Hitachi CHROMASTER 5160 Instruction Manual page 536

NOTE: When the instrument is combined with Hitachi
Chromaster driver for Empower™2, and
Chromaster System Manager for Hitachi, the
Raman signal intensity can be obtained
automatically by means of the furnished
maintenance software. For details refer to the
instruction manual on the maintenance software.
(4) Measurement of Noise
With the excitation wavelength left at 350 nm, set the emission
wavelength at 397 nm (other conditions may be the same as in
preceding subsection (2)), and check the FL indication.
WL
Press the
set at the Em wavelength where the FL indication is maximum.
Start the recorder or D-2500 chromato-data processor and
record the baseline.
A suitable attenuator setting is ATT=0 when using the D-2500.
* Drift can also be measured if the measurement is
continued for 15 minutes or longer.
NOTE: In measurement with the emission spectrum
bandwidth set at WIDE (30 nm), the peak emission
wavelength is shifted toward the shorter
wavelength side from 397 nm. Due to the WIDE
setting, the spectrum bandwidth widens for the
scattered light of excitation beam and the Raman
line of water. Therefore, the wavelength of
Raman peak is shifted toward the wavelength of
the scattered light. For details, refer to 3.4.
(5) Noise Calculation
Calculate the noise level on the chart by the method given in
Fig. 4-3. The noise level in the case of using the D-2500
data processor is obtained from the noise width (in mm) as
follows.
Noise width
N =
162
X: ATT setting of data processor used in measurement
4 - 10
key to drive the emission wavelength, and
x
× 2
mV