Test Operation For The Monitor Device ([Test]) - Mitsubishi Electric GOT2000 Series User Manual

3.3.8

Test operation for the monitor device ([Test])

Test devices.
Before performing the quick test operations of the system monitor function (such as turning ON or OFF bit device,
changing the word device current value, changing the settings or current values of the timer or counter, and changing the buffer memory
current value), read through the manual carefully and make yourself familiar with the operation method.
During quick test operation, never change the data of the devices which are used to perform significant operation for the system.
False output or malfunction can cause an accident.
■1. Operating procedure of the test
This subsection takes a test operation of the D100 device as an example to describe the test operation procedure.
Step 1.
Touch the [Test] key in each monitor.
Step 2.
The confirmation dialog appears.
Touch the [Yes] key to switch the mode to the test mode.
Step 3.
When switching the device value display format, touch the corresponding device value display format.
Display format of
the device value
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3.3 Operations Common to the Monitor Screens
[Test] key
WARNING