Hitachi TM3030 Plus Instruction Manual page 141

Figure 4.2.5-1 Signal Select / Observation Mode Settings
NOTE : If switching the observation mode ([Conductor], [Standard] and [Chg-up Red.])
among different image signals or even in a single image signal, it takes over ten
seconds to reach the specified degree of vacuum. At the same time, image
brightness changes. After the brightness becomes stable, click the [Auto B/C]
button (See 4.3.20) to achieve the appropriate brightness level.
1. BSE (Backscattered Electron)
Compositional images can be observed along with atomic numbers of materials
composing samples. By shifting the image modes (see 4.3.5.3), it is also possible to
acquire shadowed and topographical information. When [COMPO] is selected, any mark
is not displayed in the information area located in the lower right part of the image
observation area. (see 4.3.2); when [Shadow 1] or [Shadow 2] is selected, the [S] mark is
displayed; when [TOPO] is selected, the [T] mark is displayed.
Every time the [BSE] button is clicked, [Conductor], [Standard] or [Chg-up Red.] is
selected in order and the selected observation mode is displayed under the [BSE] button.
Select a desired mode, depending on the specimen to be observed and the observation
purpose.
1a. Conductor
This observation mode is suitable for observing conductive samples, such as metal
materials. When observing the fixed field of view of conductive samples using each
image signal (BSE / SE / Mix), it is recommended to select [Standard].
When [Conductor] is selected, any mark is not displayed in the information area
located in the lower right part of the image observation area. (see 4.3.2)
Figure 4.2.5-2 Signal Select / Observation Mode Settings (BSE – Conductor)
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