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APPLICATION
CAUTION
(1) Use the instrument within the application range specified in the
(2) Do not operate the instrument with covers or doors removed, nor use
Viewing the screen of the computer monitor and/or operating the computer
CAUTION
keyboard for prolonged, uninterrupted periods of time may result in fatigue
or other problems such as eye strain or repetitive motion injuries.
Therefore, Hitachi High-Technologies Corporation recommends that the
user carefully consider these potential risks when establishing guidelines
for proper use of this instrument in their workplace.
FOREWORD
• The S-4800 SEM utilizes electron beam accelerated at 500 V to 30 kV.
The instrument is designed mainly for observation and evaluation of
specimens prepared for observation using SEM.
• Note that Hitachi High-Technologies Corporation will not be responsible
for injury or damage caused by usage of the instrument in a manner not
described in this manual.
The electron microscope need not conform to the "Radiation Hazard
Preventive Laws" or "Ionizing Radiation Hazard Preventive Regulations"
currently in effect throughout the world, unlike the instruments
designed to produce x-rays.
The suggestion made by the ICRP (International Committee on Radiation
Hazard Prevention), however, clearly defines that the electron
microscope, like the home television set, will potentially produce a certain
amount of x-rays as an undesirable byproduct. From a safety viewpoint,
therefore, it is essential to operate the instrument carefully taking into
account the following fundamental precautions.
catalog or instruction manual.
alternatives for these components.
(3)
Do not apply modifications which may possibly result in deactivation
of the built-in safety devices.
FOREWORD - 1
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