Toshiba GRT100 Series Instruction Manual page 125

ENTER key.
 Apply an infeed current to terminal TB1-1 and -2.
When the infeed current applied is larger than the setting of ik (pu) and smaller than [kpp2 +
(1p1)ik]/(p2  p1) (pu), characteristic DF1 is checked.
When the infeed current applied is larger than [kpp2 + (1p1)ik]/(p2  p1) (pu),
characteristic DF2 is checked.
Note: When the default settings are applied, the critical infeed current which
determines DF1 checking or DF2 checking is 1.6×(CT secondary rated
current).
 Apply an outflow current of the same magnitude and counterphase with the infeed current, to
terminal TB1-7 and -8.
 Decrease the outflow current in magnitude and measure the values at which the element
operates.
 Check that the measured values are within 15% of the theoretical values.
For characteristic DF1, the theoretical outflow current is given by the following equation.
ik) (pu)
I = (1p )(I
out 1 in
where,
p = slope setting of DF1 (= 0.1 fixed)
1
ik = minimum operating current setting
When the default settings are applied, I
characteristic DF2, the theoretical outflow current is given by the following equation
I = (1p ) I + p
out 2 in 2
where,
p = slope setting of DF2
2
kp = sensitivity setting of DF2
When the default settings are applied, I
= 0.9× (I
out
×kp (pu)
= 1.0 × (CT secondary rated current).
out
 124 
– 0.5) × (CT secondary rated current). For
in
6 F 2 S 0 7 8 9