Electromagnetic Compatibility (Emc) - GE MiCOM P40 Agile Technical Manual

Technical Data
MiCOM P40 Agile P442, P444
High Voltage (Dielectric) Withstand
(EIA RS232 ports excepted).
(i) Per IEC 60255-27: 2005, 2 kV rms, AC, 1
minute:
Between all case terminals connected together
and the case earth.
Also, between all terminals of independent
circuits.
∗ 1 kV rms AC for 1 minute, across open
watchdog contacts and across open
contacts of changeover output relays.
(ii) Per ANSI/IEEE C37.90-1989 (reaffirmed
1994):
∗ 1.5 kV rms AC for 1 minute, across open
contacts of changeover output relays.
Impulse Voltage Withstand Test
Per IEC 60255-27: 2005
Front time: 1.2 µs, Time to half-value: 50 µs,
Peak value: 5 kV, 0.5J
Between all terminals, and all terminals and
case earth.

Electromagnetic Compatibility (EMC)

1 MHz Burst High Frequency Disturbance
Test
Per IEC 60255-22-1: 2008, Class III,
Common-mode test voltage: 2.5 kV,
Differential test voltage: 1.0 kV,
Test duration: 2 s, Source impedance: 200 Ω
(EIA RS232 ports excepted).
100 kHz Damped oscillatory Test
Per EN 61000-4-18: 2007, Level 3,
Common-mode test voltage: 2.5 kV,
Differential test voltage: 1.0 kV,
Immunity to Electrostatic Discharge
Per IEC 60255-22-2: 1997, Class 4,
∗ 15 kV discharge in air to user interface,
display, and exposed metalwork.
Per IEC 60255-22-2: 1997, Class 3,
∗ 8 kV discharge in air to all communication
ports.
∗ 6 kV point contact discharge to any part of
the front of the product.
Electrical Fast Transient or Burst
Requirements
Per IEC 60255-22-4: 2002 and EN 61000-4-4:
2004.
Test severity:
∗ Class III and IV:
Amplitude:
∗ 2 kV, burst frequency 5 kHz (Class III),
Amplitude:
∗ 4 kV, burst frequency 2.5 kHz (Class IV).
Applied directly to auxiliary supply, and applied
to all other inputs. (EIA RS232 ports
excepted).
Amplitude:
∗ 4 kV, burst frequency 5 kHz (Class IV).
Applied directly to auxiliary supply.
Fast transient disturbances on power
supply (common mode only): 4 kV, 5 ns rise
time, 50 ns decay time, 5 kHz repetition
frequency, 15 ms burst, repeated every
300 ms for 1 min in each polarity, with a 50 Ω
source impedance
Fast transient disturbances on I/O signal,
data and control lines (common mode only):
4 kV, 5 ns rise time, 50 ns decay time, 5 kHz
repetition frequency, 15 ms burst, repeated
every 300 ms for 1 min in each polarity, with a
50 Ω source impedance.
Surge Withstand Capability
Per IEEE/ANSI C37.90.1: 2002:
4 kV fast transient and 2.5 kV oscillatory
applied directly across each output contact,
optically isolated input, and power supply
circuit.
Surge Immunity Test
(EIA RS232 ports excepted).
Per IEC 61000-4-5: 2006 Level 4,
Time to half-value: 1.2 / 50 µs,
∗ Amplitude: 4 kV between all groups and
case earth,
∗ Amplitude: 2 kV between terminals of each
group.
Immunity to Radiated Electromagnetic
Energy
Per IEC 60255-22-3: 2000, Class III:
Test field strength, frequency band 80 to 1000
MHz:
∗ 10 V/m,
∗ Test using AM: 1 kHz / 80%,
∗ Spot tests at 80, 160, 450, 900 MHz
Per IEEE/ANSI C37.90.2: 2004:
25 MHz to 1000 MHz, zero and 100% square
wave modulated.
Field strength of 35 V/m.
Radiated Immunity from Digital
Communications
Per EN61000-4-3: 2002, Level 4:
Test field strength, frequency band 800 to 960
MHz, and 1.4 to 2.0 GHz:
∗ 30 V/m,
Test using AM:
∗ 1 kHz / 80%.
Radiated Immunity from Digital Radio
Telephones
Per EN 61000-4-3: 2002
∗ 10 V/m, 900 MHz and 1.89 GHz.
Immunity to Conducted Disturbances
Induced by Radio Frequency Fields
Per IEC 61000-4-6: 1996, Level 3,
Disturbing test voltage: 10 Vrms at 1 kHz 80%
am., 0.15 to 80 MHz
P44x/EN TD/Hb6
(TD) 2-7