Toshiba TC9349AFG Manual page 121

Cmos digital integrated circuit silicon monolithic
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Test Port
This is the internal port used to test the device functions. These ports are assigned to data port 7 and can be accessed by
using the OUT1 instruction with [CN = 6H] specified in the operand. Set all to "0" in the normal program.
φL16(2)
Y1
#0
Setting the following data to test ports #3 to #0 enables various signals to be output from the MUTE pin.
#3
0
0
0
0
0
1
Note: The MUTE pin is also used for pin P9-1. This pin must be set as the MUTE pin when you need signals to
be output from the MUTE pin.
Application to Emulator Chip
When the RESET pin is at the "L" level and pulses are inputted to the TEST pin, various kinds of test modes will be
activated and the device will operate as an emulator chip. Three types of test modes are available, and the software
development tool can be configured by using three devices.
You can confirm the radio operation while developing software by connecting this software development tool to the tuner
IC.
φL16(3)
Y2
Y4
Y8
Y1
#1
#2
#3
#4
Test port
#2
#1
#0
Data
0
0
0
0
0
0
1
1
0
1
0
2
0
1
1
3
1
0
0
4
1
1
1
F
121
Y2
Y4
Y8
MUTE pin output
MUTE output
Programmable counter
frequency
Reference frequency
2 Hz
Prohibition
TC9349AFG
2006-02-24

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