Test Mode Functionality Testmode - ABB REC670 Applications Manual

Section 23
Basic IED functions
23.12
23.12.1
23.12.1.1
620

Test mode functionality TESTMODE

Application
The protection and control IEDs may have a complex configuration with many
included functions. To make the testing procedure easier, the IEDs include the feature
that allows individual blocking of a single-, several-, or all functions.
This means that it is possible to see when a function is activated or trips. It also enables
the user to follow the operation of several related functions to check correct
functionality and to check parts of the configuration, and so on.
IEC 61850 protocol test mode
The IEC 61850 Test Mode has improved testing capabilities for IEC 61850 systems.
Operator commands sent to the IEC 61850 Mod determine the behavior of the
functions. The command can be given from the LHMI under the Main menu/Test/
Function test modes menu or remotely from an IEC 61850 client. The possible values
of IEC 61850 Mod are described in Communication protocol manual, IEC 61850
Edition 1 and Edition 2.
To be able to set the IEC 61850 Mod the parameter remotely, the PST
setting RemoteModControl may not be set to Off. The possible values
are Off, Maintenance or All levels. The Off value denies all access to
data object Mod from remote, Maintenance requires that the category
of the originator (orCat) is Maintenance and All levels allow any orCat.
The mod of the Root LD.LNN0 can be configured under Main menu/Test/Function
test modes/Communication/Station communication/IEC61850 LD0 LLN0/
LD0LLN0:1
When the Mod is changed at this level, all components under the logical device update
their own behavior according to IEC 61850-7-4. The supported values of IEC 61850
Mod are described in Communication protocol manual, IEC 61850 Edition 2. The IEC
61850 test mode is indicated with the Start LED on the LHMI.
The mod of an specific component can be configured under Main menu/Test/
Function test modes/Communication/Station Communication
It is possible that the behavior is also influenced by other sources as well, independent
of the mode, such as the insertion of the test handle, loss of SV, and IED configuration
1MRK 511 401-UUS A
IP1647-1 v3
M11407-3 v8
GUID-82998715-6F23-4CAF-92E4-05E1A863CF33 v3
Bay control REC670 2.2 ANSI
Application manual