Toshiba GRE110 Instruction Manual page 243

4. Function test
4.1 Overcurrent elements test
Element
OC1-A
OC2-A
OC3-A
OC4-A
SEF1
SEF2
SEF3
SEF4
UC1-A
UC2-A
THM-A
THM-T
NPS1
NPS2
CBF-A
4.2 Operating time test (IDMT)
Element Curve setting
OC1-A
EF1
EF2
SEF1
SEF2
Current setting
EF1
EF2
EF3
EF4
BCD
Multiplier setting
 244 
Measured current
Measured time
6 F 2 T 0 1 7 2