application READY / FAIL This signal will be active if one or more...
  • Page 314: Diagnosing The Ied Status Via The Lhmi Hint Menu

    Section 15 1MRK 504 165-UUS Rev. J Troubleshooting The internal events are time tagged with a resolution of 1ms and stored in a list. The list can store up to 40 events. The list is based on the FIFO principle, when it is full, the oldest event is overwritten. The list cannot be cleared and its content cannot be erased.
  • Page 315 1MRK 504 165-UUS Rev. J Section 15 Troubleshooting For example, if there is a configuration to use IEC 61850 9–2 analog data, but no data arrives on the access point, then the IED will use substituted data and most protection functions will be blocked. This condition will be indicated with a sub-menu under Hints, where details about this condition are shown.
  • Page 316 Section 15 1MRK 504 165-UUS Rev. J Troubleshooting Headline Explanation GOOSE is configured on a disabled port At least one of the access points configured for GOOSE is disabled. The port can be disabled either through changing the access point operation to off or by unchecking the GOOSE protocol from the access point in the Ethernet configuration in PCM600 or LHMI.
  • Page 317: Hardware Re-Configuration

    1MRK 504 165-UUS Rev. J Section 15 Troubleshooting Headline Explanation High CPU Load Total: 81.3% Core0: 64.2 % Core1: 98.4% Tips to reduce the CPU load: • Configure minimum number of functional blocks • Switch off functional blocks not in use •...
  • Page 318: Repair Instruction

    Section 15 1MRK 504 165-UUS Rev. J Troubleshooting The new module is now available in PCM600 and is ready to be configured. Removing a module from an IED Procedure: Remove all existing configuration for the module in PCM, and write that configuration to the IED. Switch the IED off and remove the HW module.
  • Page 319: Repair Support

    1MRK 504 165-UUS Rev. J Section 15 Troubleshooting Disassemble and reassemble the IED accordingly: Switch off the dc supply. Short-circuit the current transformers and disconnect all current and voltage connections from the IED. Disconnect all signal wires by removing the female connectors. Disconnect the optical fibers.
  • Page 321: Glossary

    1MRK 504 165-UUS Rev. J Section 16 Glossary Section 16 Glossary M14893-1 v20 Alternating current Actual channel Application configuration tool within PCM600 A/D converter Analog-to-digital converter ADBS Amplitude deadband supervision Analog digital conversion module, with time synchronization Analog input ANSI American National Standards Institute Access Point Autoreclosing...
  • Page 322 Section 16 1MRK 504 165-UUS Rev. J Glossary CAN carrier module CCVT Capacitive Coupled Voltage Transformer Class C Protection Current Transformer class as per IEEE/ ANSI CMPPS Combined megapulses per second Communication Management tool in PCM600 CO cycle Close-open cycle Codirectional Way of transmitting G.703 over a balanced line.
  • Page 323 1MRK 504 165-UUS Rev. J Section 16 Glossary Digital signal processor Direct transfer trip scheme Ethernet configuration tool EHV network Extra high voltage network Electronic Industries Association Electromagnetic compatibility Electromotive force Electromagnetic interference EnFP End fault protection Enhanced performance architecture Electrostatic discharge F-SMA Type of optical fiber connector...
  • Page 324 Section 16 1MRK 504 165-UUS Rev. J Glossary High-availability Seamless Redundancy High-voltage HVDC High-voltage direct current IDBS Integrating deadband supervision International Electrical Committee IEC 60044-6 IEC Standard, Instrument transformers – Part 6: Requirements for protective current transformers for transient performance IEC 60870-5-103 Communication standard for protection equipment.
  • Page 325 1MRK 504 165-UUS Rev. J Section 16 Glossary International Telecommunications Union Local area network LIB 520 High-voltage software module Liquid crystal display LDAPS Lightweight Directory Access Protocol LDCM Line data communication module Local detection device Light-emitting diode LON network tool Local operating network Miniature circuit breaker Mezzanine carrier module...
  • Page 326 Section 16 1MRK 504 165-UUS Rev. J Glossary Process bus Bus or LAN used at the process level, that is, in near proximity to the measured and/or controlled components Parallel redundancy protocol Power supply module Parameter setting tool within PCM600 Precision time protocol PT ratio Potential transformer or voltage transformer ratio...
  • Page 327 1MRK 504 165-UUS Rev. J Section 16 Glossary Switch for CB ready condition Switch or push button to trip Starpoint Neutral/Wye point of transformer or generator Static VAr compensation Trip coil Trip circuit supervision Transmission control protocol. The most common transport layer protocol used on Ethernet and the Internet.
  • Page 328 Section 16 1MRK 504 165-UUS Rev. J Glossary Three times zero-sequence current.Often referred to as the residual or the ground-fault current Three times the zero sequence voltage. Often referred to as the residual voltage or the neutral point voltage Transformer protection RET670 Commissioning manual ©...
  • Page 330 ABB Power Grids Sweden AB Grid Automation Products SE-721 59 Västerås, Sweden Phone +46 (0) 10 738 00 00 Scan this QR code to visit our website https://hitachiabb-powergrids.com/protection-control © 2017 - 2021 Hitachi Power Grids. All rights reserved...

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