Mitsubishi Electric MELSEC iQ-R Series User Manual page 28

Specifying a device and label to be sampled
The following table shows the specification methods of devices and labels to be sampled.
Specification method
Device/label batch specification
Device individual specification
*1 An unconverted program is not a target for data sampling.
*2 FUNs are not targets and only FBs used in a program are targets.
• By default, the device/label batch specification is enabled.
In this case, all devices and labels in a program are set to be sampled.
However, depending on an instruction used in a program, only the start device is sampled and all devices
and labels used by the instruction may not be sampled.
Set sampling targets by using the device individual specification as necessary.
In addition, when specifying devices and labels in a batch, more devices and labels are sampled and the
scan time is longer. Unnecessary programs are recommended to be deleted from a project as necessary.
• When setting multiple recording settings or sampling data at a fixed cycle such as when using an interrupt
program (when specifying a trigger instruction), disable the device/label batch specification and move
required devices from the device/label batch specification to the device individual specification. If it is
enabled, more devices and labels are sampled and the scan time is longer.
For the method for moving devices to the device individual specification, refer to the following:
Page 58 Procedure for moving sampling target devices to the device individual specification
• For using a global label, assign a device and specify it by using the device individual specification.
Ex.
When setting the device individual specification
Case
Index modification or indirect specification is specified in a program.
Data such as control data in an area required for the operation of an
instruction is sampled.
A device is specified for a numerical value (n) such as the number of
devices, transfers, units of data, or character strings.
Buffer memory of a module (to use for troubleshooting)
Disabling the device/label batch specification and specifying only
required devices as sampling targets to reduce the size of data to be
sampled
• Multiple recording settings are set.
• Sampling data at a fixed cycle such as when using an interrupt
program (when specifying a trigger instruction).
1 FUNCTIONS
26
1.1 Recording Function
Description
Devices and labels used in a program can
*1,*2
be sampled in a batch.
When enabling this method, the program
setting in the CPU parameter, all programs
set in the FB/FUN setting, and FBs are
sampling targets.
■Target program
Ladder, ST, and FBD/LD
■Target data
Refer to the following:
Page 27 Target data for the device/label
batch specification
Specified devices can be sampled by
specifying them individually.
Purpose
Use this method to sample devices and
labels used in a program in a batch.
Use this method in any of the following
cases:
• Adding data that cannot be sampled by
using the device/label batch
specification to the sampling target.
• Multiple recording settings are set.
• Sampling data at a fixed cycle such as
when using an interrupt program (when
specifying a trigger instruction).
Remarks
To sample a device that is not sampled by using the device/label batch
specification, specify it individually.
For devices that are specified as sampling targets, refer to the following:
Page 27 Target data for the device/label batch specification

Screen
Page 56 Device/Label
Sampling Setting
Page 57 Device individual
specification screen