Reliability Features - Huawei ME909 Series Hardware Manual

HUAWEI ME909 Series LTE LGA Module
Hardware Guide
Table 5-11 DC power consumption (GPS)
Description
GPS location request

5.7 Reliability Features

Table 5-12 lists the test conditions and results of the reliability of the ME909 module.
Table 5-12 Test conditions and results of the reliability of the ME909 module
Item
Low-temperature
storage
High-temperature
storage
Low-temperature
working
High-temperature
working
Damp heat cycling
Temperature shock
Issue V0.3 (2013-05-21)
 The above values are the average of some test samples.
LTE test condition: 10 MHz bandwidth, QPSK, 1RB when testing max Tx power and full RB

when testing 1 dBm or 10 dBm.
Test Condition
Temperature: –40º C± 2º C
Test duration: 24 h
Temperature: 85º C± 2º C
Test duration: 24 h
Temperature: –30º C± 2º C
Test duration: 24 h
Temperature: 75º C± 2º C
Test duration: 24 h
High temperature: 55º C± 2º C
Low temperature: 25º C± 2º C
Humidity: 95%
Repetition times: 4
Test duration: 12 h+12 h
Low temperature: –40º C± 2º C
High temperature: 85º C± 2º C
Temperature change interval: < 30s
Test duration: 15 min
Repetition times: 100
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Max Test Value
TBD
Electrical and Reliability Features
Units Configuration
mA
Standard
IEC60068
IEC60068
IEC60068
IEC60068
IEC60068
IEC60068
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