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1MRK 504 165-UEN Rev. K
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switch or push-button to close (SC)
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switch or push-button to trip (ST)
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switch for CB ready condition (SRY)
If no bi-stable relay or breaker simulator is available, replace it with two self-reset auxiliary relays and
use a self-holding connection.
Use a secondary injection IED test set to operate the protection function. The test set shall be
switched off when a trip signal is given or when the BR comes to open position to simulate real
conditions.
The CB simulation can be made more elaborate, including simulation of the operating gear condition,
CBREADY of either the type ready for a Close-Open (CO) cycle, or the type ready for an Open-Close
-Open (OCO) cycle.
The CB condition CBREADY of a type, CO, shall be high (true) until a closing operation is performed.
It then goes low (false) for a recharging time of about 5 - 10s. After that it is high again.
A CB condition CBREADY of a type, OCO shall be high (true) before and during tripping (start auto
reclosing). During tripping it goes low for a recharging time, for example, 10s. It may thus be low at
the instant of reclosing. After each Open or Close operation it may need a recharging period before it
goes high again.
In the example of CB simulation arrangement, the CBREADY condition is simulated by a manual
switch, SRY.
Information and material for the verification:
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Protection or control unit, IED, configured and with settings entered.
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Configuration diagram for the IED
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Terminal diagram for the IED, or plant circuit diagram including the IED
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Technical reference manual for the IED
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IED test set for secondary injection
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Means to indicate, measure and record operation and times, for example an event recording
facility
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A bi-stable relay (BR) or two auxiliary relays to simulate a CB
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Two push-buttons (SC, ST) to operate the BR and a change-over switch (SRY) to simulate
CBREADY
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Possibly a switch simulation the synchronizing check SESRSYN condition
Transformer protection RET670
Commissioning manual
© 2017 - 2022 Hitachi Energy. All rights reserved
Section 11
Testing functionality by secondary injection
237
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