Mitsubishi Electric Melsec Q Series User Manual page 102

7 Setting and procedure for operation
(2) Setting function for integrated value
This function is to set integrated value (electric energy (consumption, regeneration) and
reactive energy (consumption lag)) to any value. If you want to clear integrated value, set it to 0.
1) In the dialog box to monitor all buffer memories, click the Device test button to display the
Device test dialog box.
2) In the Word device / buffer memory, specify the module initial address and buffer address,
and click the Set button to apply the setting.
4), 6)→
2)→
Figure 7.7.4-2 Device test dialog box (a case where this module is attached to the slot 0)
3) Change the setting in 2).
4) In the section of bit device setting in the device test dialog box, select "YC"* and click the
FORCE ON button.
5) When the setting is completed without any problem, the Device "XC"* changes to ON.
Figure 7.7.4-3 Checking the device "XC"* in the dialog box to Entry data monitor
6) After checking that the device "XC"* is in the ON status, select "Device: "YC"* in the
dialog box of device test, and then click the FORCE OFF button. Setting is completes.
7) If the Device "XC"* is not in the ON status, this means an error because the set value is
out of range (ERR.LED is flashing). Modify the setting, and change the device "YC" to the
OFF status, then change it back to the ON status.
* Indicates a number in the case where the initial I/O number (initial XY) is set to 0.
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