Toshiba GR200 Series Instruction Manual page 341

I f
Bus G
FL
t
Source
G'
Figure 2.23-1 Relationship between fault location and local IED in parallel line
I
χ =
{ Im ( R ∙ I
1
where,
V α :
I α :
I α ':
Iα":
I a , I b , I c :
I La , I Lb , I Lc :
I 0s :
R 1 :
X 1 :
R 0 :
X 0 :
K a :
Line GH
t
Distance GF
TT
t
2I − I
a b
I =
α
3
2I − I – I 2I
a b c
' = −
α
3
・I
Im(V
a
∙ I " + R ∙ I ∙ I " ) + Re(X
α α 0 0s α
Fault voltage (=V a0 )
Fault current
Current change before and after fault occurrence
Complex conjugate of Iα'
Fault currents in phase-'a', phase-'b', and phase-'c'
Load currents in phase-'a', phase-'b', and phase-'c'
Zero-sequence current on the local line i.e. 'Line 1'
Resistance component of positive-sequence self-impedance (Z 1 ), [FL_R1]
Reactance component of positive-sequence self-impedance (Z 1 ), [FL_X1]
Resistance component of zero-sequence self-impedance (Z 0 ), [FL_R0]
Reactance component of zero-sequence self-impedance (Z 0 ), [FL_X0]
Compensation factor for phase-'a' in an unbalanced 3-phase line,
- 320 -
Bus H
Line 1
Fault F
TT
TT
t
t
Line 2
TT
t
– I
c
− I – I
La Lb Lc
3
") × L
α
∙ I ∙ I " + X ∙ I ∙ I
1 α α 0 0s
6F2S1915 (0.46)
I L
Load/Source
H'
(2.23-1)
(2.23-2)
") } × K
α a
(2.23-3)
GRZ200 (Soft 031 & 032)